Circuit as Set of Points

As the size of circuit designs continues to grow rapidly, artificial intelligence technologies are being extensively used in Electronic Design Automation (EDA) to assist with circuit design. Placement and routing are the most time-consuming parts of the physical design process, and how to quickly evaluate the placement has become a hot research topic. Prior works either transformed circuit designs into images using hand-crafted methods and then used Convolutional Neural Networks (CNN) to extract features, which are limited by the quality of the hand-crafted methods and could not achieve end-to-end training, or treated the circuit design as a graph structure and used Graph Neural Networks (GNN) to extract features, which require time-consuming preprocessing. In our work, we propose a novel perspective for circuit design by treating circuit components as point clouds and using Transformer-based point cloud perception methods to extract features from the circuit. This approach enables direct feature extraction from raw data without any preprocessing, allows for end-to-end training, and results in high performance. Experimental results show that our method achieves state-of-the-art performance in congestion prediction tasks on both the CircuitNet and ISPD2015 datasets, as well as in design rule check (DRC) violation prediction tasks on the CircuitNet dataset. Our method establishes a bridge between the relatively mature point cloud perception methods and the fast-developing EDA algorithms, enabling us to leverage more collective intelligence to solve this task. To facilitate the research of open EDA design, source codes and pre-trained models are released at https://github.com/hustvl/circuitformer

