208 research outputs found
A Review of Bayesian Methods in Electronic Design Automation
The utilization of Bayesian methods has been widely acknowledged as a viable
solution for tackling various challenges in electronic integrated circuit (IC)
design under stochastic process variation, including circuit performance
modeling, yield/failure rate estimation, and circuit optimization. As the
post-Moore era brings about new technologies (such as silicon photonics and
quantum circuits), many of the associated issues there are similar to those
encountered in electronic IC design and can be addressed using Bayesian
methods. Motivated by this observation, we present a comprehensive review of
Bayesian methods in electronic design automation (EDA). By doing so, we hope to
equip researchers and designers with the ability to apply Bayesian methods in
solving stochastic problems in electronic circuits and beyond.Comment: 24 pages, a draft version. We welcome comments and feedback, which
can be sent to [email protected]
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