63 research outputs found

    New Design Techniques for Dynamic Reconfigurable Architectures

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    Embedded electronic systems driven by run-time reconfigurable hardware

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    Abstract This doctoral thesis addresses the design of embedded electronic systems based on run-time reconfigurable hardware technology –available through SRAM-based FPGA/SoC devices– aimed at contributing to enhance the life quality of the human beings. This work does research on the conception of the system architecture and the reconfiguration engine that provides to the FPGA the capability of dynamic partial reconfiguration in order to synthesize, by means of hardware/software co-design, a given application partitioned in processing tasks which are multiplexed in time and space, optimizing thus its physical implementation –silicon area, processing time, complexity, flexibility, functional density, cost and power consumption– in comparison with other alternatives based on static hardware (MCU, DSP, GPU, ASSP, ASIC, etc.). The design flow of such technology is evaluated through the prototyping of several engineering applications (control systems, mathematical coprocessors, complex image processors, etc.), showing a high enough level of maturity for its exploitation in the industry.Resumen Esta tesis doctoral abarca el diseño de sistemas electrónicos embebidos basados en tecnología hardware dinámicamente reconfigurable –disponible a través de dispositivos lógicos programables SRAM FPGA/SoC– que contribuyan a la mejora de la calidad de vida de la sociedad. Se investiga la arquitectura del sistema y del motor de reconfiguración que proporcione a la FPGA la capacidad de reconfiguración dinámica parcial de sus recursos programables, con objeto de sintetizar, mediante codiseño hardware/software, una determinada aplicación particionada en tareas multiplexadas en tiempo y en espacio, optimizando así su implementación física –área de silicio, tiempo de procesado, complejidad, flexibilidad, densidad funcional, coste y potencia disipada– comparada con otras alternativas basadas en hardware estático (MCU, DSP, GPU, ASSP, ASIC, etc.). Se evalúa el flujo de diseño de dicha tecnología a través del prototipado de varias aplicaciones de ingeniería (sistemas de control, coprocesadores aritméticos, procesadores de imagen, etc.), evidenciando un nivel de madurez viable ya para su explotación en la industria.Resum Aquesta tesi doctoral està orientada al disseny de sistemes electrònics empotrats basats en tecnologia hardware dinàmicament reconfigurable –disponible mitjançant dispositius lògics programables SRAM FPGA/SoC– que contribueixin a la millora de la qualitat de vida de la societat. S’investiga l’arquitectura del sistema i del motor de reconfiguració que proporcioni a la FPGA la capacitat de reconfiguració dinàmica parcial dels seus recursos programables, amb l’objectiu de sintetitzar, mitjançant codisseny hardware/software, una determinada aplicació particionada en tasques multiplexades en temps i en espai, optimizant així la seva implementació física –àrea de silici, temps de processat, complexitat, flexibilitat, densitat funcional, cost i potència dissipada– comparada amb altres alternatives basades en hardware estàtic (MCU, DSP, GPU, ASSP, ASIC, etc.). S’evalúa el fluxe de disseny d’aquesta tecnologia a través del prototipat de varies aplicacions d’enginyeria (sistemes de control, coprocessadors aritmètics, processadors d’imatge, etc.), demostrant un nivell de maduresa viable ja per a la seva explotació a la indústria

    Design of Variation-Tolerant Circuits for Nanometer CMOS Technology: Circuits and Architecture Co-Design

