Physical Design and Clock Tree Synthesis Methods For A 8-Bit Processor

Now days a number of processors are available with a lot kind of feature from different industries. A processor with similar kind of architecture of the current processors only missing the memory stuffs like the RAM and ROM has been designed here with the help of Verilog style of coding. This processor contains architecturally the program counter, instruction register, ALU, ALU latch, General Purpose Registers, control state module, flag registers and the core module containing all the modules. And a test module is designed for testing the processor. After the design of the processor with successful functionality, the processor is synthesized with 180nm technology. The synthesis is performed with the data path optimization like the selection of proper adders and multipliers for timing optimization in the data path while the ALU operations are performed. During synthesis how to take care of the worst negative slack (WNS), how to include the clock gating cells, how to define the cost and path groups etc. have been covered. After the proper synthesis we get the proper net list and the synthesized constraint file for carrying out the physical design. In physical design the steps like floor-planning, partitioning, placement, legalization of the placement, clock tree synthesis, and routing etc. have been performed. At all the stages the static timing analysis is performed for the timing meet of the design for better performance in terms of timing or frequency. Each steps of physical design are discussed with special effort towards the concepts behind the step. Out of all the steps of physical design the clock tree synthesis is performed with some improvement in the performance of the clock tree by creating a symmetrical clock tree and maintaining more common clock paths. A special algorithm has been framed for creating a symmetrical clock tree and thereby making the power consumption of the clock tree low

Analysis and Design of Resilient VLSI Circuits

The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. Among these noise sources, soft errors (or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as combinational logic circuits. Also, in the DSM era, process variations are increasing at an alarming rate, making it more difficult to design reliable VLSI circuits. Hence, it is important to efficiently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this dissertation presents several analysis and design techniques with the goal of realizing VLSI circuits which are tolerant to radiation particle strikes and process variations. This dissertation consists of two parts. The first part proposes four analysis and two design approaches to address radiation particle strikes. The analysis techniques for the radiation particle strikes include: an approach to analytically determine the pulse width and the pulse shape of a radiation induced voltage glitch in combinational circuits, a technique to model the dynamic stability of SRAMs, and a 3D device-level analysis of the radiation tolerance of voltage scaled circuits. Experimental results demonstrate that the proposed techniques for analyzing radiation particle strikes in combinational circuits and SRAMs are fast and accurate compared to SPICE. Therefore, these analysis approaches can be easily integrated in a VLSI design flow to analyze the radiation tolerance of such circuits, and harden them early in the design flow. From 3D device-level analysis of the radiation tolerance of voltage scaled circuits, several non-intuitive observations are made and correspondingly, a set of guidelines are proposed, which are important to consider to realize radiation hardened circuits. Two circuit level hardening approaches are also presented to harden combinational circuits against a radiation particle strike. These hardening approaches significantly improve the tolerance of combinational circuits against low and very high energy radiation particle strikes respectively, with modest area and delay overheads. The second part of this dissertation addresses process variations. A technique is developed to perform sensitizable statistical timing analysis of a circuit, and thereby improve the accuracy of timing analysis under process variations. Experimental results demonstrate that this technique is able to significantly reduce the pessimism due to two sources of inaccuracy which plague current statistical static timing analysis (SSTA) tools. Two design approaches are also proposed to improve the process variation tolerance of combinational circuits and voltage level shifters (which are used in circuits with multiple interacting power supply domains), respectively. The variation tolerant design approach for combinational circuits significantly improves the resilience of these circuits to random process variations, with a reduction in the worst case delay and low area penalty. The proposed voltage level shifter is faster, requires lower dynamic power and area, has lower leakage currents, and is more tolerant to process variations, compared to the best known previous approach. In summary, this dissertation presents several analysis and design techniques which significantly augment the existing work in the area of resilient VLSI circuit design

