38 research outputs found

    Integrated control and health management. Orbit transfer rocket engine technology program

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    To insure controllability of the baseline design for a 7500 pound thrust, 10:1 throttleable, dual expanded cycle, Hydrogen-Oxygen, orbit transfer rocket engine, an Integrated Controls and Health Monitoring concept was developed. This included: (1) Dynamic engine simulations using a TUTSIM derived computer code; (2) analysis of various control methods; (3) Failure Modes Analysis to identify critical sensors; (4) Survey of applicable sensors technology; and, (5) Study of Health Monitoring philosophies. The engine design was found to be controllable over the full throttling range by using 13 valves, including an oxygen turbine bypass valve to control mixture ratio, and a hydrogen turbine bypass valve, used in conjunction with the oxygen bypass to control thrust. Classic feedback control methods are proposed along with specific requirements for valves, sensors, and the controller. Expanding on the control system, a Health Monitoring system is proposed including suggested computing methods and the following recommended sensors: (1) Fiber optic and silicon bearing deflectometers; (2) Capacitive shaft displacement sensors; and (3) Hot spot thermocouple arrays. Further work is needed to refine and verify the dynamic simulations and control algorithms, to advance sensor capabilities, and to develop the Health Monitoring computational methods

    Production accompanying testing of the ATLAS Pixel module

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    The ATLAS Pixel detector, innermost sub-detector of the ATLAS experiment at LHC, CERN, can be sensibly tested in its entirety the first time after its installation in 2006. Because of the poor accessibility (probably once per year) of the Pixel detector and tight scheduling the replacement of damaged modules after integration as well as during operation will become a highly exposed business. Therefore and to ensure that no affected parts will be used in following production steps, it is necessary that each production step is accompanied by testing the components before assembly and make sure the operativeness afterwards. Probably 300 of about total 2000 semiconductor hybrid pixel detector modules will be build at the Universität Dortmund. Thus a production test setup has been build up and examined before starting serial production. These tests contain the characterization and inspection of the module components and the module itself under different environmental conditions and diverse operating parameters. Once a module is assembled the operativeness is tested with a radioactive source and the long-time stability is assured by a burn-in. A fully electrical characterization is the basis for module selection and sorting for the ATLAS Pixel detector. Additionally the charge collection behavior of irradiated and non irradiated modules has been investigated in the H8 beamline with 180 GeV pions

    Integrated circuit outlier identification by multiple parameter correlation

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    Semiconductor manufacturers must ensure that chips conform to their specifications before they are shipped to customers. This is achieved by testing various parameters of a chip to determine whether it is defective or not. Separating defective chips from fault-free ones is relatively straightforward for functional or other Boolean tests that produce a go/no-go type of result. However, making this distinction is extremely challenging for parametric tests. Owing to continuous distributions of parameters, any pass/fail threshold results in yield loss and/or test escapes. The continuous advances in process technology, increased process variations and inaccurate fault models all make this even worse. The pass/fail thresholds for such tests are usually set using prior experience or by a combination of visual inspection and engineering judgment. Many chips have parameters that exceed certain thresholds but pass Boolean tests. Owing to the imperfect nature of tests, to determine whether these chips (called "outliers") are indeed defective is nontrivial. To avoid wasted investment in packaging or further testing it is important to screen defective chips early in a test flow. Moreover, if seemingly strange behavior of outlier chips can be explained with the help of certain process parameters or by correlating additional test data, such chips can be retained in the test flow before they are proved to be fatally flawed. In this research, we investigate several methods to identify true outliers (defective chips, or chips that lead to functional failure) from apparent outliers (seemingly defective, but fault-free chips). The outlier identification methods in this research primarily rely on wafer-level spatial correlation, but also use additional test parameters. These methods are evaluated and validated using industrial test data. The potential of these methods to reduce burn-in is discussed

    Cryogenic Control Beyond 100 Qubits

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    Quantum computation has been a major focus of research in the past two decades, with recent experiments demonstrating basic algorithms on small numbers of qubits. A large-scale universal quantum computer would have a profound impact on science and technology, providing a solution to several problems intractable for classical computers. To realise such a machine, today's small experiments must be scaled up, and a system must be built which provides control and measurement of many hundreds of qubits. A device of this scale is challenging: qubits are highly sensitive to their environment, and sophisticated isolation techniques are required to preserve the qubits' fragile states. Solid-state qubits require deep-cryogenic cooling to suppress thermal excitations. Yet current state-of-the-art experiments use room-temperature electronics which are electrically connected to the qubits. This thesis investigates various scalable technologies and techniques which can be used to control quantum systems. With the requirements for semiconductor spin-qubits in mind, several custom electronic systems, to provide quantum control from deep cryogenic temperatures, are designed and measured. A system architecture is proposed for quantum control, providing a scalable approach to executing quantum algorithms on a large number of qubits. Control of a gallium arsenide qubit is demonstrated using a cryogenically operated FPGA driving custom gallium arsenide switches. The cryogenic performance of a commercial FPGA is measured, as the main logic processor in a cryogenic quantum control system, and digital-to-analog converters are analysed during cryogenic operation. Recent work towards a 100-qubit cryogenic control system is shown, including the design of interconnect solutions and multiplexing circuitry. With qubit fidelity over the fault-tolerant threshold for certain error correcting codes, accompanying control platforms will play a key role in the development of a scalable quantum machine

    Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

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    This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results
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