On-line diagnosis of unrestricted faults

A formal model for the study of on-line diagnosis is introduced and used to investigate the diagnosis of unrestricted faults. A fault of a system S is considered to be a transformation of S into another system S' at some time tau. The resulting faulty system is taken to be the system which looks like S up to time tau, and like S' thereafter. Notions of fault tolerance error are defined in terms of the resulting system being able to mimic some desired behavior as specified by a system similar to S. A notion of on-line diagnosis is formulated which involves an external detector and a maximum time delay within which every error caused by a fault in a prescribed set must be detected. It is shown that if a system is on-line diagnosable for the unrestricted set of faults then the detector is at least as complex, in terms of state set size, as the specification. The use of inverse systems for the diagnosis of unrestricted faults is considered. A partial characterization of those inverses which can be used for unrestricted fault diagnosis is obtained

Sequential Circuit Design for Embedded Cryptographic Applications Resilient to Adversarial Faults

In the relatively young field of fault-tolerant cryptography, the main research effort has focused exclusively on the protection of the data path of cryptographic circuits. To date, however, we have not found any work that aims at protecting the control logic of these circuits against fault attacks, which thus remains the proverbial Achilles’ heel. Motivated by a hypothetical yet realistic fault analysis attack that, in principle, could be mounted against any modular exponentiation engine, even one with appropriate data path protection, we set out to close this remaining gap. In this paper, we present guidelines for the design of multifault-resilient sequential control logic based on standard Error-Detecting Codes (EDCs) with large minimum distance. We introduce a metric that measures the effectiveness of the error detection technique in terms of the effort the attacker has to make in relation to the area overhead spent in implementing the EDC. Our comparison shows that the proposed EDC-based technique provides superior performance when compared against regular N-modular redundancy techniques. Furthermore, our technique scales well and does not affect the critical path delay

Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell

A formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems in SoCs. The goal is to offer designers testing options that do not have significant area overhead, performance degradation, or test time. This work shows that OBT is a potential candidate for IP providers to use in combination with functional test techniques. We have shown how to modify the basic concept of OBT to come up with a practical method. Using our approach, designers can use OBT to pave the way for future developments in SoC testing, and it is simple to extend this idea to BIST.European Union 2635

Measurements, Models, Systems and Design

531 s.

Fault diagnostic instrumentation design for environmental control and life support systems

As a development phase moves toward flight hardware, the system availability becomes an important design aspect which requires high reliability and maintainability. As part of continous development efforts, a program to evaluate, design, and demonstrate advanced instrumentation fault diagnostics was successfully completed. Fault tolerance designs for reliability and other instrumenation capabilities to increase maintainability were evaluated and studied

RON-BEAM DEBUG AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS

A current research project at IMAG/TIM3 Laboratory aims at an integrated test system combining the use of the Scanning Electron Microscope (SEM), used in voltage contrast mode, with a new high-level approach of fault location in complex VLSI circuits, in order to reach a complete automated diagnosis process. Two research themes are induced by this project, which are: prototype validation of known circuits, on which CAD information is available, and failure analysis of unknown circuits, which are compared to reference circuits. For prototype validation, a knowledge-based approach to fault location is used. Concerning failure analysis, automatic image comparison based on pattern recog- nition techniques is performed. The purpose of the paper is to present these two methodologies, focusing on the SEM-based data acquisition process