Improved Physical Design for Manufacturing Awareness and Advanced VLSI

Increasing challenges arise with each new semiconductor technology node, especially in advanced nodes, where the industry tries to extract every ounce of benefit as it approaches the limits of physics, through manufacturing-aware design technology co-optimization and design-based equivalent scaling. The increasing complexity of design and process technologies, and ever-more complex design rules, also become hurdles for academic researchers, separating academic researchers from the most up-to-date technical issues.This thesis presents innovative methodologies and optimizations to address the above challenges. There are three directions in this thesis: (i) manufacturing-aware design technology co-optimization; (ii) advanced node design-based equivalent scaling; and (iii) an open source academic detailed routing flow.To realize manufacturing-aware design technology co-optimization, this thesis presents two works: (i) a multi-row detailed placement optimization for neighbor diffusion effect mitigation between neighboring standard cells; and (ii) a post-routing optimization to generate 2D block mask layout for dummy segment removal in self-aligned multiple patterning.To achieve advanced node design-based equivalent scaling, this thesis presents two improved physical design methodologies: (i) a post-placement flop tray generation approach for clock power reduction; and (ii) a detailed placement approach to exploit inter-row M1 routing for congestion and wirelength reduction.To address the increasing gap between academia and industry, this thesis presents two works toward an open source academic detailed routing flow: (i) a complete, robust, scalable and design ruleaware dynamic programming-based pin access analysis framework; and (ii) TritonRoute – the open source detailed router that is capable of delivering DRC-clean detailed routing solutions in advanced nodes.This thesis concludes with a summary of its contributions and open directions for future research

Algorithms for Power Aware Testing of Nanometer Digital ICs

At-speed testing of deep-submicron digital very large scale integrated (VLSI) circuits has become mandatory to catch small delay defects. Now, due to continuous shrinking of complementary metal oxide semiconductor (CMOS) transistor feature size, power density grows geometrically with technology scaling. Additionally, power dissipation inside a digital circuit during the testing phase (for test vectors under all fault models (Potluri, 2015)) is several times higher than its power dissipation during the normal functional phase of operation. Due to this, the currents that flow in the power grid during the testing phase, are much higher than what the power grid is designed for (the functional phase of operation). As a result, during at-speed testing, the supply grid experiences unacceptable supply IR-drop, ultimately leading to delay failures during at-speed testing. Since these failures are specific to testing and do not occur during functional phase of operation of the chip, these failures are usually referred to false failures, and they reduce the yield of the chip, which is undesirable. In nanometer regime, process parameter variations has become a major problem. Due to the variation in signalling delays caused by these variations, it is important to perform at-speed testing even for stuck faults, to reduce the test escapes (McCluskey and Tseng, 2000; Vorisek et al., 2004). In this context, the problem of excessive peak power dissipation causing false failures, that was addressed previously in the context of at-speed transition fault testing (Saxena et al., 2003; Devanathan et al., 2007a,b,c), also becomes prominent in the context of at-speed testing of stuck faults (Maxwell et al., 1996; McCluskey and Tseng, 2000; Vorisek et al., 2004; Prabhu and Abraham, 2012; Potluri, 2015; Potluri et al., 2015). It is well known that excessive supply IR-drop during at-speed testing can be kept under control by minimizing switching activity during testing (Saxena et al., 2003). There is a rich collection of techniques proposed in the past for reduction of peak switching activity during at-speed testing of transition/delay faults ii in both combinational and sequential circuits. As far as at-speed testing of stuck faults are concerned, while there were some techniques proposed in the past for combinational circuits (Girard et al., 1998; Dabholkar et al., 1998), there are no techniques concerning the same for sequential circuits. This thesis addresses this open problem. We propose algorithms for minimization of peak switching activity during at-speed testing of stuck faults in sequential digital circuits under the combinational state preservation scan (CSP-scan) architecture (Potluri, 2015; Potluri et al., 2015). First, we show that, under this CSP-scan architecture, when the test set is completely specified, the peak switching activity during testing can be minimized by solving the Bottleneck Traveling Salesman Problem (BTSP). This mapping of peak test switching activity minimization problem to BTSP is novel, and proposed for the first time in the literature. Usually, as circuit size increases, the percentage of don’t cares in the test set increases. As a result, test vector ordering for any arbitrary filling of don’t care bits is insufficient for producing effective reduction in switching activity during testing of large circuits. Since don’t cares dominate the test sets for larger circuits, don’t care filling plays a crucial role in reducing switching activity during testing. Taking this into consideration, we propose an algorithm, XStat, which is capable of performing test vector ordering while preserving don’t care bits in the test vectors, following which, the don’t cares are filled in an intelligent fashion for minimizing input switching activity, which effectively minimizes switching activity inside the circuit (Girard et al., 1998). Through empirical validation on benchmark circuits, we show that XStat minimizes peak switching activity significantly, during testing. Although XStat is a very powerful heuristic for minimizing peak input-switchingactivity, it will not guarantee optimality. To address this issue, we propose an algorithm that uses Dynamic Programming to calculate the lower bound for a given sequence of test vectors, and subsequently uses a greedy strategy for filling don’t cares in this sequence to achieve this lower bound, thereby guaranteeing optimality. This algorithm, which we refer to as DP-fill in this thesis, provides the globally optimal solution for minimizing peak input-switching-activity and also is the best known in the literature for minimizing peak input-switching-activity during testing. The proof of optimality of DP-fill in minimizing peak input-switching-activity is also provided in this thesis

