Efficient Implementation on Low-Cost SoC-FPGAs of TLSv1.2 Protocol with ECC_AES Support for Secure IoT Coordinators

Security management for IoT applications is a critical research field, especially when taking into account the performance variation over the very different IoT devices. In this paper, we present high-performance client/server coordinators on low-cost SoC-FPGA devices for secure IoT data collection. Security is ensured by using the Transport Layer Security (TLS) protocol based on the TLS_ECDHE_ECDSA_WITH_AES_128_CBC_SHA256 cipher suite. The hardware architecture of the proposed coordinators is based on SW/HW co-design, implementing within the hardware accelerator core Elliptic Curve Scalar Multiplication (ECSM), which is the core operation of Elliptic Curve Cryptosystems (ECC). Meanwhile, the control of the overall TLS scheme is performed in software by an ARM Cortex-A9 microprocessor. In fact, the implementation of the ECC accelerator core around an ARM microprocessor allows not only the improvement of ECSM execution but also the performance enhancement of the overall cryptosystem. The integration of the ARM processor enables to exploit the possibility of embedded Linux features for high system flexibility. As a result, the proposed ECC accelerator requires limited area, with only 3395 LUTs on the Zynq device used to perform high-speed, 233-bit ECSMs in 413 µs, with a 50 MHz clock. Moreover, the generation of a 384-bit TLS handshake secret key between client and server coordinators requires 67.5 ms on a low cost Zynq 7Z007S device

Towards composition of verified hardware devices

Computers are being used where no affordable level of testing is adequate. Safety and life critical systems must find a replacement for exhaustive testing to guarantee their correctness. Through a mathematical proof, hardware verification research has focused on device verification and has largely ignored system composition verification. To address these deficiencies, we examine how the current hardware verification methodology can be extended to verify complete systems

THE EVOLUTION OF THE INTELLIGENT CARDS AND THE ROMANIAN MARKET

This paper will try to describe the close relationship between the economic evolution and technology, especially how the technical aspects of debit/credit cards interact with the economical aspects. There are approached concepts related to smart card and especially the use of cards in different economic purposes. Since the introduction of the first cards there has been an accelerated growth of the use of smart cards. One of the essential growth factors has been the progress in the electronic industry and the accelerated development of the software companies, which allowed the emergence of interactive financial services such as e-banking, mobile banking, smart cards being considered the access key to these modern services.Smart cards, credit cards, debit cards, card market in Romania, card payments

Cross-layer system reliability assessment framework for hardware faults

System reliability estimation during early design phases facilitates informed decisions for the integration of effective protection mechanisms against different classes of hardware faults. When not all system abstraction layers (technology, circuit, microarchitecture, software) are factored in such an estimation model, the delivered reliability reports must be excessively pessimistic and thus lead to unacceptably expensive, over-designed systems. We propose a scalable, cross-layer methodology and supporting suite of tools for accurate but fast estimations of computing systems reliability. The backbone of the methodology is a component-based Bayesian model, which effectively calculates system reliability based on the masking probabilities of individual hardware and software components considering their complex interactions. Our detailed experimental evaluation for different technologies, microarchitectures, and benchmarks demonstrates that the proposed model delivers very accurate reliability estimations (FIT rates) compared to statistically significant but slow fault injection campaigns at the microarchitecture level.Peer ReviewedPostprint (author's final draft