An adaptive method to tolerate soft errors in SRAM-based FPGAs

AbstractIn this paper, we present an adaptive method that is a combination of SEU-avoidance in CAD flow and adaptive redundancy to tolerate soft error effects in SRAM-based FPGAs. This method is based on the modification of T-VPack and VPR tools. Three different steps of these tools are modified for SEU-awareness: (1) clustering, (2) placement and (3) routing. Then we use the unused resources as redundancy. We have investigated the effect of this method on several MCNC benchmarks. This investigation has been performed using three experiments: (1) SEU-awareness in clustering with redundancy, (2) SEU-awareness in clustering and placement with redundancy and (3) SEU-awareness in clustering, placement and routing with redundancy. With a confidence level of 95%, the results show that, using each of these three experiments, the system failure rate of ten MCNC circuits has been decreased between 4.52% and 10.42%, between 10.25% and 21.63%, and between 10.48% and 24.39%, respectively

New Design Techniques for Dynamic Reconfigurable Architectures

L'abstract è presente nell'allegato / the abstract is in the attachmen

A novel FPGA-based evolvable hardware system based on multiple processing arrays

In this paper, an architecture based on a scalable and flexible set of Evolvable Processing arrays is presented. FPGA-native Dynamic Partial Reconfiguration (DPR) is used for evolution, which is done intrinsically, letting the system to adapt autonomously to variable run-time conditions, including the presence of transient and permanent faults. The architecture supports different modes of operation, namely: independent, parallel, cascaded or bypass mode. These modes of operation can be used during evolution time or during normal operation. The evolvability of the architecture is combined with fault-tolerance techniques, to enhance the platform with self-healing features, making it suitable for applications which require both high adaptability and reliability. Experimental results show that such a system may benefit from accelerated evolution times, increased performance and improved dependability, mainly by increasing fault tolerance for transient and permanent faults, as well as providing some fault identification possibilities. The evolvable HW array shown is tailored for window-based image processing applications

A design concept for radiation hardened RADFET readout system for space applications

Instruments for measuring the absorbed dose and dose rate under radiation exposure, known as radiation dosimeters, are indispensable in space missions. They are composed of radiation sensors that generate current or voltage response when exposed to ionizing radiation, and processing electronics for computing the absorbed dose and dose rate. Among a wide range of existing radiation sensors, the Radiation Sensitive Field Effect Transistors (RADFETs) have unique advantages for absorbed dose measurement, and a proven record of successful exploitation in space missions. It has been shown that the RADFETs may be also used for the dose rate monitoring. In that regard, we propose a unique design concept that supports the simultaneous operation of a single RADFET as absorbed dose and dose rate monitor. This enables to reduce the cost of implementation, since the need for other types of radiation sensors can be minimized or eliminated. For processing the RADFET's response we propose a readout system composed of analog signal conditioner (ASC) and a self-adaptive multiprocessing system-on-chip (MPSoC). The soft error rate of MPSoC is monitored in real time with embedded sensors, allowing the autonomous switching between three operating modes (high-performance, de-stress and fault-tolerant), according to the application requirements and radiation conditions