177 research outputs found

    Fault-tolerance techniques for hybrid CMOS/nanoarchitecture

    Get PDF
    The authors propose two fault-tolerance techniques for hybrid CMOS/nanoarchitecture implementing logic functions as look-up tables. The authors compare the efficiency of the proposed techniques with recently reported methods that use single coding schemes in tolerating high fault rates in nanoscale fabrics. Both proposed techniques are based on error correcting codes to tackle different fault rates. In the first technique, the authors implement a combined two-dimensional coding scheme using Hamming and Bose-Chaudhuri-Hocquenghem (BCH) codes to address fault rates greater than 5. In the second technique, Hamming coding is complemented with bad line exclusion technique to tolerate fault rates higher than the first proposed technique (up to 20). The authors have also estimated the improvement that can be achieved in the circuit reliability in the presence of Don-t Care Conditions. The area, latency and energy costs of the proposed techniques were also estimated in the CMOS domain

    Probabilistic analysis of defect tolerance in asynchronous nano crossbar architecture

    Get PDF
    Among recent advancements in technology, nanotechnology is particularly promising. Most researchers have begun to focus their efforts on developing nano scale circuits. Nano scale devices such as carbon nano tubes (CNT) and silicon nano wires (SiNW) form the primitive building blocks of many nano scale logic devices and recently developed computing architecture. One of the most promising nanotechnologies is crossbar-based architecture, a two-dimensional nanoarray, formed by the intersection of two orthogonal sets of parallel and uniformly-spaced CNTs or SiNWs. Nanowire crossbars offer the potential for ultra-high density, which has never been achieved by photolithography. In an effort to improve these circuits, our research group proposed a new Null Convention Logic (NCL) based clock-less crossbar architecture. By eliminating the clock, this architecture makes possible a still higher density in reconfigurable systems. Defect density, however, is directly proportional to the density of nanowires in the architecture. Future work, therefore, must improve the defect tolerance of these asynchronous structures. The thesis comprises two papers. The first introduces asynchronous crossbar architecture and concludes with the validation of mapping a 1-bit adder on it. It also discusses various advantages of asynchronous crossbar architecture over clock based nano structures. The second paper concentrates on the probabilistic analysis of asynchronous nano crossbar architecture to address the high defect rates in these structures. It analyzes the probability distribution of mapping functions over the structure for varying number of defects and proposes a method to increase the probability of successful mapping --Abstract, page iv

    Asynchronous nanowire crossbar architecture for manufacturability, modularity and robustness

    Get PDF
    This thesis spotlights the dawn of a promising new nanowire crossbar architecture, the Asynchronous crossbar architecture, in the form of three different articles. It combines the reduced size of the nanowire crossbar architecture with the clock-free nature of Null Conventional Logic, which are the primary advantages. The first paper explains the proposed architecture with illustrations, including the design of an optimized full adder. This architecture has an elementary structure termed as a Programmable Gate Macro Block (PGMB) which is analogous to a threshold gate in NCL. The other two papers concentrate on mapping and placement techniques which are important due to defects involved in crossbars. These defects have to be tolerated and logic has to be routed appropriately for successful functioning of the circuit --Introduction, page 1

    Advances in Nanowire-Based Computing Architectures

    Get PDF

    Cost-Driven Repair of a Nanowire Crossbar Architecture

    Get PDF
    The recent development of nanoscale materials and assembly techniques has resulting in the manufacturing of high-density computational systems. These systems consist of nanometer-scale elements and are likely to have many manufacturing imperfections (defects); thus, defect-tolerance is considered as one of the most some algorithms for repairing defective crosspoints in a nanoscale crossbar architecture; furthermore we estimate the efficiency and cost-effectiveness of each algorithm. Also, for a given design and manufacturing environment, we propose a cost-driven method to find a balanced solution by which figures of merit such as area, repair time and reconfiguration cost can be taken into account. Probabilistic parameters are utilized in the proposed cost-driven method for added flexibility

    Quantum-dot Cellular Automata: Review Paper

    Get PDF
    Quantum-dot Cellular Automata (QCA) is one of the most important discoveries that will be the successful alternative for CMOS technology in the near future. An important feature of this technique, which has attracted the attention of many researchers, is that it is characterized by its low energy consumption, high speed and small size compared with CMOS.  Inverter and majority gate are the basic building blocks for QCA circuits where it can design the most logical circuit using these gates with help of QCA wire. Due to the lack of availability of review papers, this paper will be a destination for many people who are interested in the QCA field and to know how it works and why it had taken lots of attention recentl

    Redundant Logic Insertion and Fault Tolerance Improvement in Combinational Circuits

    Full text link
    This paper presents a novel method to identify and insert redundant logic into a combinational circuit to improve its fault tolerance without having to replicate the entire circuit as is the case with conventional redundancy techniques. In this context, it is discussed how to estimate the fault masking capability of a combinational circuit using the truth-cum-fault enumeration table, and then it is shown how to identify the logic that can introduced to add redundancy into the original circuit without affecting its native functionality and with the aim of improving its fault tolerance though this would involve some trade-off in the design metrics. However, care should be taken while introducing redundant logic since redundant logic insertion may give rise to new internal nodes and faults on those may impact the fault tolerance of the resulting circuit. The combinational circuit that is considered and its redundant counterparts are all implemented in semi-custom design style using a 32/28nm CMOS digital cell library and their respective design metrics and fault tolerances are compared

    Functional testing of faults in asynchronous crossbar architecture

    Get PDF
    The challenge of extending Moore\u27s Law past the physical limits of the present semiconductor technology calls for novel innovations. Several novel nanotechnologies are being proposed as an alternative to their CMOS counterparts, with nanowire crossbar being one of the most promising paradigms. Quite recently, a new promising clock-free architecture, called the Asynchronous Crossbar Architecture has been proposed to enhance the manufacturability and to improve the robustness of digital circuits by removing various timing related failure modes. Even though the proposed clock-free architecture offers several merits, it is not free from the high defect rates induced due to nondeterministic nanoscale assembly. In this work, a unique Functional Test Algorithm (FTA) has been proposed and validated to test for manufacturing defects in this architecture. The proposed Functional Test Algorithm is aimed at reducing the testing overhead in terms of the time and space complexity associated with the existing sequential test scheme. In addition, it is designed to provide high fault coverage and excellent fault-tolerance via post-reconfiguration. This test scheme can be effectively used to assure true functionality of any threshold gate realized on a given PGMB. The main motivation behind this research is to propose a comprehensive test scheme which can achieve sufficiently high test coverage with acceptable test overhead. This test algorithm is a significant effort towards viable nanoscale computation --Abstract, page iv
    corecore