Pipelined analog-to-digital conversion using current-mode reference shifting

Dissertação para obtenção do grau de Mestre em Engenharia Electrotécnica e de ComputadoresPipeline Analog-to-digital converters (ADCs) are the most popular architecture for high-speed medium-to-high resolution applications. A fundamental, but often unreferenced building block of pipeline ADCs are the reference voltage circuits. They are required to maintain a stable reference with low output impedance to drive large internal switched capacitor loads quickly. Achieving this usually leads to a scheme that consumes a large portion of the overall power and area. A review of the literature shows that the required stable reference can be achieved with either on-chip buffering or with large off-chip decoupling capacitors. On-chip buffering is ideal for system integration but requires a high speed buffer with high power dissipation. The use of a reference with off-chip decoupling results in significant power savings but increases the pads of chip, the count of external components and the overall system cost. Moreover the amount of ringing on the internal reference voltage caused by the series inductance of the package makes this solution not viable for high speed ADCs. To address this challenge, a pipeline ADC employing a multiplying digital-to-analog converter (MDAC) with current-mode reference shifting is presented. Consequently, no reference voltages and, therefore, no voltage buffers are necessary. The bias currents are generated on-chip by a reference current generator that dissipates low power. The proposed ADC is designed in a 65 nm CMOS technology and operates at sampling rates ranging from 10 to 80 MS/s. At 40 MS/s the ADC dissipates 10.8 mW from a 1.2 V power supply and achieves an SNDR of 57.2 dB and a THD of -68 dB, corresponding to an ENOB of 9.2 bit. The corresponding figure of merit is 460 fJ/step

A Radiation-Hard Dual Channel 4-bit Pipeline for a 12-bit 40 MS/s ADC Prototype with extended Dynamic Range for the ATLAS Liquid Argon Calorimeter Readout Electronics Upgrade at the CERN LHC

The design of a radiation-hard dual channel 12-bit 40 MS/s pipeline ADC with extended dynamic range is presented, for use in the readout electronics upgrade for the ATLAS Liquid Argon Calorimeters at the CERN Large Hadron Collider. The design consists of two pipeline A/D channels with four Multiplying Digital-to-Analog Converters with nominal 12-bit resolution each. The design, fabricated in the IBM 130 nm CMOS process, shows a performance of 68 dB SNDR at 18 MHz for a single channel at 40 MS/s while consuming 55 mW/channel from a 2.5 V supply, and exhibits no performance degradation after irradiation. Various gain selection algorithms to achieve the extended dynamic range are implemented and tested.Comment: 22 pages, 22 figures, accepted by JINS

Low power VCO-based analog-to-digital conversion

textThis dissertation presents novel two stage ADC architecture with a VCO based second stage. With the scaling of the supply voltages in modern CMOS process it is difficult to design high gain operational amplifiers needed for traditional voltage domain two-stage analog to digital converters. However time resolution continues to improve with the advancement in CMOS technology making VCO-based ADC more attractive. The nonlinearity in voltage-to-frequency transfer function is the biggest challenge in design of VCO based ADC. The hybrid approach used in this work uses a voltage domain first stage to determine the most significant bits and uses a VCO based second stage to quantize the small residue obtained from first stage. The architecture relaxes the gain requirement on the the first stage opamp and also relaxes the linearity requirements on the second stage VCO. The prototype ADC built in 65nm CMOS process achieves 63.7dB SNDR in 10MHz bandwidth while only consuming 1.1mW of power. The performance of the prototype chip is comparable to the state-of-art in terms of figure-of-merit but this new architecture uses significantly less circuit area.Electrical and Computer Engineerin

