Design of Discrete-time Chaos-Based Systems for Hardware Security Applications

Security of systems has become a major concern with the advent of technology. Researchers are proposing new security solutions every day in order to meet the area, power and performance specifications of the systems. The additional circuit required for security purposes can consume significant area and power. This work proposes a solution which utilizes discrete-time chaos-based logic gates to build a system which addresses multiple hardware security issues. The nonlinear dynamics of chaotic maps is leveraged to build a system that mitigates IC counterfeiting, IP piracy, overbuilding, disables hardware Trojan insertion and enables authentication of connecting devices (such as IoT and mobile). Chaos-based systems are also used to generate pseudo-random numbers for cryptographic applications.The chaotic map is the building block for the design of discrete-time chaos-based oscillator. The analog output of the oscillator is converted to digital value using a comparator in order to build logic gates. The logic gate is reconfigurable since different parameters in the circuit topology can be altered to implement multiple Boolean functions using the same system. The tuning parameters are control input, bifurcation parameter, iteration number and threshold voltage of the comparator. The proposed system is a hybrid between standard CMOS logic gates and reconfigurable chaos-based logic gates where original gates are replaced by chaos-based gates. The system works in two modes: logic locking and authentication. In logic locking mode, the goal is to ensure that the system achieves logic obfuscation in order to mitigate IC counterfeiting. The secret key for logic locking is made up of the tuning parameters of the chaotic oscillator. Each gate has 10-bit key which ensures that the key space is large which exponentially increases the computational complexity of any attack. In authentication mode, the aim of the system is to provide authentication of devices so that adversaries cannot connect to devices to learn confidential information. Chaos-based computing system is susceptible to process variation which can be leveraged to build a chaos-based PUF. The proposed system demonstrates near ideal PUF characteristics which means systems with large number of primary outputs can be used for authenticating devices

Secure Split Test for Preventing IC Piracy by Un-Trusted Foundry and Assembly

In the era of globalization, integrated circuit design and manufacturing is spread across different continents. This has posed several hardware intrinsic security issues. The issues are related to overproduction of chips without knowledge of designer or OEM, insertion of hardware Trojans at design and fabrication phase, faulty chips getting into markets from test centers, etc. In this thesis work, we have addressed the problem of counterfeit IC‟s getting into the market through test centers. The problem of counterfeit IC has different dimensions. Each problem related to counterfeiting has different solutions. Overbuilding of chips at overseas foundry can be addressed using passive or active metering. The solution to avoid faulty chips getting into open markets from overseas test centers is secure split test (SST). The further improvement to SST is also proposed by other researchers and is known as Connecticut Secure Split Test (CSST). In this work, we focus on improvements to CSST techniques in terms of security, test time and area. In this direction, we have designed all the required sub-blocks required for CSST architecture, namely, RSA, TRNG, Scrambler block, study of benchmark circuits like S38417, adding scan chains to benchmarks is done. Further, as a security measure, we add, XOR gate at the output of the scan chains to obfuscate the signal coming out of the scan chains. Further, we have improved the security of the design by using the PUF circuit instead of TRNG and avoid the use of the memory circuits. This use of PUF not only eliminates the use of memory circuits, but also it provides the way for functional testing also. We have carried out the hamming distance analysis for introduced security measure and results show that security design is reasonably good.Further, as a future work we can focus on: • Developing the circuit which is secuered for the whole semiconductor supply chain with reasonable hamming distance and less area overhead

Asynchronous design of a multi-dimensional logarithmic number system processor for digital hearing instruments.