Synthesis of variability-tolerant circuits with adaptive clocking

Improvements in circuit manufacturing have allowed, along the years, increasingly complex designs. This has been enabled by the miniaturization that circuit components have undergone. But, in recent years, this scaling has shown decreasing benefits as we approach fundamental limits. Furthermore, the decrease in size is nowadays producing an increase in variability: unpredictable differences and changes in the behavior of components. Historically, this has been addressed by establishing guardband margins at the design stage. Nonetheless, as variability grows, the amount of pessimism introduced by these margins is taking an ever-increasing cost on performance and power consumption. In recent years, several approaches have been proposed to lower the impact of variability and reduce margins. One such technique is the substitution of a classical PLL clock by a Ring Oscillator Clock. The design of the Ring Oscillator Clock is done in such a way that its variability is highly correlated to that of the circuit. One of the contributions of this thesis is in the automatic design of such circuits. In particular, we propose a novel method to design digital delay lines with variability-tracking properties. Those designs are also suitable for other purposes, such as bundled-data circuits or performance monitors. The advantage of the proposed technique is based on the exclusive use of cells from a standard cell library, which lowers the design cost and complexity. The other focus of this thesis is on state encoding for asynchronous controllers. One of the main properties of asynchronous circuits is their ability to, implicitly, work under variable conditions. In the near future, this advantage might increase the relevance of this class of circuits. One of the hardest stages for the synthesis of these circuits is the state encoding. This thesis presents a SAT-based algorithm for solving the state encoding at the state level. It is shown, by means of a comprehensive benchmark suite, that results obtained by this technique improve significantly compared to results from similar approaches. Nonetheless, the main limitation of techniques at the state level is the state explosion problem, to which the sequential modeling of concurrency is often subject to. The last contribution of this thesis is a method to process asynchronous circuits in order to allow the use of state-based techniques for large instances. In particular, the process is divided into three stages: projection, signal insertion and re-composition. In the projection step, the behavior of the controller is simplified until the signal insertion can be performed by state-based techniques. Afterwards, the re-composition generalizes the insertion of the signal into the original controller. Experimental results show that this process enables the resolution of large controllers, in the order of 10 6 states, by state-based techniques. At the same time, only a minor impact in solution quality is observed, preserving one of the main advantages for state-based approaches.A lo largo de los años, mejoras en la fabricación de circuitos han permitido diseños cada vez más complejos. Esta tendencia, que ha tenido lugar gracias a la miniaturización de los componentes que forman estos circuitos, recientemente está mostrando beneficios decrecientes a medida que nos acercamos a ciertas limitaciones fundamentales. Además de estos beneficios decrecientes, la reducción en tamaño está produciendo un aumento, cada vez mayor, en la variabilidad: diferencias impredecibles y cambios en el comportamiento de los componentes. Esto se ha compensado históricamente con el uso de márgenes de seguridad en la fase de diseño. No obstante, a medida que la variabilidad crece, la cantidad de pesimismo que estos márgenes introducen está afectando significativamente el coste en rendimiento y consumo energético. En los últimos años se han propuesto diferentes técnicas para limitar el impacto de la variabilidad y reducir márgenes de seguridad. Una de estas técnicas consiste en substituir un reloj PLL clásico por un Ring Oscillator Clock. El diseño de un Ring Oscillator Clock se realiza de manera que su variabilidad este altamente correlacionada con la del circuito. Una de las contribuciones de esta tesis consiste en el diseño automático de estos relojes. Concretamente, se propone un nuevo método para diseñar líneas de retardo digitales (digital delay lines) que tengan como propiedad la capacidad de imitar la variabilidad de un circuito dado. Estos diseños son también apropiados para otros propósitos, tal y como circuitos con ?bundled-data? o monitorizadores de rendimiento. La ventaja del método propuesto con respecto a otras técnicas similares radica en el uso exclusivo de celdas provenientes de una librería de celdas estándar, lo que reduce considerablemente el coste de diseño y su complejidad. Por otro lado, esta tesis también se centra en la codificación de estados de circuitos asíncronos. Una de las principales propiedades de estos circuitos reside en su capacidad implícita para trabajar bajo condiciones de variabilidad. Es previsible que, en un futuro próximo, esta ventaja se vuelva aún más relevante. La síntesis de circuitos asíncronos consta de varias etapas, una de las cuales es la codificación de estados. Este trabajo presenta un algoritmo basado en SAT que permite resolver la codificación de estados a nivel de estado. Mediante el uso de un exhaustivo banco de pruebas, esta tesis muestra como resultados obtenidos por esta técnica mejoran significativamente en comparación con otros métodos similares. A pesar de ello, técnicas que trabajan a nivel de estado tienen como principal limitación el problema conocido como "explosión de estados" que aparece habitualmente cuando se modelan elementos concurrentes de manera secuencial. Así pues, la última contribución de esta tesis es la propuesta de un método para procesar circuitos asíncronos de manera que técnicas a nivel de estado sean usables para instancias grandes. En concreto, el proceso está dividido en tres fases: proyección, inserción de señal y re-composición. En la etapa de proyección, el comportamiento del controlador es simplificado suficientemente como para que la inserción de la señal se pueda realizar con técnicas a nivel de estado. A continuación, la re-composición generaliza esta inserción en el controlador original. Resultados experimentales muestran que este proceso permite la resolución de grandes controladores, del orden de 10^6 estados, mediante el uso de técnicas a nivel de estado. Al mismo tiempo, solo se observa un impacto mínimo en la calidad de las soluciones, preservando una de las mayores ventajas de los métodos a nivel de estado

