Acceleration of Seed Ordering and Selection For High Quality VLSI Delay Test

Seed ordering and selection is a key technique to provide high-test quality with limited resources in Built-In Self Test (BIST) environment. We present a hard-to-detect delay fault selection method to optimize the computation time in seed ordering and selection processes. This selection method can be used to select faults for test generation when it is impractical to target all delay faults resulting large test pattern count and long Computation time. Three types of selection categories are considered, ranged in the number of seeds it produced, which is useful when we consider computing resources, such as memory and storage. We also evaluate the impact of the selection method in mixed-mode BIST when seed are expanded to more patterns, and evaluate the statistical delay quality level (SDQL) with the original work. Experimental results show that our proposed method can significantly reduce computation time while slightly sacrificing test quality

Acceleration of Seed Ordering and Selection for High Quality Delay Test

Seed ordering and selection is a key technique to provide high-test quality with limited resources in Built-In Self Test (BIST) environment. We present a hard-to-detect delay fault selection method to accelerate the computation time in seed ordering and selection processes. This selection method can be used to restrict faults for test generation executed in an early stage in seed ordering and selection processes, and reduce a test pattern count and therefore a computation time. We evaluate the impact of the selection method both in deterministic BIST, where one test pattern is decoded from one seed, and mixed-mode BIST, where one seed is expanded to two or more patterns. The statistical delay quality level (SDQL) is adopted as test quality measure, to represent ability to detect small delay defects (SDDs). Experimental results show that our proposed method can significantly reduce computation time from 28% to 63% and base set seed counts from 21% to 67% while slightly sacrificing test quality

Optimizing Test Pattern Generation Using Top-Off ATPG Methodology for Stuck–AT, Transition and Small Delay Defect Faults

The ever increasing complexity and size of digital circuits complemented by Deep Sub Micron (DSM) technology trends today pose challenges to the efficient Design For Test (DFT) methodologies. Innovation is required not only in designing the digital circuits, but also in automatic test pattern generation (ATPG) to ensure that the pattern set screens all the targeted faults while still complying with the Automatic Test Equipment (ATE) memory constraints. DSM technology trends push the requirements of ATPG to not only include the conventional static defects but also to include test patterns for dynamic defects. The current industry practices consider test pattern generation for transition faults to screen dynamic defects. It has been observed that just screening for transition faults alone is not sufficient in light of the continuing DSM technology trends. Shrinking technology nodes have pushed DFT engineers to include Small Delay Defect (SDD) test patterns in the production flow. The current industry standard ATPG tools are evolving and SDD ATPG is not the most economical option in terms of both test generation CPU time and pattern volume. New techniques must be explored in order to ensure that a quality test pattern set can be generated which includes patterns for stuck-at, transition and SDD faults, all the while ensuring that the pattern volume remains economical. This thesis explores the use of a “Top-Off” ATPG methodology to generate an optimal test pattern set which can effectively screen the required fault models while containing the pattern volume within a reasonable limit

