Resource Management Algorithms for Computing Hardware Design and Operations: From Circuits to Systems

The complexity of computation hardware has increased at an unprecedented rate for the last few decades. On the computer chip level, we have entered the era of multi/many-core processors made of billions of transistors. With transistor budget of this scale, many functions are integrated into a single chip. As such, chips today consist of many heterogeneous cores with intensive interaction among these cores. On the circuit level, with the end of Dennard scaling, continuously shrinking process technology has imposed a grand challenge on power density. The variation of circuit further exacerbated the problem by consuming a substantial time margin. On the system level, the rise of Warehouse Scale Computers and Data Centers have put resource management into new perspective. The ability of dynamically provision computation resource in these gigantic systems is crucial to their performance. In this thesis, three different resource management algorithms are discussed. The first algorithm assigns adaptivity resource to circuit blocks with a constraint on the overhead. The adaptivity improves resilience of the circuit to variation in a cost-effective way. The second algorithm manages the link bandwidth resource in application specific Networks-on-Chip. Quality-of-Service is guaranteed for time-critical traffic in the algorithm with an emphasis on power. The third algorithm manages the computation resource of the data center with precaution on the ill states of the system. Q-learning is employed to meet the dynamic nature of the system and Linear Temporal Logic is leveraged as a tool to describe temporal constraints. All three algorithms are evaluated by various experiments. The experimental results are compared to several previous work and show the advantage of our methods

Adaptive Integrated Circuit Design for Variation Resilience and Security

The past few decades witness the burgeoning development of integrated circuit in terms of process technology scaling. Along with the tremendous benefits coming from the scaling, challenges are also presented in various stages. During the design time, the complexity of developing a circuit with millions to billions of smaller size transistors is extended after the variations are taken into account. The difficulty of analyzing these nondeterministic properties makes the allocation scheme of redundant resource hardly work in a cost-efficient way. Besides fabrication variations, analog circuits are suffered from severe performance degradations owing to their physical attributes which are vulnerable to aging effects. As such, the post-silicon calibration approach gains increasing attentions to compensate the performance mismatch. For the user-end applications, additional system failures result from the pirated and counterfeited devices provided by the untrusted semiconductor supply chain. Again analog circuits show their weakness to this threat due to the shortage of piracy avoidance techniques. In this dissertation, we propose three adaptive integrated circuit designs to overcome these challenges respectively. The first one investigates the variability-aware gate implementation with the consideration of the overhead control of adaptivity assignment. This design improves the variation resilience typically for digital circuits while optimizing the power consumption and timing yield. The second design is implemented as a self-validation system for the calibration of diverse analog circuits. The system is completely integrated on chip to enhance the convenience without external assistance. In the last design, a classic analog component is further studied to establish the configurable locking mechanism for analog circuits. The use of Satisfiability Modulo Theories addresses the difficulty of searching the unique unlocking pattern of non-Boolean variables

Cmos Rf Cituits Sic] Variability And Reliability Resilient Design, Modeling, And Simulation

The work presents a novel voltage biasing design that helps the CMOS RF circuits resilient to variability and reliability. The biasing scheme provides resilience through the threshold voltage (VT) adjustment, and at the mean time it does not degrade the PA performance. Analytical equations are established for sensitivity of the resilient biasing under various scenarios. Power Amplifier (PA) and Low Noise Amplifier (LNA) are investigated case by case through modeling and experiment. PTM 65nm technology is adopted in modeling the transistors within these RF blocks. A traditional class-AB PA with resilient design is compared the same PA without such design in PTM 65nm technology. Analytical equations are established for sensitivity of the resilient biasing under various scenarios. A traditional class-AB PA with resilient design is compared the same PA without such design in PTM 65nm technology. The results show that the biasing design helps improve the robustness of the PA in terms of linear gain, P1dB, Psat, and power added efficiency (PAE). Except for post-fabrication calibration capability, the design reduces the majority performance sensitivity of PA by 50% when subjected to threshold voltage (VT) shift and 25% to electron mobility (μn) degradation. The impact of degradation mismatches is also investigated. It is observed that the accelerated aging of MOS transistor in the biasing circuit will further reduce the sensitivity of PA. In the study of LNA, a 24 GHz narrow band cascade LNA with adaptive biasing scheme under various aging rate is compared to LNA without such biasing scheme. The modeling and simulation results show that the adaptive substrate biasing reduces the sensitivity of noise figure and minimum noise figure subject to process variation and iii device aging such as threshold voltage shift and electron mobility degradation. Simulation of different aging rate also shows that the sensitivity of LNA is further reduced with the accelerated aging of the biasing circuit. Thus, for majority RF transceiver circuits, the adaptive body biasing scheme provides overall performance resilience to the device reliability induced degradation. Also the tuning ability designed in RF PA and LNA provides the circuit post-process calibration capability