This thesis presents an asynchronous Multi-Dimensional Logarithmic Number System (MDLNS) processor that exhibits very low power dissipation. The target application is for a hearing instrument DSP. The MDLNS is a newly developed number system that has the advantage of reducing hardware complexity compared to the classical Logarithmic Number System (LNS). A synchronous implementation of a 2-digit 2DLNS filterbank, using the MDLNS to construct a FIR filterbank, has successfully proved that this novel number representation can benefit this digital hearing instrument application in the requirement of small size and low power. In this thesis we demonstrate that the combination of using the MDLNS, along with an asynchronous design methodology, produces impressive power savings compared to the previous synchronous design. A 4-phase bundled-data full-handshaking protocol is applied to the asynchronous control design. We adopt the Differential Cascade Voltage Switch Logic (DCVSL) circuit family for the design of the computation cells in this asynchronous MDLNS processor. Besides the asynchronous design methodology, we also use finite ring calculations to reduce adder bit-width to provide improvements compared to the previous MDLNS filterbank architecture. Spectre power simulation results from simulations of this asynchronous MDLNS processor demonstrate that over 70 percent power savings have been achieved compared to the synchronous design. This full-custom asynchronous MDLNS processor has been submitted for fabrication in the TSMC 0.18mum CMOS technology. A further contribution in this thesis is the development of a novel synchronizing method of design for testability (DfT), which is offered as a possible solution for asynchronous DfT methods.Dept. of Electrical and Computer Engineering. Paper copy at Leddy Library: Theses & Major Papers - Basement, West Bldg. / Call Number: Thesis2004 .W85. Source: Masters Abstracts International, Volume: 43-01, page: 0288. Advisers: G. A. Jullien; W. C. Miller. Thesis (M.A.Sc.)--University of Windsor (Canada), 2004

A Hardware Security Solution against Scan-Based Attacks

Scan based Design for Test (DfT) schemes have been widely used to achieve high fault coverage for integrated circuits. The scan technique provides full access to the internal nodes of the device-under-test to control them or observe their response to input test vectors. While such comprehensive access is highly desirable for testing, it is not acceptable for secure chips as it is subject to exploitation by various attacks. In this work, new methods are presented to protect the security of critical information against scan-based attacks. In the proposed methods, access to the circuit containing secret information via the scan chain has been severely limited in order to reduce the risk of a security breach. To ensure the testability of the circuit, a built-in self-test which utilizes an LFSR as the test pattern generator (TPG) is proposed. The proposed schemes can be used as a countermeasure against side channel attacks with a low area overhead as compared to the existing solutions in literature

Delay Measurements and Self Characterisation on FPGAs

This thesis examines new timing measurement methods for self delay characterisation of Field-Programmable Gate Arrays (FPGAs) components and delay measurement of complex circuits on FPGAs. Two novel measurement techniques based on analysis of a circuit's output failure rate and transition probability is proposed for accurate, precise and efficient measurement of propagation delays. The transition probability based method is especially attractive, since it requires no modifications in the circuit-under-test and requires little hardware resources, making it an ideal method for physical delay analysis of FPGA circuits. The relentless advancements in process technology has led to smaller and denser transistors in integrated circuits. While FPGA users benefit from this in terms of increased hardware resources for more complex designs, the actual productivity with FPGA in terms of timing performance (operating frequency, latency and throughput) has lagged behind the potential improvements from the improved technology due to delay variability in FPGA components and the inaccuracy of timing models used in FPGA timing analysis. The ability to measure delay of any arbitrary circuit on FPGA offers many opportunities for on-chip characterisation and physical timing analysis, allowing delay variability to be accurately tracked and variation-aware optimisations to be developed, reducing the productivity gap observed in today's FPGA designs. The measurement techniques are developed into complete self measurement and characterisation platforms in this thesis, demonstrating their practical uses in actual FPGA hardware for cross-chip delay characterisation and accurate delay measurement of both complex combinatorial and sequential circuits, further reinforcing their positions in solving the delay variability problem in FPGAs

The 1991 3rd NASA Symposium on VLSI Design

Papers from the symposium are presented from the following sessions: (1) featured presentations 1; (2) very large scale integration (VLSI) circuit design; (3) VLSI architecture 1; (4) featured presentations 2; (5) neural networks; (6) VLSI architectures 2; (7) featured presentations 3; (8) verification 1; (9) analog design; (10) verification 2; (11) design innovations 1; (12) asynchronous design; and (13) design innovations 2