High Quality Delay Testing Scheme for a Self-Timed Microprocessor

RÉSUMÉ La popularité d’internet et la quantité toujours croissante de données qui transitent à travers ses terminaux nécessite d’importantes infrastructures de serveurs qui consomment énormément d’énergie. Par conséquent, et puisqu’une augmentation de la consommation d’énergie se traduit par une augmentation des coûts, la demande pour des processeurs efficaces en énergie est en forte hausse. Une manière d’augmenter l’efficacité énergétique des processeurs consiste à moduler la fréquence d’opération du système en fonction de la charge de travail. Les processeurs endochrones et asynchrones sont une des solutions mettant en œuvre ce principe de modulation de l’activité à la demande. Cependant, les méthodes de conception non conventionnelles qui leur sont associées, en particulier en termes de testabilité et d’automation, sont un frein au développement de ce type de systèmes. Ce travail s’intéresse au développement d’une méthode de test de haute qualité adressée aux pannes de retards dans une architecture de processeur endochrone spécifique, appelée AnARM. La méthode proposée consiste à détecter les pannes à faibles retards (PFR) dans l’AnARM en tirant profit des lignes à délais configurables intégrées. Ces pannes sont connues pour passer au travers des modèles de pannes de retards utilisés habituellement (les pannes de retards de portes). Ce travail s’intéresse principalement aux PFR qui échappent à la détection des pannes de retards de portes mais qui sont suffisamment longues pour provoquer des erreurs dans des conditions normales d’opération. D’autre part, la détection de pannes à très faibles retards est évitée, autant que possible, afin de limiter le nombre de faux positifs. Pour réaliser un test de haute qualité, ce travail propose, dans un premier temps, une métrique de test dédiée aux PFR, qui est mieux adaptée aux circuits endochrones, puis, dans un second temps, une méthode de test des pannes de retards basée sur la modulation de la vitesse des lignes à délais intégrés, qui s’adapte à un jeu de vecteurs de test préexistant.Ce travail présente une métrique de test ciblant les PFR, appelée pourcentage de marges pondérées (PoMP), ainsi qu’un nouveau modèle de test pour les PFR (appelé test de PFR idéal).----------ABSTRACT The popularity of the Internet and the huge amount of data that is transfered between devices nowadays requires very powerful servers that demand lots of power. Since higher power consumptions mean more expenses to companies, there is an increase in demand for power eÿcient processors. One of the ways to increase the power eÿciency of processors is to adapt the processing speeds and chip activity according the needed computation load. Self-timed or asynchronous processors are one of the solutions that apply this principle of activity on demand. However, their unconventional design methodology introduces several challenges in terms of testability and design automation. This work focuses on developing a high quality delay test for a specific architecture of self-timed processors called the AnARM. The proposed delay test focuses on catching e˙ective small-delay defects (SDDs) in the AnARM by taking advantage of built-in configurable delay lines. Those defects are known to escape one of the most commonly used delay fault models (the transition delay fault model). This work mainly focuses on e˙ective SDDs which can escape transition delay fault testing and are large enough to fail the circuit under normal operating conditions. At the same time, catching very small delay defects is avoided, when possible, to avoid falsely failing functional chips. To build the high quality delay test, this work develops an SDD test quality metric that is better suited for circuits with adaptable speeds. Then, it builds a delay test optimizer that adapts the built-in delay lines speeds to a preexisting at-speed pattern set to create a high quality SDD test. This work presents a novel SDD test quality metric called the weighted slack percentage (WeSPer), along with a new SDD testing model (named the ideal SDD test model). WeSPer is built to be a flexible metric capable of adapting to the availability of information about the circuit under test and the test environment. Since the AnARM can use multiple test speeds, WeSPer computation takes special care of assessing the effects of test frequency changes on the test quality. Specifically, special care is taken into avoiding overtesting the circuit. Overtesting will cause circuits under test to fail due to defects that are too small to affect the functionality of these circuits in their present state. A computation framework is built to compute WeSPer and compare it with other existing metrics in the literature over a large sets of process-voltage-temperature computation points. Simulations are done on a selected set of known benchmark circuits synthesized in the 28nm FD-SOI technology from STMicroelectronics

STROBE-X: X-ray Timing and Spectroscopy on Dynamical Timescales from Microseconds to Years

We present the Spectroscopic Time-Resolving Observatory for Broadband Energy X-rays (STROBE-X), a probe-class mission concept selected for study by NASA. It combines huge collecting area, high throughput, broad energy coverage, and excellent spectral and temporal resolution in a single facility. STROBE-X offers an enormous increase in sensitivity for X-ray spectral timing, extending these techniques to extragalactic targets for the first time. It is also an agile mission capable of rapid response to transient events, making it an essential X-ray partner facility in the era of time-domain, multi-wavelength, and multi-messenger astronomy. Optimized for study of the most extreme conditions found in the Universe, its key science objectives include: (1) Robustly measuring mass and spin and mapping inner accretion flows across the black hole mass spectrum, from compact stars to intermediate-mass objects to active galactic nuclei. (2) Mapping out the full mass-radius relation of neutron stars using an ensemble of nearly two dozen rotation-powered pulsars and accreting neutron stars, and hence measuring the equation of state for ultradense matter over a much wider range of densities than explored by NICER. (3) Identifying and studying X-ray counterparts (in the post-Swift era) for multiwavelength and multi-messenger transients in the dynamic sky through cross-correlation with gravitational wave interferometers, neutrino observatories, and high-cadence time-domain surveys in other electromagnetic bands. (4) Continuously surveying the dynamic X-ray sky with a large duty cycle and high time resolution to characterize the behavior of X-ray sources over an unprecedentedly vast range of time scales. STROBE-X's formidable capabilities will also enable a broad portfolio of additional science

Teachers’ knowledge and practice in screening for autism spectrum disorder in a mainstream primary school

Abstract: Supporting children as they learn at their own pace is important for their early childhood development, especially for learners with Neurodevelopmental Disorders like Autism Spectrum Disorder (ASD). ASD is a growing epidemic with a worldwide increase in prevalence of children with ASD in mainstream primary schools. Learners are being diagnosed with ASD in the later school-going years, causing further long-term complications. Early identification and intervention for learners with ASD is vital for their overall emotional, physical and cognitive development. It is therefore essential for teachers to understand ASD and to be able to screen for ASD, using the appropriate tools. This study aims to explore, and provide critical insight into, teachers’ knowledge and practice in appropriately screening for ASD in order to support learners with ASD in a mainstream primary school. The theoretical framework of this study was based on Bronfenbrenner’s Bioecological Systems Theory (1979) and Vygotsky’s Social Constructionist View on Disability (1978). The supporting theories, the Developmental Theory of Autism and Theory of Mind (1995), were incorporated due to their relevance in understanding learners with ASD. Using an interpretivist paradigm, this generic qualitative study used a purposive sample of seven Foundation Phase teachers in a mainstream primary school. These participants each used a Google Form to complete sentences for the researcher to gain insight into their general knowledge and understanding of ASD. Participants then took part in a focus group interview for the researcher to gain insight into what teachers do, and what tools and procedures teachers use to screen for ASD. Physical artefacts deemed relevant to this study were collected. Thematic analysis was used to interpret the themes that emerged from the analysis of data...M.A. (Educational Psychology