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

초미세 회로 설계를 위한 인터커넥트의 타이밍 분석 및 디자인 룰 위반 예측

학위논문 (박사) -- 서울대학교 대학원 : 공과대학 전기·컴퓨터공학부, 2021. 2. 김태환.타이밍 분석 및 디자인 룰 위반 제거는 반도체 칩 제조를 위한 마스크 제작 전에 완료되어야 할 필수 과정이다. 그러나 트랜지스터와 인터커넥트의 변이가 증가하고 있고 디자인 룰 역시 복잡해지고 있기 때문에 타이밍 분석 및 디자인 룰 위반 제거는 초미세 회로에서 더 어려워지고 있다. 본 논문에서는 초미세 설계를 위한 두가지 문제인 타이밍 분석과 디자인 룰 위반에 대해 다룬다. 첫번째로 공정 코너에서 타이밍 분석은 실리콘으로 제작된 회로의 성능을 정확히 예측하지 못한다. 그 이유는 공정 코너에서 가장 느린 타이밍 경로가 모든 공정 조건에서도 가장 느린 것은 아니기 때문이다. 게다가 칩 내의 임계 경로에서 인터커넥트에 의한 지연 시간이 전체 지연 시간에서의 영향이 증가하고 있고, 10나노 이하 공정에서는 20%를 초과하고 있다. 즉, 실리콘으로 제작된 회로의 성능을 정확히 예측하기 위해서는 대표 회로가 트랜지스터의 변이 뿐만아니라 인터커넥트의 변이도 반영해야한다. 인터커넥트를 구성하는 금속이 10층 이상 사용되고 있고, 각 층을 구성하는 금속의 저항과 캐패시턴스와 비아 저항이 모두 회로 지연 시간에 영향을 주기 때문에 대표 회로를 찾는 문제는 차원이 매우 높은 영역에서 최적의 해를 찾는 방법이 필요하다. 이를 위해 인터커넥트를 제작하는 공정(백 엔드 오브 라인)의 변이를 반영한 대표 회로를 생성하는 방법을 제안하였다. 공정 변이가 없을때 가장 느린 타이밍 경로에 사용된 게이트와 라우팅 패턴을 변경하면서 점진적으로 탐색하는 방법이다. 구체적으로, 본 논문에서 제안하는 합성 프레임워크는 다음의 새로운 기술들을 통합하였다: (1) 라우팅을 구성하는 여러 금속 층과 비아를 추출하고 탐색 시간 감소를 위해 유사한 구성들을 같은 범주로 분류하였다. (2) 빠르고 정확한 타이밍 분석을 위하여 여러 금속 층과 비아들의 변이를 수식화하였다. (3) 확장성을 고려하여 일반적인 링 오실레이터로 대표회로를 탐색하였다. 두번째로 디자인 룰의 복잡도가 증가하고 있고, 이로 인해 표준 셀들의 인터커넥트를 통한 연결을 진행하는 동안 디자인 룰 위반이 증가하고 있다. 게다가 표준 셀의 크기가 계속 작아지면서 셀들의 연결은 점점 어려워지고 있다. 기존에는 회로 내 모든 표준 셀을 연결하는데 필요한 트랙 수, 가능한 트랙 수, 이들 간의 차이를 이용하여 연결 가능성을 판단하고, 디자인 룰 위반이 발생하지 않도록 셀 배치를 최적화하였다. 그러나 기존 방법은 최신 공정에서는 정확하지 않기 때문에 더 많은 정보를 이용한 회로내 모든 표준 셀 사이의 연결 가능성을 예측하는 방법이 필요하다. 본 논문에서는 기계 학습을 통해 디자인 룰 위반이 발생하는 영역 및 개수를 예측하고 이를 줄이기 위해 표준 셀의 배치를 바꾸는 방법을 제안하였다. 디자인 룰 위반 영역은 이진 분류로 예측하였고 표준 셀의 배치는 디자인 룰 위반 개수를 최소화하는 방향으로 최적화를 수행하였다. 제안하는 프레임워크는 다음의 세가지 기술로 구성되었다: (1) 회로 레이아웃을 여러 개의 정사각형 격자로 나누고 각 격자에서 라우팅을 예측할 수 있는 요소들을 추출한다. (2) 각 격자에서 디자인 룰 위반이 있는지 여부를 판단하는 이진 분류를 수행한다. (3) 메타휴리스틱 최적화 또는 베이지안 최적화를 이용하여 전체 디자인 룰 위반 개수가 감소하도록 각 격자에 있는 표준 셀을 움직인다.Timing analysis and clearing design rule violations are the essential steps for taping out a chip. However, they keep getting harder in deep sub-micron circuits because the variations of transistors and interconnects have been increasing and design rules have become more complex. This dissertation addresses two problems on timing analysis and design rule violations for synthesizing deep sub-micron circuits. Firstly, timing analysis in process corners can not capture post-Si performance accurately because the slowest path in the process corner is not always the slowest one in the post-Si instances. In addition, the proportion of interconnect delay in the critical path on a chip is increasing and becomes over 20% in sub-10nm technologies, which means in order to capture post-Si performance accurately, the representative critical path circuit should reflect not only FEOL (front-end-of-line) but also BEOL (backend-of-line) variations. Since the number of BEOL metal layers exceeds ten and the layers have variation on resistance and capacitance intermixed with resistance variation on vias between them, a very high dimensional design space exploration is necessary to synthesize a representative critical path circuit which is able to provide an accurate performance prediction. To cope with this, I propose a BEOL-aware methodology of synthesizing a representative critical path circuit, which is able to incrementally explore, starting from an initial path circuit on the post-Si target circuit, routing patterns (i.e., BEOL reconfiguring) as well as gate resizing on the path circuit. Precisely, the synthesis framework of critical path circuit integrates a set of novel techniques: (1) extracting and classifying BEOL configurations for lightening design space complexity, (2) formulating BEOL random variables for fast and accurate timing analysis, and (3) exploring alternative (ring oscillator) circuit structures for extending the applicability of this work. Secondly, the complexity of design rules has been increasing and results in more design rule violations during routing. In addition, the size of standard cell keeps decreasing and it makes routing harder. In the conventional P&R flow, the routability of pre-routed layout is predicted by routing congestion obtained from global routing, and then placement is optimized not to cause design rule violations. But it turned out to be inaccurate in advanced technology nodes so that it is necessary to predict routability with more features. I propose a methodology of predicting the hotspots of design rule violations (DRVs) using machine learning with placement related features and the conventional routing congestion, and perturbating placed cells to reduce the number of DRVs. Precisely, the hotspots are predicted by a pre-trained binary classification model and