3,202 research outputs found

    Development of a XYZ scanner for home-made atomic force microscope based on FPAA control

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    Atomic force microscopy (AFM) is one of the useful tools in the fields of nanoscale measurement and manipulation. High speed scanning is one of the crucial requirements for live cell imaging and soft matter characterization. The scanning speed is limited by the bandwidth of the AFMโ€™s detection and actuation components. Generally, the bandwidth of a traditional scanner is too low to conduct the live cell imaging. This paper presents a simple and integrated compact home-made AFM for high speed imaging. To improve the bandwidth of the scanner, a parallel kinematics mechanism driven by piezoelectric actuators (PZTs) is proposed for the fast positioning in the X, Y and Z directions. The mechanical design optimization, modeling and analysis, and experimental testing have been conducted to validate the performance of the proposed scanner. A number of experimental results showed that the developed scanner has the capability for broad bandwidth with low coupling errors in the actuation directions. A hybrid control strategy including feedforward and feedback loops has been designed to significantly improve the dynamic tracking performance of the scanner and a field programmable analog array (FPAA) system is utilized to implement the control algorithm for excellent and stable tracking capability. Further, a number of high speed measurements have been conducted to verify the performance of the developed AFM

    Development and testing of a XYZ scanner for atomic force microscope

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    Atomic force microscopy (AFM) is a widely used tool in nano measurement and manipulation techniques. However, a traditional AFM system suffers from the limitation of slow scanning rate, due to the low dynamic performance of piezoelectric positioners. As an important part of AFM system, scanner will have a significant impact the result of the scanning imaging and operation. It is well know that high-speed operation of an AFM are increasingly required, and it is also a challenge for the researchers. In this paper, we proposed a parallel kinematic high-speed piezoelectric actuator (PZT) XYZ scanner. The design is aimed at achieving high resonance frequencies and low cross-coupling. The developed stage consists of a parallel kinematic XY stage and a Z stage. The Z stage is mounted on the central moving platform of the XY stage. To achieve the design objective, several parallel leaf flexure hinge mechanisms, arranging symmetrically around the central moving platform of the XY stage, are utilized to provide large stiffness and reduce cross-coupling. For the Z stage, a symmetrical leaf flexure parallelogram mechanism is adopted to achieve high resonance frequencies and decoupling. Then, finite element analysis (FEA) is utilized to validate the characteristics of the XYZ scanner. Finally, extensive experiments are conducted, demonstrating feasibility of the proposed scanner

    Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control

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    The atomic force microscope (AFM) is a device capable of generating topographic images of sample surfaces with extremely high resolutions down to the atomic level. It is also being used in applications that involve manipulation of matter at a nanoscale. Early AFMs were operated in open loop. As a result, they were susceptible to piezoelectric creep, thermal drift, hysteresis nonlinearity and scan-induced vibration. These effects tend to distort the generated image. The distortions are often minimized by limiting the scanning speed and range of the AFMs. Recently a new generation of AFMs has emerged that utilizes position sensors to measure displacements of the scanner in three dimensions. These AFMs are equipped with feedback loops that work to minimize the adverse effects of hysteresis, piezoelectric creep and thermal drift on the obtained image using standard PI controllers. These feedback controllers are often not designed to deal with the highly resonant nature of an AFM's scanner, nor with the cross-coupling between various axes. In this paper we illustrate the drastic improvement in accuracy and imaging speed that can be obtained by proper design of a feedback controller. Such controllers can be incorporated into most modern AFMs with minimal effort since they can be implemented in software with the existing hardware

    A new scanning method for fast atomic force microscopy

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    In recent years, the atomic force microscope (AFM) has become an important tool in nanotechnology research. It was first conceived to generate 3-D images of conducting as well as nonconducting surfaces with a high degree of accuracy. Presently, it is also being used in applications that involve manipulation of material surfaces at a nanoscale. In this paper, we describe a new scanning method for fast atomic force microscopy. In this technique, the sample is scanned in a spiral pattern instead of the well-established raster pattern. A constant angular velocity spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x-axis and y -axis of AFM nanopositioner, respectively. The use of single-frequency input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device. Alternatively, the frequency of the sinusoidal set points can be varied to maintain a constant linear velocity (CLV) while a spiral trajectory is being traced. Thus, producing a CLV spiral. These scan methods can be incorporated into most modern AFMs with minimal effort since they can be implemented in software using the existing hardware. Experimental results obtained by implementing the method on a commercial AFM indicate that high-quality images can be generated at scan frequencies well beyond the raster scans

    High-speed spiral imaging technique for an atomic force microscope using a linear quadratic Gaussian controller

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    This paper demonstrates a high-speed spiral imaging technique for an atomic force microscope (AFM). As an alternative to traditional raster scanning, an approach of gradient pulsing using a spiral line is implemented and spirals are generated by applying single-frequency cosine and sine waves of slowly varying amplitudes to the X and Y-axes of the AFM's piezoelectric tube scanner (PTS). Due to these single-frequency sinusoidal input signals, the scanning process can be faster than that of conventional raster scanning. A linear quadratic Gaussian controller is designed to track the reference sinusoid and a vibration compensator is combined to damp the resonant mode of the PTS. An internal model of the reference sinusoidal signal is included in the plant model and an integrator for the system error is introduced in the proposed control scheme. As a result, the phase error between the input and output sinusoids from the X and Y-PTSs is reduced. The spirals produced have particularly narrow-band frequency measures which change slowly over time, thereby making it possible for the scanner to achieve improved tracking and continuous high-speed scanning rather than being restricted to the back and forth motion of raster scanning. As part of the post-processing of the experimental data, a fifth-order Butterworth filter is used to filter noises in the signals emanating from the position sensors and a Gaussian image filter is used to filter the images. A comparison of images scanned using the proposed controller (spiral) and the AFM PI controller (raster) shows improvement in the scanning rate using the proposed method

    A Compact Vertical Scanner for Atomic Force Microscopes

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    A compact vertical scanner for an atomic force microscope (AFM) is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis. An optimal design process that maximizes the resonance frequency is performed. To evaluate the scannerโ€™s performance, experiments are performed to evaluate the travel range, resonance frequency, and feedback noise level. In addition, an AFM image using the proposed vertical scanner is generated

    A Modified Positive Velocity and Position Feedback scheme with delay compensation for improved nanopositioning performance

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    Acknowledgments This paper was sponsored by the Spanish FPU12/00984 Program (Ministerio de Educacion, Cultura y Deporte). It was also sponsored by the Spanish Government Research Program with the Project DPI2012-37062-CO2-01 (Ministerio de Economia y Competitividad) and by the European Social Fund.Peer reviewedPostprin
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