Exploiting Nanoelectronic Properties of Memory Chips for Prevention of IC Counterfeiting

This study presents a methodology for anticounterfeiting of Non-Volatile Memory (NVM) chips. In particular, we experimentally demonstrate a generalized methodology for detecting (i) Integrated Circuit (IC) origin, (ii) recycled or used NVM chips, and (iii) identification of used locations (addresses) in the chip. Our proposed methodology inspects latency and variability signatures of Commercial-Off-The-Shelf (COTS) NVM chips. The proposed technique requires low-cycle (~100) pre-conditioning and utilizes Machine Learning (ML) algorithms. We observe different trends in evolution of latency (sector erase or page write) with cycling on different NVM technologies from different vendors. ML assisted approach is utilized for detecting IC manufacturers with 95.1 % accuracy obtained on prepared test dataset consisting of 3 different NVM technologies including 6 different manufacturers (9 types of chips).Comment: 5 pages, 5 figures, accepted in IEEE NANO 202

Exploitation of Unintentional Information Leakage from Integrated Circuits

Unintentional electromagnetic emissions are used to recognize or verify the identity of a unique integrated circuit (IC) based on fabrication process-induced variations in a manner analogous to biometric human identification. The effectiveness of the technique is demonstrated through an extensive empirical study, with results presented indicating correct device identification success rates of greater than 99:5%, and average verification equal error rates (EERs) of less than 0:05% for 40 near-identical devices. The proposed approach is suitable for security applications involving commodity commercial ICs, with substantial cost and scalability advantages over existing approaches. A systematic leakage mapping methodology is also proposed to comprehensively assess the information leakage of arbitrary block cipher implementations, and to quantitatively bound an arbitrary implementation\u27s resistance to the general class of differential side channel analysis techniques. The framework is demonstrated using the well-known Hamming Weight and Hamming Distance leakage models, and approach\u27s effectiveness is demonstrated through the empirical assessment of two typical unprotected implementations of the Advanced Encryption Standard. The assessment results are empirically validated against correlation-based differential power and electromagnetic analysis attacks

Techniques for Improving Security and Trustworthiness of Integrated Circuits

The integrated circuit (IC) development process is becoming increasingly vulnerable to malicious activities because untrusted parties could be involved in this IC development flow. There are four typical problems that impact the security and trustworthiness of ICs used in military, financial, transportation, or other critical systems: (i) Malicious inclusions and alterations, known as hardware Trojans, can be inserted into a design by modifying the design during GDSII development and fabrication. Hardware Trojans in ICs may cause malfunctions, lower the reliability of ICs, leak confidential information to adversaries or even destroy the system under specifically designed conditions. (ii) The number of circuit-related counterfeiting incidents reported by component manufacturers has increased significantly over the past few years with recycled ICs contributing the largest percentage of the total reported counterfeiting incidents. Since these recycled ICs have been used in the field before, the performance and reliability of such ICs has been degraded by aging effects and harsh recycling process. (iii) Reverse engineering (RE) is process of extracting a circuit’s gate-level netlist, and/or inferring its functionality. The RE causes threats to the design because attackers can steal and pirate a design (IP piracy), identify the device technology, or facilitate other hardware attacks. (iv) Traditional tools for uniquely identifying devices are vulnerable to non-invasive or invasive physical attacks. Securing the ID/key is of utmost importance since leakage of even a single device ID/key could be exploited by an adversary to hack other devices or produce pirated devices. In this work, we have developed a series of design and test methodologies to deal with these four challenging issues and thus enhance the security, trustworthiness and reliability of ICs. The techniques proposed in this thesis include: a path delay fingerprinting technique for detection of hardware Trojans, recycled ICs, and other types counterfeit ICs including remarked, overproduced, and cloned ICs with their unique identifiers; a Built-In Self-Authentication (BISA) technique to prevent hardware Trojan insertions by untrusted fabrication facilities; an efficient and secure split manufacturing via Obfuscated Built-In Self-Authentication (OBISA) technique to prevent reverse engineering by untrusted fabrication facilities; and a novel bit selection approach for obtaining the most reliable bits for SRAM-based physical unclonable function (PUF) across environmental conditions and silicon aging effects