Micro/Nano Structures and Systems

Micro/Nano Structures and Systems: Analysis, Design, Manufacturing, and Reliability is a comprehensive guide that explores the various aspects of micro- and nanostructures and systems. From analysis and design to manufacturing and reliability, this reprint provides a thorough understanding of the latest methods and techniques used in the field. With an emphasis on modern computational and analytical methods and their integration with experimental techniques, this reprint is an invaluable resource for researchers and engineers working in the field of micro- and nanosystems, including micromachines, additive manufacturing at the microscale, micro/nano-electromechanical systems, and more. Written by leading experts in the field, this reprint offers a complete understanding of the physical and mechanical behavior of micro- and nanostructures, making it an essential reference for professionals in this field

Contribuição para as técnicas de detecção de falhas em placas de circuito impresso utilizando a transformada rápida de wavelet

Orientador: Yuzo IanoDissertação (mestrado) - Universidade Estadual de Campinas, Faculdade de Engenharia Elétrica e de ComputaçãoResumo: Muitos trabalhos foram desenvolvidos na área de visão computacional aplicados à detecção de falhas em placas de circuito impresso (PCI's), visando reduzir a possibilidade de ocorrência de defeitos de fabricação. Nesse trabalho, a partir de modelos de layouts de referência e de teste de PCI's - sem componentes, estudou-se a aplicação de uma técnica de subtração de imagem para a detecção de falhas desses layouts de placas de circuito impresso utilizando a Transformada Rápida de Wavelet (FWT) durante o processamento de imagem. Assim, desenvolvendo as equações da Transformada de Wavelet Discreta (DWT), pode-se comparar a eficácia dessa técnica de processamento de imagem utilizando simulações lineares em MATLAB. Foram obtidos resultados significativos na redução do tempo de processamento e eficácia de classificação de imagem, indicando vantagens no uso desse tipo de técnica de processamento de imagem nos casos simuladosAbstract: Various concentrated work has been developed in the area of computer vision applied to detection of failures on printed circuit boards (PC's), aiming at reducing the possibility of the occurrence of the fabrication defects. In this research, based on PCI's - without mounting reference and test layout models, the objective is to study is the application of an image ubtraction technique to the failure detection of those bare printed circuit boards layouts using the Fast Wavelet Transform (FWT) during the image processing. By developing the Discrete Wavelet Transform (DWT) equations, one may compare the efficiency of this image processing technique using linear simulations developed in MATLAB. Significative results were obtained regarding the reduction of the image processing time and image classification efficiency, thus indicating advantages in using this technique in the simulated casesMestradoTelecomunicações e TelemáticaMestre em Engenharia Elétric

NASA Tech Briefs Index, 1978

Approximately 601 announcements of new technology derived from the research and development activities of the National Aeronautics and Space Administration are presented. Emphasis is placed on information considered likely to be transferrable across industrial, regional, or disciplinary lines. Subject matter covered includes: electronic components and circuits; electron systems; physical sciences; materials; life sciences; mechanics; machinery; fabrication technology; and mathematics and information sciences

A framework for waste heat energy recovery within manufacturing

One third of energy consumption is attributed to the industrial sector, with as much as half ultimately wasted as heat. Consequently, research has focused on providing a framework for waste heat energy recovery within manufacturing. A decision support tool is hence developed based on the framework to deliver a streamlined and optimised heat recovery strategy. Substantial improvement in plant energy efficiency together with financial and environmental benefit from heat recovery has been demonstrated

A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry

Electronics industry is one of the fastest evolving, innovative, and most competitive industries. In order to meet the high consumption demands on electronics components, quality standards of the products must be well-maintained. Automatic optical inspection (AOI) is one of the non-destructive techniques used in quality inspection of various products. This technique is considered robust and can replace human inspectors who are subjected to dull and fatigue in performing inspection tasks. A fully automated optical inspection system consists of hardware and software setups. Hardware setup include image sensor and illumination settings and is responsible to acquire the digital image, while the software part implements an inspection algorithm to extract the features of the acquired images and classify them into defected and non-defected based on the user requirements. A sorting mechanism can be used to separate the defective products from the good ones. This article provides a comprehensive review of the various AOI systems used in electronics, micro-electronics, and opto-electronics industries. In this review the defects of the commonly inspected electronic components, such as semiconductor wafers, flat panel displays, printed circuit boards and light emitting diodes, are first explained. Hardware setups used in acquiring images are then discussed in terms of the camera and lighting source selection and configuration. The inspection algorithms used for detecting the defects in the electronic components are discussed in terms of the preprocessing, feature extraction and classification tools used for this purpose. Recent articles that used deep learning algorithms are also reviewed. The article concludes by highlighting the current trends and possible future research directions.Framework of the IQONIC Project; European Union’s Horizon 2020 Research and Innovation Program

Advanced Image Acquisition, Processing Techniques and Applications

"Advanced Image Acquisition, Processing Techniques and Applications" is the first book of a series that provides image processing principles and practical software implementation on a broad range of applications. The book integrates material from leading researchers on Applied Digital Image Acquisition and Processing. An important feature of the book is its emphasis on software tools and scientific computing in order to enhance results and arrive at problem solution

Flexible Automation and Intelligent Manufacturing: The Human-Data-Technology Nexus

This is an open access book. It gathers the first volume of the proceedings of the 31st edition of the International Conference on Flexible Automation and Intelligent Manufacturing, FAIM 2022, held on June 19 – 23, 2022, in Detroit, Michigan, USA. Covering four thematic areas including Manufacturing Processes, Machine Tools, Manufacturing Systems, and Enabling Technologies, it reports on advanced manufacturing processes, and innovative materials for 3D printing, applications of machine learning, artificial intelligence and mixed reality in various production sectors, as well as important issues in human-robot collaboration, including methods for improving safety. Contributions also cover strategies to improve quality control, supply chain management and training in the manufacturing industry, and methods supporting circular supply chain and sustainable manufacturing. All in all, this book provides academicians, engineers and professionals with extensive information on both scientific and industrial advances in the converging fields of manufacturing, production, and automation

Optical In-Process Measurement Systems

Information is key, which means that measurements are key. For this reason, this book provides unique insight into state-of-the-art research works regarding optical measurement systems. Optical systems are fast and precise, and the ongoing challenge is to enable optical principles for in-process measurements. Presented within this book is a selection of promising optical measurement approaches for real-world applications