Energy and area efficient techniques for data converters

Data converters are ubiquitous building blocks of a signal chain. The rapid increase in communication and connectivity devices presents new avenues for pushing the state of the art analog to digital converters. Techniques for improving resolution, bandwidth, linearity and bit-error rate, while reducing the power, energy and area is the motivation for this research. This research focuses on achieving this goal by enabling circuit techniques, architecture techniques and calibration methods. The following techniques are proposed for enabling power, area and energy efficient analog to digital converter techniques. 1. A capacitor switching scheme for successive approximation ADC is introduced to enable 93.4% energy reduction and 75 % reduction in capacitor area as compared to a conventional SAR ADCs. 2. Asynchronous correlated level shifting technique for improving current source linearity and power supply rejection ratio of zero crossing based circuits is proposed. This technique enables asynchronous ADC architectures for energy efficient system. 3. Unified gain enhancement model is proposed to catalogue gain enhancement techniques. Class-A+ and Replicated Parallel Gain Enhancement (RPGe) amplifiers are introduced as parallel gain enhancement techniques for switched capacitor circuits. A prototype pipelined ADC using RPGE amplifier achieves 74.9 dB SNDR, 90.8 dB SFDR, 87 dB THD at 20 MS/s. Built in 1P4M 0.18 μm technology and operating at 1.3 V supply, the ADC consumes 5.9 mW. The ADC occupies 3.06 sq. mm and has a figure of merit of 65 fJ /conversion step. Extracted simulation results of the prototype pipeline ADC using dynamic RPGE amplifier achieve 74 dB SNDR, 90 dB SFDR, and 85 dB THD at 30 MS /s in a 0.18 μm process. The ADC consumes 6.6 mW from a 1.3 V supply and achieves a figure of merit of 40 fJ/C-S. 4. A low-gain amplifier based V-T converter is utilized along with a TDC to replace the function of flash ADC and the DAC references in a pipeline ADC. The simulated/ extracted performance of the chip is 12bit, 100 MHz in 65nm process while consuming approximately 8-9 mA from 1 V supply. 5. A measurement technique for detecting and correcting bit-error rate in ADCs is proposed. This multi-path ADC technique squares the bit-error rate of the ADC without consuming additional analog power. The area increase is negligible compared to the conventional modular redundancy techniques. This technique can be applied to digitally detect and correct single event transients for ADCs. A three-path ADC can restore the ADC performance independent of the input frequency and number of errors in a single path. 6. LMS algorithm is used to estimate the VCO non-linearity by using the VCO as a Nyquist ADC and utilizing a slow but accurate ADC. The simulated ADC performance improves from 5 bits to 7.8 bits by using a second order fit to the VCO non-linearity

High-Speed Pipeline Analog-to-Digital Converter: Transistor-Level Design and Calibration Issues

La tesi riguarda la progettazione dei blocchi essenziali di un convertitore pipeline ad alta velocità (250MHz) a capacità commutate. Il lavoro inoltre include uno studio approfondito su due possibili tecniche di calibrazione del guadagno, delle non-linearità e del mismatch capacitivo

Design techniques for low-voltage and low-power analog-to-digital converters

With the ever-increasing demand for portable devices used in applications such as wireless communication, mobile computing, consumer electronics, etc., the scaling of the CMOS process to deep submicron dimensions becomes more important to achieve low-cost, low-power and high-performance digital systems. However, this downscaling also requires similar shrinking of the supply voltage to insure device reliability. Even though the largest amount of signal processing is done in the digital domain, the on-chip analog-to-digital interface circuitry (analog-to-digital and digital-to-analog converters) is an important functional block in the system. These converters are also required to operate with low-voltage supply. In this thesis, design techniques for low-voltage and low-power analog-to-digital converters are proposed. The specific research contributions of this work include (1) introduction of a new low-voltage switching technique for switched- capacitor circuit design, (2) development of low-voltage and low-distortion delta- sigma modulator, (3) development of low-voltage switched-capacitor multiplying digital-to-analog converter (MDAC), (4) a new architecture for the low-power Nyquist rate pipelined ADC design. These design techniques enable the implementation of low-voltage and low-power CMOS analog-to-digital converters. To demonstrate the proposed design techniques, a 0.6 V, 82 dB, 2-2 cascaded audio delta-sigma ADC, a 0.9 V, 10-bit, 20MS/s CMOS pipelined ADC and a 2.4 V, 12-bit, 10MS/s CMOS pipelined ADC were implemented in standard CMOS processes.Keywords: ADC, delta-sigma, low-voltage, low-power, switched-R