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    Aggressive scaling of CMOS technology in sub-90nm nodes has created huge challenges. Variations due to fundamental physical limits, such as random dopants fluctuation (RDF) and line edge roughness (LER) are increasing significantly with technology scaling. In addition, manufacturing tolerances in process technology are not scaling at the same pace as transistor's channel length due to process control limitations (e.g., sub-wavelength lithography). Therefore, within-die process variations worsen with successive technology generations. These variations have a strong impact on the maximum clock frequency and leakage power for any digital circuit, and can also result in functional yield losses in variation-sensitive digital circuits (such as SRAM). Moreover, in nanometer technologies, digital circuits show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost while achieving higher performance and density. It is therefore not surprising that the International Technology Roadmap for Semiconductors (ITRS) lists variability as one of the most challenging obstacles for IC design in nanometer regime. To facilitate variation-tolerant design, we study the impact of random variations on the delay variability of a logic gate and derive simple and scalable statistical models to evaluate delay variations in the presence of within-die variations. This work provides new design insight and highlights the importance of accounting for the effect of input slew on delay variations, especially at lower supply voltages. The derived models are simple, scalable, bias dependent and only require the knowledge of easily measurable parameters. This makes them useful in early design exploration, circuit/architecture optimization as well as technology prediction (especially in low-power and low-voltage operation). The derived models are verified using Monte Carlo SPICE simulations using industrial 90nm technology. Random variations in nanometer technologies are considered one of the largest design considerations. This is especially true for SRAM, due to the large variations in bitcell characteristics. Typically, SRAM bitcells have the smallest device sizes on a chip. Therefore, they show the largest sensitivity to different sources of variations. With the drastic increase in memory densities, lower supply voltages and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. In this research, we present a methodology for statistical simulation of SRAM read access yield, which is tightly related to SRAM performance and power consumption. The proposed flow accounts for the impact of bitcell read current variation, sense amplifier offset distribution, timing window variation and leakage variation on functional yield. The methodology overcomes the pessimism existing in conventional worst-case design techniques that are used in SRAM design. The proposed statistical yield estimation methodology allows early yield prediction in the design cycle, which can be used to trade off performance and power requirements for SRAM. The methodology is verified using measured silicon yield data from a 1Mb memory fabricated in an industrial 45nm technology. Embedded SRAM dominates modern SoCs and there is a strong demand for SRAM with lower power consumption while achieving high performance and high density. However, in the presence of large process variations, SRAMs are expected to consume larger power to ensure correct read operation and meet yield targets. We propose a new architecture that significantly reduces array switching power for SRAM. The proposed architecture combines built-in self-test (BIST) and digitally controlled delay elements to reduce the wordline pulse width for memories while ensuring correct read operation; hence, reducing switching power. A new statistical simulation flow was developed to evaluate the power savings for the proposed architecture. Monte Carlo simulations using a 1Mb SRAM macro from an industrial 45nm technology was used to examine the power reduction achieved by the system. The proposed architecture can reduce the array switching power significantly and shows large power saving - especially as the chip level memory density increases. For a 48Mb memory density, a 27% reduction in array switching power can be achieved for a read access yield target of 95%. In addition, the proposed system can provide larger power saving as process variations increase, which makes it a very attractive solution for 45nm and below technologies. In addition to its impact on bitcell read current, the increase of local variations in nanometer technologies strongly affect SRAM cell stability. In this research, we propose a novel single supply voltage read assist technique to improve SRAM static noise margin (SNM). The proposed technique allows precharging different parts of the bitlines to VDD and GND and uses charge sharing to precisely control the bitline voltage, which improves the bitcell stability. In addition to improving SNM, the proposed technique also reduces memory access time. Moreover, it only requires one supply voltage, hence, eliminates the need of large area voltage shifters. The proposed technique has been implemented in the design of a 512kb memory fabricated in 45nm technology. Results show improvements in SNM and read operation window which confirms the effectiveness and robustness of this technique

    Design of Multi-Gigabit Network Interconnect Elements and Protocols for a Data Acquisition System in Radiation Environments

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    Modern High Energy Physics experiments (HEP) explore the fundamental nature of matter in more depth than ever before and thereby benefit greatly from the advances in the field of communication technology. The huge data volumes generated by the increasingly precise detector setups pose severe problems for the Data Acquisition Systems (DAQ), which are used to process and store this information. In addition, detector setups and their read-out electronics need to be synchronized precisely to allow a later correlation of experiment events accurately in time. Moreover, the substantial presence of charged particles from accelerator-generated beams results in strong ionizing radiation levels, which has a severe impact on the electronic systems. This thesis recommends an architecture for unified network protocol IP cores with custom developed physical interfaces for the use of reliable data acquisition systems in strong radiation environments. Special configured serial bidirectional point-to-point interconnects are proposed to realize high speed data transmission, slow control access, synchronization and global clock distribution on unified links to reduce costs and to gain compact and efficient read-out setups. Special features are the developed radiation hardened functional units against single and multiple bit upsets, and the common interface for statistical error and diagnosis information, which integrates well into the protocol capabilities and eases the error handling in large experiment setups. Many innovative designs for several custom FPGA and ASIC platforms have been implemented and are described in detail. Special focus is placed on the physical layers and network interface elements from high-speed serial LVDS interconnects up to 20 Gb/s SSTL links in state-of-the-art process technology. The developed IP cores are fully tested by an adapted verification environment for electronic design automation tools and also by live application. They are available in a global repository allowing a broad usage within further HEP experiments

    Dependable Embedded Systems

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    This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

    Production accompanying testing of the ATLAS Pixel module

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    The ATLAS Pixel detector, innermost sub-detector of the ATLAS experiment at LHC, CERN, can be sensibly tested in its entirety the first time after its installation in 2006. Because of the poor accessibility (probably once per year) of the Pixel detector and tight scheduling the replacement of damaged modules after integration as well as during operation will become a highly exposed business. Therefore and to ensure that no affected parts will be used in following production steps, it is necessary that each production step is accompanied by testing the components before assembly and make sure the operativeness afterwards. Probably 300 of about total 2000 semiconductor hybrid pixel detector modules will be build at the Universität Dortmund. Thus a production test setup has been build up and examined before starting serial production. These tests contain the characterization and inspection of the module components and the module itself under different environmental conditions and diverse operating parameters. Once a module is assembled the operativeness is tested with a radioactive source and the long-time stability is assured by a burn-in. A fully electrical characterization is the basis for module selection and sorting for the ATLAS Pixel detector. Additionally the charge collection behavior of irradiated and non irradiated modules has been investigated in the H8 beamline with 180 GeV pions

    Physically-Adaptive Computing via Introspection and Self-Optimization in Reconfigurable Systems.