Online Timing Slack Measurement and its Application in Field-Programmable Gate Arrays

Reliability, power consumption and timing performance are key concerns for today's integrated circuits. Measurement techniques capable of quantifying the timing characteristics of a circuit, while it is operating, facilitate a range of benefits. Delay variation due to environmental and operational conditions, and degradation can be monitored by tracking changes in timing performance. Using the measurements in a closed-loop to control power supply voltage or clock frequency allows for the reduction of timing safety margins, leading to improvements in power consumption or throughput performance through the exploitation of better-than worst-case operation. This thesis describes a novel online timing slack measurement method which can directly measure the timing performance of a circuit, accurately and with minimal overhead. Enhancements allow for the improvement of absolute accuracy and resolution. A compilation flow is reported that can automatically instrument arbitrary circuits on FPGAs with the measurement circuitry. On its own this measurement method is able to track the "health" of an integrated circuit, from commissioning through its lifetime, warning of impending failure or instigating pre-emptive degradation mitigation techniques. The use of the measurement method in a closed-loop dynamic voltage and frequency scaling scheme has been demonstrated, achieving significant improvements in power consumption and throughput performance.Open Acces

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

Positive Design: A Positive Psychology Workout for Design Thinkers

Design Thinking is a creative process of innovation which is motivated by the empathic understanding of the person for whom the innovation is it intended to serve (i.e., the user). While the intention is to enhance the wellbeing of the user, it is likely that the process improves the wellbeing of those doing the innovating (i.e., the designer). While empirical research has yet to statistically test this hypothesis, evidence from positive psychology, the science of human thriving, provides insights into how this is possible. With the primary emphasis on the designer’s wellbeing, greater flourishing occurs within the design thinking process through the experience of positive emotions, deep engagement and opportunities for flow, rich relationships through radical collaboration, meaningful work by focusing on those whom are served (the user), and unique creative outcomes throughout the innovation process. By understanding these connections between wellbeing and design thinking, this paper also includes a Positive Psychology Workout Guide which outlines research-informed methods for achieving even greater human flourishing for those engaged in the design thinking process