Analog/RF Circuit Design Techniques for Nanometerscale IC Technologies

CMOS evolution introduces several problems in analog design. Gate-leakage mismatch exceeds conventional matching tolerances requiring active cancellation techniques or alternative architectures. One strategy to deal with the use of lower supply voltages is to operate critical parts at higher supply voltages, by exploiting combinations of thin- and thick-oxide transistors. Alternatively, low voltage circuit techniques are successfully developed. In order to benefit from nanometer scale CMOS technology, more functionality is shifted to the digital domain, including parts of the RF circuits. At the same time, analog control for digital and digital control for analog emerges to deal with current and upcoming imperfections

Process Variation Aware DRAM (Dynamic Random Access Memory) Design Using Block-Based Adaptive Body Biasing Algorithm

Large dense structures like DRAMs (Dynamic Random Access Memory) are particularly susceptible to process variation, which can lead to variable latencies in different memory arrays. However, very little work exists on variation studies in DRAMs. This is due to the fact that DRAMs were traditionally placed off-chip and their latency changes due to process variation did not impact the overall processor performance. However, emerging technology trends like three-dimensional integration, use of sophisticated memory controllers, and continued scaling of technology node, substantially reduce DRAM access latency. Hence, future technology nodes will see widespread adoption of embedded DRAMs. This makes process variation a critical upcoming challenge in DRAMs that must be addressed in current and forthcoming technology generations. In this paper, techniques for modeling the effect of random, as well as spatial variation, in large DRAM array structures are presented. Sensitivity-based gate level process variation models combined with statistical timing analysis are used to estimate the impact of process variation on the DRAM performance and leakage power. A simulated annealing-based Vth assignment algorithm using adaptive body biasing is proposed in this thesis to improve the yield of DRAM structures. By applying the algorithm on a 1GB DRAM array, an average of 14.66% improvement in the DRAM yield is obtained

Reliability and security in low power circuits and systems

With the massive deployment of mobile devices in sensitive areas such as healthcare and defense, hardware reliability and security have become hot research topics in recent years. These topics, although different in definition, are usually correlated. This dissertation offers an in-depth treatment on enhancing the reliability and security of low power circuits and systems. The first part of the dissertation deals with the reliability of sub-threshold designs, which use supply voltage lower than the threshold voltage (Vth) of transistors to reduce power. The exponential relationship between delay and Vth significantly jeopardizes their reliability due to process variation induced timing violations. In order to address this problem, this dissertation proposes a novel selective body biasing scheme. In the first work, the selective body biasing problem is formulated as a linearly constrained statistical optimization model, and the adaptive filtering concept is borrowed from the signal processing community to develop an efficient solution. However, since the adaptive filtering algorithm lacks theoretical justification and guaranteed convergence rate, in the second work, a new approach based on semi-infinite programming with incremental hypercubic sampling is proposed, which demonstrates better solution quality with shorter runtime. The second work deals with the security of low power crypto-processors, equipped with Random Dynamic Voltage Scaling (RDVS), in the presence of Correlation Power Analysis (CPA) attacks. This dissertation firstly demonstrates that the resistance of RDVS to CPA can be undermined by lowering power supply voltage. Then, an alarm circuit is proposed to resist this attack. However, the alarm circuit will lead to potential denial-of-service due to noise-triggered false alarms. A non-zero sum game model is then formulated and the Nash Equilibria is analyzed --Abstract, page iii

Adaptive Baseband Pro cessing and Configurable Hardware for Wireless Communication

