Fault Tolerant Nanosatellite Computing on a Budget

In this contribution, we present a CubeSat-compatible on-board computer (OBC) architecture that offers strong fault tolerance to enable the use of such spacecraft in critical and long-term missions. We describe in detail the design of our OBC’s breadboard setup, and document its composition from the component-level, all the way down to the software level. Fault tolerance in this OBC is achieved without resorting to radiation hardening, just intelligent through software. The OBC ages graceful, and makes use of FPGA-reconfiguration and mixed criticality. It can dynamically adapt to changing performance requirements throughout a space mission. We developed a proof-of-concept with several Xilinx Ultrascale and Ultrascale+ FPGAs. With the smallest Kintex Ultrascale+ KU3P device, we achieve 1.94W total power consumption at 300Mhz, well within the power budget range of current 2U CubeSats. To our knowledge, this is the first scalable and COTS-based, widely reproducible OBC solution which can offer strong fault coverage even for small CubeSats. To reproduce this OBC architecture, no custom-written, proprietary, or protected IP is needed, and the needed design tools are available free-of-charge to academics. All COTS components required to construct this architecture can be purchased on the open market, and are affordable even for academic and scientific CubeSat developers

DFT Architecture with Power-Distribution-Network Consideration for Delay-based Power Gating Test

This paper shows that existing delay-based testing techniques for power gating exhibit both fault coverage and yield loss due to deviations at the charging delay introduced by the distributed nature of the power-distribution-networks (PDNs). To restore this test quality loss, which could reach up to 67.7% of false passes and 25% of false fails due to stuck-open faults, we propose a design-for-testability (DFT) logic that accounts for a distributed PDN. The proposed logic is optimized by an algorithm that also handles uncertainty due to process variations and offers trade-off flexibility between test-application time and area cost. A calibration process is proposed to bridge model-to-hardware discrepancies and increase test quality when considering systematic variations. Through SPICE simulations, we show complete recovery of the test quality lost due to PDNs. The proposed method is robust sustaining 80.3% to 98.6% of the achieved test quality under high random and systematic process variations. To the best of our knowledge, this paper presents the first analysis of the PDN impact on test quality and offers a unified test solution for both ring and grid power gating styles

Parallel Architectures for Planetary Exploration Requirements (PAPER)

The Parallel Architectures for Planetary Exploration Requirements (PAPER) project is essentially research oriented towards technology insertion issues for NASA's unmanned planetary probes. It was initiated to complement and augment the long-term efforts for space exploration with particular reference to NASA/LaRC's (NASA Langley Research Center) research needs for planetary exploration missions of the mid and late 1990s. The requirements for space missions as given in the somewhat dated Advanced Information Processing Systems (AIPS) requirements document are contrasted with the new requirements from JPL/Caltech involving sensor data capture and scene analysis. It is shown that more stringent requirements have arisen as a result of technological advancements. Two possible architectures, the AIPS Proof of Concept (POC) configuration and the MAX Fault-tolerant dataflow multiprocessor, were evaluated. The main observation was that the AIPS design is biased towards fault tolerance and may not be an ideal architecture for planetary and deep space probes due to high cost and complexity. The MAX concepts appears to be a promising candidate, except that more detailed information is required. The feasibility for adding neural computation capability to this architecture needs to be studied. Key impact issues for architectural design of computing systems meant for planetary missions were also identified

Implementation of verification methodologies

The increasing complexity of design elevates the importance of verification. This report explores different verification methodologies. The second chapter emphasizes the importance of testability and establishes the synthesis and DFT insertion flow using an SoC with ARM-Amber core as an example. Also, formal equivalence check is performed between the golden model, that is, RTL against its netlist. The third chapter delineates the design and formal verification of an Arbiter with APB slave configuration port. The design is extensively verified by writing SystemVerilog properties and we learn that the verification is only as good as the properties. Fourth chapter further explores formal verification with a different approach. The implemented x86 execution unit is formally verified by developing the its reference model and writing simple equality assertion checks. This approach exploits both, completeness of formal as well as includes the UVM reference model which reduces the long list of properties required for formal. The last chapter provides an approach to identify the critical registers in design. The critical flops in the design as a subset of all the registers which may have the most effect on the control flow of a module. This finds application in selecting the relevant auto-generated properties.Electrical and Computer Engineerin

Fault-tolerant vertical link design for effective 3D stacking

[EN] Recently, 3D stacking has been proposed to alleviate the memory bandwidth limitation arising in chip multiprocessors (CMPs). As the number of integrated cores in the chip increases the access to external memory becomes the bottleneck, thus demanding larger memory amounts inside the chip. The most accepted solution to implement vertical links between stacked dies is by using Through Silicon Vias (TSVs). However, TSVs are exposed to misalignment and random defects compromising the yield of the manufactured 3D chip. A common solution to this problem is by over-provisioning, thus impacting on area and cost. In this paper, we propose a fault-tolerant vertical link design. With its adoption, fault-tolerant vertical links can be implemented in a 3D chip design at low cost without the need of adding redundant TSVs (no over-provision). Preliminary results are very promising as the fault-tolerant vertical link design increases switch area only by 6.69% while the achieved interconnect yield tends to 100%.This work was supported by the Spanish MEC and MICINN, as well as European Comission FEDER funds, under Grants CSD2006-00046 and TIN2009-14475-C04. It was also partly supported by the project NaNoC (project label 248972) which is funded by the European Commission within the Research Programme FP7.Hernández Luz, C.; Roca Pérez, A.; Flich Cardo, J.; Silla Jiménez, F.; Duato Marín, JF. (2011). Fault-tolerant vertical link design for effective 3D stacking. IEEE Computer Architecture Letters. 10(2):41-44. https://doi.org/10.1109/L-CA.2011.17S414410

Quantum-dot Cellular Automata: Review Paper

Quantum-dot Cellular Automata (QCA) is one of the most important discoveries that will be the successful alternative for CMOS technology in the near future. An important feature of this technique, which has attracted the attention of many researchers, is that it is characterized by its low energy consumption, high speed and small size compared with CMOS.  Inverter and majority gate are the basic building blocks for QCA circuits where it can design the most logical circuit using these gates with help of QCA wire. Due to the lack of availability of review papers, this paper will be a destination for many people who are interested in the QCA field and to know how it works and why it had taken lots of attention recentl

A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors

With the continued success of the open RISC-V architecture, practical deployment of RISC-V processors necessitates an in-depth consideration of their testability, safety and security aspects. This survey provides an overview of recent developments in this quickly-evolving field. We start with discussing the application of state-of-the-art functional and system-level test solutions to RISC-V processors. Then, we discuss the use of RISC-V processors for safety-related applications; to this end, we outline the essential techniques necessary to obtain safety both in the functional and in the timing domain and review recent processor designs with safety features. Finally, we survey the different aspects of security with respect to RISC-V implementations and discuss the relationship between cryptographic protocols and primitives on the one hand and the RISC-V processor architecture and hardware implementation on the other. We also comment on the role of a RISC-V processor for system security and its resilience against side-channel attacks