NASA SBIR abstracts of 1990 phase 1 projects

The research objectives of the 280 projects placed under contract in the National Aeronautics and Space Administration (NASA) 1990 Small Business Innovation Research (SBIR) Phase 1 program are described. The basic document consists of edited, non-proprietary abstracts of the winning proposals submitted by small businesses in response to NASA's 1990 SBIR Phase 1 Program Solicitation. The abstracts are presented under the 15 technical topics within which Phase 1 proposals were solicited. Each project was assigned a sequential identifying number from 001 to 280, in order of its appearance in the body of the report. The document also includes Appendixes to provide additional information about the SBIR program and permit cross-reference in the 1990 Phase 1 projects by company name, location by state, principal investigator, NASA field center responsible for management of each project, and NASA contract number

STROBE-X: X-ray Timing and Spectroscopy on Dynamical Timescales from Microseconds to Years

We present the Spectroscopic Time-Resolving Observatory for Broadband Energy X-rays (STROBE-X), a probe-class mission concept selected for study by NASA. It combines huge collecting area, high throughput, broad energy coverage, and excellent spectral and temporal resolution in a single facility. STROBE-X offers an enormous increase in sensitivity for X-ray spectral timing, extending these techniques to extragalactic targets for the first time. It is also an agile mission capable of rapid response to transient events, making it an essential X-ray partner facility in the era of time-domain, multi-wavelength, and multi-messenger astronomy. Optimized for study of the most extreme conditions found in the Universe, its key science objectives include: (1) Robustly measuring mass and spin and mapping inner accretion flows across the black hole mass spectrum, from compact stars to intermediate-mass objects to active galactic nuclei. (2) Mapping out the full mass-radius relation of neutron stars using an ensemble of nearly two dozen rotation-powered pulsars and accreting neutron stars, and hence measuring the equation of state for ultradense matter over a much wider range of densities than explored by NICER. (3) Identifying and studying X-ray counterparts (in the post-Swift era) for multiwavelength and multi-messenger transients in the dynamic sky through cross-correlation with gravitational wave interferometers, neutrino observatories, and high-cadence time-domain surveys in other electromagnetic bands. (4) Continuously surveying the dynamic X-ray sky with a large duty cycle and high time resolution to characterize the behavior of X-ray sources over an unprecedentedly vast range of time scales. STROBE-X's formidable capabilities will also enable a broad portfolio of additional science

Visual function in aging and age-related macular degeneration including subretinal drusenoid deposits

Age-related macular degeneration (AMD) is the leading cause of visual impairment in the developed world among people over 50 years of age. Although AMD is clinically characterised by the presence of drusen, subretinal drusenoid deposits (SDD) have also been recognized as a distinct morphological feature that confers increased risk of developing advanced AMD. To date, there has been a lack of validated biomarkers that can capture early changes in visual function that strongly correlate to the anatomical alterations which also include SDD phenotype. This thesis aimed to explore functional and structural markers to differentiate between healthy eyes (n=11) and intermediate AMD (iAMD) with SDD (n=11) and without SDD (n=17) and non-foveal atrophic AMD (n=11). Firstly, I assessed scotopic thresholds using a novel dark-adapted chromatic (DAC) perimeter, in healthy aging and in varying AMD disease. Individuals with SDD had depressed retinal sensitivity centrally, particularly inferiorly and nasally. Functionally, eyes with SDD were comparable to eyes with non-foveal atrophy, but structurally differed in outer nuclear layer (ONL) and total retinal volumes and thicknesses. Importantly, only rod-mediated tests were able to distinguish iAMD with and without SDD. Another aim of this thesis was to explore the efficacy of 670nm light on aging and AMD. Although an improvement in scotopic thresholds was observed in healthy aged eyes (n=4) compared to younger eyes (n=5), a pilot study conducted in 40 participants over the age 55 years (12 control, 28 with intermediate AMD) refuted any clinical benefit. In conclusion, this thesis supports the need to re-classify the AMD severity scale by incorporating eyes with SDD as a separate group. This phenotype should be sub-analysed in clinical trials evaluating potential prophylactic agents to delay the progression. Scotopic sensitivity offers diagnostic value, but rod intercept time offers both prognostic and diagnostic value as candidate biomarkers