The world of information is literally at one’s fingertips, allowing access to previously unimaginable amounts of data, thanks to advances in wireless communication. The growing demand for high speed data has necessitated theuse of wider bandwidths, and wireless technologies such as Multiple-InputMultiple-Output (MIMO) have been adopted to increase spectral efficiency.These advanced communication technologies require sophisticated signal processing, often leading to higher power consumption and reduced battery life.Therefore, increasing energy efficiency of baseband hardware for MIMO signal processing has become extremely vital. High Quality of Service (QoS)requirements invariably lead to a larger number of computations and a higherpower dissipation. However, recognizing the dynamic nature of the wirelesscommunication medium in which only some channel scenarios require complexsignal processing, and that not all situations call for high data rates, allowsthe use of an adaptive channel aware signal processing strategy to provide adesired QoS. Information such as interference conditions, coherence bandwidthand Signal to Noise Ratio (SNR) can be used to reduce algorithmic computations in favorable channels. Hardware circuits which run these algorithmsneed flexibility and easy reconfigurability to switch between multiple designsfor different parameters. These parameters can be used to tune the operations of different components in a receiver based on feedback from the digitalbaseband. This dissertation focuses on the optimization of digital basebandcircuitry of receivers which use feedback to trade power and performance. Aco-optimization approach, where designs are optimized starting from the algorithmic stage through the hardware architectural stage to the final circuitimplementation is adopted to realize energy efficient digital baseband hardwarefor mobile 4G devices. These concepts are also extended to the next generation5G systems where the energy efficiency of the base station is improved.This work includes six papers that examine digital circuits in MIMO wireless receivers. Several key blocks in these receiver include analog circuits thathave residual non-linearities, leading to signal intermodulation and distortion.Paper-I introduces a digital technique to detect such non-linearities and calibrate analog circuits to improve signal quality. The concept of a digital nonlinearity tuning system developed in Paper-I is implemented and demonstratedin hardware. The performance of this implementation is tested with an analogchannel select filter, and results are presented in Paper-II. MIMO systems suchas the ones used in 4G, may employ QR Decomposition (QRD) processors tosimplify the implementation of tree search based signal detectors. However,the small form factor of the mobile device increases spatial correlation, whichis detrimental to signal multiplexing. Consequently, a QRD processor capableof handling high spatial correlation is presented in Paper-III. The algorithm and hardware implementation are optimized for carrier aggregation, which increases requirements on signal processing throughput, leading to higher powerdissipation. Paper-IV presents a method to perform channel-aware processingwith a simple interpolation strategy to adaptively reduce QRD computationcount. Channel properties such as coherence bandwidth and SNR are used toreduce multiplications by 40% to 80%. These concepts are extended to usetime domain correlation properties, and a full QRD processor for 4G systemsfabricated in 28 nm FD-SOI technology is presented in Paper-V. The designis implemented with a configurable architecture and measurements show thatcircuit tuning results in a highly energy efficient processor, requiring 0.2 nJ to1.3 nJ for each QRD. Finally, these adaptive channel-aware signal processingconcepts are examined in the scope of the next generation of communicationsystems. Massive MIMO systems increase spectral efficiency by using a largenumber of antennas at the base station. Consequently, the signal processingat the base station has a high computational count. Paper-VI presents a configurable detection scheme which reduces this complexity by using techniquessuch as selective user detection and interpolation based signal processing. Hardware is optimized for resource sharing, resulting in a highly reconfigurable andenergy efficient uplink signal detector

Study Of Design For Reliability Of Rf And Analog Circuits

Due to continued device dimensions scaling, CMOS transistors in the nanometer regime have resulted in major reliability and variability challenges. Reliability issues such as channel hot electron injection, gate dielectric breakdown, and negative bias temperature instability (NBTI) need to be accounted for in the design of robust RF circuits. In addition, process variations in the nanoscale CMOS transistors are another major concern in today‟s circuits design. An adaptive gate-source biasing scheme to improve the RF circuit reliability is presented in this work. The adaptive method automatically adjusts the gate-source voltage to compensate the reduction in drain current subjected to various device reliability mechanisms. A class-AB RF power amplifier shows that the use of a source resistance makes the power-added efficiency robust against threshold voltage and mobility variations, while the use of a source inductance is more reliable for the input third-order intercept point. A RF power amplifier with adaptive gate biasing is proposed to improve the circuit device reliability degradation and process variation. The performances of the power amplifier with adaptive gate biasing are compared with those of the power amplifier without adaptive gate biasing technique. The adaptive gate biasing makes the power amplifier more resilient to process variations as well as the device aging such as mobility and threshold voltage degradation. Injection locked voltage-controlled oscillators (VCOs) have been examined. The VCOs are implemented using TSMC 0.18 µm mixed-signal CMOS technology. The injection locked oscillators have improved phase noise performance than free running oscillators. iv A differential Clapp-VCO has been designed and fabricated for the evaluation of hot electron reliability. The differential Clapp-VCO is formed using cross-coupled nMOS transistors, on-chip transformers/inductors, and voltage-controlled capacitors. The experimental data demonstrate that the hot carrier damage increases the oscillation frequency and degrades the phase noise of Clapp-VCO. A p-channel transistor only VCO has been designed for low phase noise. The simulation results show that the phase noise degrades after NBTI stress at elevated temperature. This is due to increased interface states after NBTI stress. The process variability has also been evaluated