Pipeline analog-to-digital converters for wide-band wireless communications

During the last decade, the development of the analog electronics has been dictated by the enormous growth of the wireless communications. Typical for the new communication standards has been an evolution towards higher data rates, which allows more services to be provided. Simultaneously, the boundary between analog and digital signal processing is moving closer to the antenna, thus aiming for a software defined radio. For analog-to-digital converters (ADCs) of radio receivers this indicates higher sample rate, wider bandwidth, higher resolution, and lower power dissipation. The radio receiver architectures, showing the greatest potential to meet the commercial trends, include the direct conversion receiver and the super heterodyne receiver with an ADC sampling at the intermediate frequency (IF). The pipelined ADC architecture, based on the switched capacitor (SC) technique, has most successfully covered the widely separated resolution and sample rate requirements of these receiver architectures. In this thesis, the requirements of ADCs in both of these receiver architectures are studied using the system specifications of the 3G WCDMA standard. From the standard and from the limited performance of the circuit building blocks, design constraints for pipeline ADCs, at the architectural and circuit level, are drawn. At the circuit level, novel topologies for all the essential blocks of the pipeline ADC have been developed. These include a dual-mode operational amplifier, low-power voltage reference circuits with buffering, and a floating-bulk bootstrapped switch for highly-linear IF-sampling. The emphasis has been on dynamic comparators: a new mismatch insensitive topology is proposed and measurement results for three different topologies are presented. At the architectural level, the optimization of the ADCs in the single-chip direct conversion receivers is discussed: the need for small area, low power, suppression of substrate noise, input and output interfaces, etc. Adaptation of the resolution and sample rate of a pipeline ADC, to be used in more flexible multi-mode receivers, is also an important topic included. A 6-bit 15.36-MS/s embedded CMOS pipeline ADC and an 8-bit 1/15.36-MS/s dual-mode CMOS pipeline ADC, optimized for low-power single-chip direct conversion receivers with single-channel reception, have been designed. The bandwidth of a pipeline ADC can be extended by employing parallelism to allow multi-channel reception. The errors resulted from mismatch of parallel signal paths are analyzed and their elimination is presented. Particularly, an optimal partitioning of the resolution between the stages, and the number of parallel channels, in time-interleaved ADCs are derived. A low-power 10-bit 200-MS/s CMOS parallel pipeline ADC employing double sampling and a front-end sample-and-hold (S/H) circuit is implemented. Emphasis of the thesis is on high-resolution pipeline ADCs with IF-sampling capability. The resolution is extended beyond the limits set by device matching by using calibration, while time interleaving is applied to widen the signal bandwidth. A review of calibration and error averaging techniques is presented. A simple digital self-calibration technique to compensate capacitor mismatch within a single-channel pipeline ADC, and the gain and offset mismatch between the channels of a time-interleaved ADC, is developed. The new calibration method is validated with two high-resolution BiCMOS prototypes, a 13-bit 50-MS/s single-channel and a 14-bit 160-MS/s parallel pipeline ADC, both utilizing a highly linear front-end allowing sampling from 200-MHz IF-band.reviewe

Design techniques for low-voltage analog-to-digital converter

Continuous process scale-down and emerging markets for low-power/low-voltage mobile systems call for low-voltage analog integrated circuits. Switched-capacitor circuits are the building blocks for analog signal processing and will encounter severe overdrive problems when operating at low-voltage conditions. There are several well-known techniques to bypass the problem. These approaches include: (1) The clock boosting schemes (e.g. 2VDD clock signal) which cannot be used in submicron low-voltage CMOS processes as gate oxide can only tolerate the technology's maximum voltage (VDD). (2) The use of scaled/lower threshold transistors, which are not always scalable to very low voltage supplies as it could suffer from an unacceptable amount of leakage current (e.g. the switch may not be fully turned off). (3) The use of bootstrapped clocking, which has added loading and possible reliability issues. (4) The switched-opamp (SO) technique which is fully compatible with low-voltage submicron CMOS processes but the operating speed limited due to slow transients from the opamp being switched off and on. In this thesis, the Opamp-Reset Switching Technique (ORST) topology is proposed for low-voltage operation. Instead of opamps being turned on and off as in the switched-opamp technique, the sourcing amplifier is placed in the unity-gain reset configuration to provide reset level at the output. In this way, high-speed operation is possible. The technique is applied to two ADCs as examples of low-voltage design. The first design is a 10-bit 25MSPS pipelined ADC using pseudo-differential structure. It is fabricated in a 0.35-μm CMOS process. It operates at 1.4V and consumes 21mW of total power. The second design is a two-stage algorithmic ADC with highly linear input sampling circuit. In addition to the low-voltage design techniques used in the pipelined ADC, radix-based digital calibration technique for multi-stage ADC is also proposed. The ADC uses a 0.18-μm CMOS technology. It operates at 0.9V supply with total power consumption of 9mW. Experimental results show that the proposed calibration technique reduces spurious free dynamic range from 47dB to 75dB and improves signal-to-noise and distortion ratio from 40dB to 55dB after calibration