placement perturbation is performed by global optimization methods to minimize the number of DRVs predicted by a pre-trained regression model. To do this, the framework is composed of three techniques: (1) dividing the circuit layout into multiple rectangular grids and extracting features such as pin density, cell density, global routing results (demand, capacity and overflow), and more in the placement phase, (2) predicting if each grid has DRVs using a binary classification model, and (3) perturbating the placed standard cells in the hotspots to minimize the number of DRVs predicted by a regression model.1 Introduction 1 1.1 Representative Critical Path Circuit . . . . . . . . . . . . . . . . . . . 1 1.2 Prediction of Design Rule Violations and Placement Perturbation . . . 5 1.3 Contributions of This Dissertation . . . . . . . . . . . . . . . . . . . 7 2 Methodology for Synthesizing Representative Critical Path Circuits reflecting BEOL Timing Variation 9 2.1 Motivation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.2 Definitions and Overall Flow . . . . . . . . . . . . . . . . . . . . . . 12 2.3 Techniques for BEOL-Aware RCP Generation . . . . . . . . . . . . . 17 2.3.1 Clustering BEOL Configurations . . . . . . . . . . . . . . . . 17 2.3.2 Formulating Statistical BEOL Random Variables . . . . . . . 18 2.3.3 Delay Modeling . . . . . . . . . . . . . . . . . . . . . . . . 22 2.3.4 Exploring Ring Oscillator Circuit Structures . . . . . . . . . . 24 2.4 Experimental Results . . . . . . . . . . . . . . . . . . . . . . . . . . 26 2.5 Further Study on Variations . . . . . . . . . . . . . . . . . . . . . . . 37 3 Methodology for Reducing Routing Failures through Enhanced Prediction on Design Rule Violations in Placement 39 3.1 Motivation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 3.2 Overall Flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 3.3 Techniques for Reducing Routing Failures . . . . . . . . . . . . . . . 43 3.3.1 Binary Classification . . . . . . . . . . . . . . . . . . . . . . 43 3.3.2 Regression . . . . . . . . . . . . . . . . . . . . . . . . . . . 45 3.3.3 Optimization . . . . . . . . . . . . . . . . . . . . . . . . . . 46 3.3.4 Placement Perturbation . . . . . . . . . . . . . . . . . . . . . 47 3.4 Experiments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51 3.4.1 Experiments Setup . . . . . . . . . . . . . . . . . . . . . . . 51 3.4.2 Hotspot Prediction . . . . . . . . . . . . . . . . . . . . . . . 51 3.4.3 Regression . . . . . . . . . . . . . . . . . . . . . . . . . . . 55 3.4.4 Placement Perturbation . . . . . . . . . . . . . . . . . . . . . 57 4 Conclusions 61 4.1 Synthesis of Representative Critical Path Circuits reflecting BEOL Timing Variation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61 4.2 Reduction of Routing Failures through Enhanced Prediction on Design Rule Violations in Placement . . . . . . . . . . . . . . . . . . . . . . 62 Abstract (In Korean) 69Docto

Echo State Networks for Proactive Caching in Cloud-Based Radio Access Networks with Mobile Users

In this paper, the problem of proactive caching is studied for cloud radio access networks (CRANs). In the studied model, the baseband units (BBUs) can predict the content request distribution and mobility pattern of each user, determine which content to cache at remote radio heads and BBUs. This problem is formulated as an optimization problem which jointly incorporates backhaul and fronthaul loads and content caching. To solve this problem, an algorithm that combines the machine learning framework of echo state networks with sublinear algorithms is proposed. Using echo state networks (ESNs), the BBUs can predict each user's content request distribution and mobility pattern while having only limited information on the network's and user's state. In order to predict each user's periodic mobility pattern with minimal complexity, the memory capacity of the corresponding ESN is derived for a periodic input. This memory capacity is shown to be able to record the maximum amount of user information for the proposed ESN model. Then, a sublinear algorithm is proposed to determine which content to cache while using limited content request distribution samples. Simulation results using real data from Youku and the Beijing University of Posts and Telecommunications show that the proposed approach yields significant gains, in terms of sum effective capacity, that reach up to 27.8% and 30.7%, respectively, compared to random caching with clustering and random caching without clustering algorithm.Comment: Accepted in the IEEE Transactions on Wireless Communication