DESIGN AND TEST OF DIGITAL CIRCUITS AND SYSTEMS USING CMOS AND EMERGING RESISTIVE DEVICES

The memristor is an emerging nano-device. Low power operation, high density, scalability, non-volatility, and compatibility with CMOS Technology have made it a promising technology for memory, Boolean implementation, computing, and logic systems. This dissertation focuses on testing and design of such applications. In particular, we investigate on testing of memristor-based memories, design of memristive implementation of Boolean functions, and reliability and design of neuromorphic computing such as neural network. In addition, we show how to modify threshold logic gates to implement more functions. Although memristor is a promising emerging technology but is prone to defects due to uncertainties in nanoscale fabrication. Fast March tests are proposed in Chapter 2 that benefit from fast write operations. The test application time is reduced significantly while simultaneously reducing the average test energy per cell. Experimental evaluation in 45 nm technology show a speed-up of approximately 70% with a decrease in energy by approximately 40%. DfT schemes are proposed to implement the new test methods. In Chapter 3, an Integer Linear Programming based framework to identify current-mode threshold logic functions is presented. It is shown that threshold logic functions can be implemented in CMOS-based current mode logic with reduced transistor count when the input weights are not restricted to be integers. Experimental results show that many more functions can be implemented with predetermined hardware overhead, and the hardware requirement of a large percentage of existing threshold functions is reduced when comparing to the traditional CMOS-based threshold logic implementation. In Chapter 4, a new method to implement threshold logic functions using memristors is presented. This method benefits from the high range of memristor’s resistivity which is used to define different weight values, and reduces significantly the transistor count. The proposed approach implements many more functions as threshold logic gates when comparing to existing implementations. Experimental results in 45 nm technology show that the proposed memristive approach implements threshold logic gates with less area and power consumption. Finally, Chapter 5 focuses on current-based designs for neural networks. CMOS aging impacts the total synaptic current and this impacts the accuracy. Chapter 5 introduces an enhanced memristive crossbar array (MCA) based analog neural network architecture to improve reliability due to the aging effect. A built-in current-based calibration circuit is introduced to restore the total synaptic current. The calibration circuit is a current sensor that receives the ideal reference current for non-aged column and restores the reduced sensed current at each column to the ideal value. Experimental results show that the proposed approach restores the currents with less than 1% precision, and the area overhead is negligible

34th Midwest Symposium on Circuits and Systems-Final Program

Organized by the Naval Postgraduate School Monterey California. Cosponsored by the IEEE Circuits and Systems Society. Symposium Organizing Committee: General Chairman-Sherif Michael, Technical Program-Roberto Cristi, Publications-Michael Soderstrand, Special Sessions- Charles W. Therrien, Publicity: Jeffrey Burl, Finance: Ralph Hippenstiel, and Local Arrangements: Barbara Cristi

Center for Aeronautics and Space Information Sciences

This report summarizes the research done during 1991/92 under the Center for Aeronautics and Space Information Science (CASIS) program. The topics covered are computer architecture, networking, and neural nets

SOFTWARE IMPLEMENTATION OF IC TOPOLOGY TRANSFORMATIONS FOR PROTECTION AGAINST HARDWARE TROJANS

This article focuses on software methods for detecting and preventing the introduction of hardware trojans into the topology of integrated circuits at the design stage. An additional recommendation for typical procedures of receiving GDSII files that significantly complicates the introduction of HTs into the topology is to facilitate detection methods by including special self-test structures created after performing transformations of the initial topology and ensuring the effective examination of ICs at the post-manufacture test stage. The proposed method is based on the analysis of synthesis results at the level of netlist description, its subsequent software conversion into a topological drawing, shifting standard cells and filling created voids with special self-test cells. The method is simple to implement during the topology design stage and can be recommended for use in design centres for machine learning of computer-aided design systems