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    Digital electronic systems typically must compute precise and deterministic results, but in principle have flexibility in how they compute. Despite the potential flexibility, the overriding paradigm for more than 50 years has been based on fixed, non-adaptive inte-grated circuits. This one-size-fits-all approach is rapidly losing effectiveness now that technology is advancing into the nanoscale. Physical variation and uncertainty in com-ponent behavior are emerging as fundamental constraints and leading to increasingly sub-optimal fault rates, power consumption, chip costs, and lifetimes. This dissertation pro-poses methods of physically-adaptive computing (PAC), in which reconfigurable elec-tronic systems sense and learn their own physical parameters and adapt with fine granu-larity in the field, leading to higher reliability and efficiency. We formulate the PAC problem and provide a conceptual framework built around two major themes: introspection and self-optimization. We investigate how systems can efficiently acquire useful information about their physical state and related parameters, and how systems can feasibly re-implement their designs on-the-fly using the information learned. We study the role not only of self-adaptation—where the above two tasks are performed by an adaptive system itself—but also of assisted adaptation using a remote server or peer. We introduce low-cost methods for sensing regional variations in a system, including a flexible, ultra-compact sensor that can be embedded in an application and implemented on field-programmable gate arrays (FPGAs). An array of such sensors, with only 1% to-tal overhead, can be employed to gain useful information about circuit delays, voltage noise, and even leakage variations. We present complementary methods of regional self-optimization, such as finding a design alternative that best fits a given system region. We propose a novel approach to characterizing local, uncorrelated variations. Through in-system emulation of noise, previously hidden variations in transient fault sus-ceptibility are uncovered. Correspondingly, we demonstrate practical methods of self-optimization, such as local re-placement, informed by the introspection data. Forms of physically-adaptive computing are strongly needed in areas such as com-munications infrastructure, data centers, and space systems. This dissertation contributes practical methods for improving PAC costs and benefits, and promotes a vision of re-sourceful, dependable digital systems at unimaginably-fine physical scales.Ph.D.Computer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/78922/1/kzick_1.pd

    Towards the development of flexible, reliable, reconfigurable, and high-performance imaging systems

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    Current FPGAs can implement large systems because of the high density of reconfigurable logic resources in a single chip. FPGAs are comprehensive devices that combine flexibility and high performance in the same platform compared to other platform such as General-Purpose Processors (GPPs) and Application Specific Integrated Circuits (ASICs). The flexibility of modern FPGAs is further enhanced by introducing Dynamic Partial Reconfiguration (DPR) feature, which allows for changing the functionality of part of the system while other parts are functioning. FPGAs became an important platform for digital image processing applications because of the aforementioned features. They can fulfil the need of efficient and flexible platforms that execute imaging tasks efficiently as well as the reliably with low power, high performance and high flexibility. The use of FPGAs as accelerators for image processing outperforms most of the current solutions. Current FPGA solutions can to load part of the imaging application that needs high computational power on dedicated reconfigurable hardware accelerators while other parts are working on the traditional solution to increase the system performance. Moreover, the use of the DPR feature enhances the flexibility of image processing further by swapping accelerators in and out at run-time. The use of fault mitigation techniques in FPGAs enables imaging applications to operate in harsh environments following the fact that FPGAs are sensitive to radiation and extreme conditions. The aim of this thesis is to present a platform for efficient implementations of imaging tasks. The research uses FPGAs as the key component of this platform and uses the concept of DPR to increase the performance, flexibility, to reduce the power dissipation and to expand the cycle of possible imaging applications. In this context, it proposes the use of FPGAs to accelerate the Image Processing Pipeline (IPP) stages, the core part of most imaging devices. The thesis has a number of novel concepts. The first novel concept is the use of FPGA hardware environment and DPR feature to increase the parallelism and achieve high flexibility. The concept also increases the performance and reduces the power consumption and area utilisation. Based on this concept, the following implementations are presented in this thesis: An implementation of Adams Hamilton Demosaicing algorithm for camera colour interpolation, which exploits the FPGA parallelism to outperform other equivalents. In addition, an implementation of Automatic White Balance (AWB), another IPP stage that employs DPR feature to prove the mentioned novelty aspects. Another novel concept in this thesis is presented in chapter 6, which uses DPR feature to develop a novel flexible imaging system that requires less logic and can be implemented in small FPGAs. The system can be employed as a template for any imaging application with no limitation. Moreover, discussed in this thesis is a novel reliable version of the imaging system that adopts novel techniques including scrubbing, Built-In Self Test (BIST), and Triple Modular Redundancy (TMR) to detect and correct errors using the Internal Configuration Access Port (ICAP) primitive. These techniques exploit the datapath-based nature of the implemented imaging system to improve the system's overall reliability. The thesis presents a proposal for integrating the imaging system with the Robust Reliable Reconfigurable Real-Time Heterogeneous Operating System (R4THOS) to get the best out of the system. The proposal shows the suitability of the proposed DPR imaging system to be used as part of the core system of autonomous cars because of its unbounded flexibility. These novel works are presented in a number of publications as shown in section 1.3 later in this thesis
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