On testing VLSI chips for the big Viterbi decoder

A general technique that can be used in testing very large scale integrated (VLSI) chips for the Big Viterbi Decoder (BVD) system is described. The test technique is divided into functional testing and fault-coverage testing. The purpose of functional testing is to verify that the design works functionally. Functional test vectors are converted from outputs of software simulations which simulate the BVD functionally. Fault-coverage testing is used to detect and, in some cases, to locate faulty components caused by bad fabrication. This type of testing is useful in screening out bad chips. Finally, design for testability, which is included in the BVD VLSI chip design, is described in considerable detail. Both the observability and controllability of a VLSI chip are greatly enhanced by including the design for the testability feature

Design-for-delay-testability techniques for high-speed digital circuits

The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important

Plug & Test at System Level via Testable TLM Primitives

With the evolution of Electronic System Level (ESL) design methodologies, we are experiencing an extensive use of Transaction-Level Modeling (TLM). TLM is a high-level approach to modeling digital systems where details of the communication among modules are separated from the those of the implementation of functional units. This paper represents a first step toward the automatic insertion of testing capabilities at the transaction level by definition of testable TLM primitives. The use of testable TLM primitives should help designers to easily get testable transaction level descriptions implementing what we call a "Plug & Test" design methodology. The proposed approach is intended to work both with hardware and software implementations. In particular, in this paper we will focus on the design of a testable FIFO communication channel to show how designers are given the freedom of trading-off complexity, testability levels, and cos

Silicon compilation

Silicon compilation is a term used for many different purposes. In this paper we define silicon compilation as a mapping from some higher level description into layout. We define the basic issues in structural and behavioral silicon compilation and some possible solutions to those issues. Finally, we define the concept of an intelligent silicon compiler in which the compiler evaluates the quality of the generated design and attempts to improve it if it is not satisfactory

CA-BIST for asynchronous circuits: a case study on the RAPPID asynchronous instruction length decoder

Journal ArticleThis paper presents a case study in low-cost noninvasive Built-In Self Test (BIST) for RAPPID, a largescale 120,000-transistor asynchronous version of the Pentium® Pro Instruction Length Decoder, which runs at 3.6 GHz. RAPPID uses a synchronous 0.25 micron CMOS library for static and domino logic, and has no Design-for-Test hooks other than some debug features. We explore the use of Cellular Automata (CA) for on-chip test pattern generation and response evaluation. More specifically, we look for fast ways to tune the CA-BIST to the RAPPID design, rather than using pseudo-random testing. The metric for tuning the CA-BIST pattern generation is based on an abstract hardware description model of the instruction length decoder, which is independent of implementation details, and hence also independent of the asynchronous circuit style. Our CA-BI ST solution uses a novel bootstrap procedure for generating the test patterns, which give complete coverage for this metric, and cover 94% of the testable stuck-at faults for the actual design at switch level. Analysis of the undetected and untestable faults shows that the same fault effects can be expected for a similar clocked circuit. This is encouraging evidence that testability is no excuse to avoid asynchronous design techniques in addition to high-performance synchronous solutions

An Integrated Test Plan for an Advanced Very Large Scale Integrated Circuit Design Group

VLSI testing poses a number of problems which includes the selection of test techniques, the determination of acceptable fault coverage levels, and test vector generation. Available device test techniques are examined and compared. Design rules should be employed to assure the design is testable. Logic simulation systems and available test utilities are compared. The various methods of test vector generation are also examined. The selection criteria for test techniques are identified. A table of proposed design rules is included. Testability measurement utilities can be used to statistically predict the test generation effort. Field reject rates and fault coverage are statistically related. Acceptable field reject rates can be achieved with less than full test vector fault coverage. The methods and techniques which are examined form the basis of the recommended integrated test plan. The methods of automatic test vector generation are relatively primitive but are improving

CA-BIST for asynchronous circuits: a case study on the RAPPID asynchronous instruction length decoder

Journal ArticleThis paper presents a case study in low-cost noninvasive Built-In Self Test (BIST) for RAPPID, a largescale 120,000-transistor asynchronous version of the Pentium® Pro Instruction Length Decoder, which runs at 3.6 GHz. RAPPID uses a synchronous 0.25 micron CMOS library for static and domino logic, and has no Design-for-Test hooks other than some debug features. We explore the use of Cellular Automata (CA) for on-chip test pattern generation and response evaluation. More specifically, we look for fast ways to tune the CA-BIST to the RAPPID design, rather than using pseudo-random testing. The metric for tuning the CA-BIST pattern generation is based on an abstract hardware description model of the instruction length decoder, which is independent of implementation details, and hence also independent of the asynchronous circuit style. Our CA-BI ST solution uses a novel bootstrap procedure for generating the test patterns, which give complete coverage for this metric, and cover 94% of the testable stuck-at faults for the actual design at switch level. Analysis of the undetected and untestable faults shows that the same fault effects can be expected for a similar clocked circuit. This is encouraging evidence that testability is no excuse to avoid asynchronous design techniques in addition to high-performance synchronous solutions

Product assurance technology for custom LSI/VLSI electronics

The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

Boundary scan system design

Given the strong competition in digital design on the national and international levels, boundary scan devices are rapidly becoming a necessary as opposed to a convenient feature on integrated circuits. This thesis serves a dual purpose. First, it demonstrates how boundary scan devices can be used to increase the testability of a circuit and it presents several factors used to quantify the cost associated with the addition of boundary scan compatibility to digital designs. Cost tradeoffs are often the most intimidating hurdle for engineers to cross when deciding if boundary scan compatibility is worth the effort. Second, it demonstrates the use of the Tektronix LV500 (logic verifier) as a general testing tool, using boundary scan designs as examples. These examples provide an understanding of the function of boundary scan cells and the JTAG/1 149. 1 standard. The LV500, which is used by students in the Department of Computer Engineering and Microelectronic Engineering at RIT, is an indispensable tool for making critical timing measurements. It also allows a user to evaluate and step through simple as well as more complicated designs. It is my hope that this thesis and the tutorial provided will facilitate the use of the LV500 in future testing work performed in RIT\u27s center for Microelectronic and Computer Engineering clean room facilities. Upon following the example circuits described, one should become familiar with boundary scan terminology as well as the methodology used in designing such a system

Design and Evaluation of Radiation-Hardened Standard Cell Flip-Flops

Use of a standard non-rad-hard digital cell library in the rad-hard design can be a cost-effective solution for space applications. In this paper we demonstrate how a standard non-rad-hard flip-flop, as one of the most vulnerable digital cells, can be converted into a rad-hard flip-flop without modifying its internal structure. We present five variants of a Triple Modular Redundancy (TMR) flip-flop: baseline TMR flip-flop, latch-based TMR flip-flop, True-Single Phase Clock (TSPC) TMR flip-flop, scannable TMR flip-flop and self-correcting TMR flip-flop. For all variants, the multi-bit upsets have been addressed by applying special placement constraints, while the Single Event Transient (SET) mitigation was achieved through the usage of customized SET filters and selection of optimal inverter sizes for the clock and reset trees. The proposed flip-flop variants feature differing performance, thus enabling to choose the optimal solution for every sensitive node in the circuit, according to the predefined design constraints. Several flip-flop designs have been validated on IHP’s 130nm BiCMOS process, by irradiation of custom-designed shift registers. It has been shown that the proposed TMR flip-flops are robust to soft errors with a threshold Linear Energy Transfer (LET) from ( 32.4 (MeV⋅cm2/mg) ) to ( 62.5 (MeV⋅cm2/mg) ), depending on the variant