A 16-b 10Msample/s Split-Interleaved Analog to Digital Converter

This work describes the integrated circuit design of a 16-bit, 10Msample/sec, combination ‘split’ interleaved analog to digital converter. Time interleaving of analog to digital converters has been used successfully for many years as a technique to achieve faster speeds using multiple identical converters. However, efforts to achieve higher resolutions with this technique have been difficult due to the precise matching required of the converter channels. The most troublesome errors in these types of converters are gain, offset and timing differences between channels. The ‘split ADC’ is a new concept that allows the use of a deterministic, digital, self calibrating algorithm. In this approach, an ADC is split into two paths, producing two output codes from the same input sample. The difference of these two codes is used as the calibration signal for an LMS error estimation algorithm that drives the difference error to zero. The ADC is calibrated when the codes are equal and the output is taken as the average of the two codes. The ‘split’ ADC concept and interleaved architecture are combined in this IC design to form the core of a high speed, high resolution, and self-calibrating ADC system. The dual outputs are used to drive a digital calibration engine to correct for the channel mismatch errors. This system has the speed benefits of interleaving while maintaining high resolution. The hardware for the algorithm as well as the ADC can be implemented in a standard 0.25um CMOS process, resulting in a relatively inexpensive solution. This work is supported by grants from Analog Devices Incorporated (ADI) and the National Science Foundation (NSF)

Design of a Cost-Efficient Reconfigurable Pipeline ADC

Power budget is very critical in the design of battery-powered implantable biomedical instruments. High speed, high resolution and low power usually cannot be achieved at the same time. Therefore, a tradeoff must be made to compromise every aspect of those features. As the main component of the bioinstrument, high conversion rate, high resolution ADC consumes most of the power. Fortunately, based on the operation modes of the bioinstrument, a reconfigurable ADC can be used to solve this problem. The reconfigurable ADC will operate at 10-bit 40 MSPS for the diagnosis mode and at 8-bit 2.5 MSPS for the monitor mode. The ADC will be completely turned off if no active signal comes from sensors or if an off command is received from the antenna. By turning off the sample hold stage and the first two stages of the pipeline ADC, a significant power saving is achieved. However, the reconfigurable ADC suffers from two drawbacks. First, the leakage signals through the extra off-state switches in the third stage degrade the performance of the data converter. This situation tends to be even worse for high speed and high-resolution applications. An interference elimination technique has been proposed in this work to solve this problem. Simulation results show a significant attenuation of the spurious tones. Moreover, the transistors in the OTA tend to operate in weak inversion region due to the scaling of the bias current. The transistor in subthreshold is very slow due to the small transit frequency. In order to get a better tradeoff between the transconductance efficiency and the transit frequency, reconfigurable OTAs and scalable bias technique are devised to adjust the operating point from weak inversion to moderate inversion. The figure of merit of the reconfigurable ADC is comparable to the previously published conventional pipeline ADCs. For the 10-bit, 40 MSPS mode, the ADC attains a 56.9 dB SNDR for 35.4 mW power consumption. For the 8-bit 2.5 MSPS mode, the ADC attains a 49.2 dB SNDR for 7.9 mW power consumption. The area for the core layout is 1.9 mm2 for a 0.35 micrometer process

Design of a low power switched-capacitor pipeline analog-to-digital converter

An Analog to Digital Converter (ADC) is a circuit which converts an analog signal into digital signal. Real world is analog, and the data processed by the computer or by other signal processing systems is digital. Therefore, the need for ADCs is obvious. In this thesis, several novel designs used to improve ADCs operation speed and reduce ADC power consumption are proposed. First, a high speed switched source follower (SSF) sample and hold amplifier without feedthrough penalty is implemented and simulated. The SSF sample and hold amplifier can achieve 6 Bit resolution with sampling rate at 10Gs/s. Second, a novel rail-to-rail time domain comparator used in successive approximation register ADC (SAR ADC) is implemented and simulated. The simulation results show that the proposed SAR ADC can only consume 1.3 muW with a 0.7 V power supply. Finally, a prototype pipeline ADC is implemented and fabricated in an IBM 90nm CMOS process. The proposed design is validated using measurement on a fabricated silicon IC, and the proposed 10-bit ADC achieves a peak signal-to-noise- and-distortion-ratio (SNDR) of 47 dB. This SNDR translates to a figure of merit (FOM) of 2.6N/conversion-step with a 1.2 V power supply

Error Compensation in Pipeline and Converters

This thesis provides an improved calibration and compensation scheme for pipeline Analog-to-Digital Converters (ADCs). This new scheme utilizes the intermediate stage outputs in a pipeline to characterize error mechanisms in the architecture. The goal of this compensation scheme is to increase the dynamic range of the ADC. The pipeline architecture is described in general, and tailored to the 1.5 bitslstage topology. Dominant error mechanisms are defined and characterized for an arbitrary stage in the pipeline. These error mechanisms are modeled with basis functions. The traditional calibration scheme is modified and used to iteratively calculate the error characteristics. The information from calibration is used to compensate the ADC. The calibration and compensation scheme is demonstrated both in simulation and using a custom hardware pipeline ADC. A 10-bit 5 MHz ADC was designed and fabricated in 0.5 pm CMOS to serve as the demonstration platform. The scheme was successful in showing improvements in dynamic range while using intermediate stage outputs to efficiently model errors in a pipeline stage. An application of the technique on the real converter showed an average of 8.6 dB improvement in SFDR in the full Nyquist band of the ADC. The average improvement in SINAD and ENOB are 3.2 dB and 0.53 bits respectively

K-Delta-1-Sigma Modulators for Wideband Analog-to-Digital Conversion

As CMOS technology scales, the transistor speed increases enabling higher speed communications and more complex systems. These benefits come at the cost of decreasing inherent device gain, increased transistor leakage currents, and additional mismatches due to process variations. All of these drawbacks affect the design of high-resolution analog-to-digital converters (ADCs) in nano-CMOS processes. To move towards an ADC topology useful in these small processes a first-order K-Delta-1-Sigma (KD1S) modulator-based ADC was proposed. The KD1S topology employs inherent time-interleaving with a shared integrator and K-quantizing feedback paths and can potentially achieve significantly higher conversion bandwidths when compared to the traditional switched-capacitor delta-sigma ADCs. The shared integrator in the KD1S modulator settles over a half the clock period and the op-amp is designed to operate at the base clock frequency. In this dissertation, the first-order KD1S modulator topology is analyzed for the effects of the non-idealities introduced by the K-path operation of the switched-capacitor integrator. Then, the concept of KD1S modulator is extended to higher-order modulators in order to achieve superior noise-shaping performance. A systematic synthesis method has been developed to design and simulate higher-order KD1S modulators at the system level. In order to demonstrate the developed theory, a prototype second-order KD1S modulator has been designed and fabricated in a 500-nm CMOS technology. The second-order KD1S modulator exhibits wideband noise-shaping with an SNDR of 42.7 dB or 6.81 bits in resolution for Kpath = 8 paths, an effective sampling rate of ƒs,new=800 MHz, effective oversampling ratio Kpath•OSR=64 and a signal bandwidth of 6.25 MHz. The second-order KD1S modulator consumes an average current of 3.0 mA from the 5 V supply and occupies an area of 0.55 mm2

Design Techniques for High Speed Low Voltage and Low Power Non-Calibrated Pipeline Analog to Digital Converters

The profound digitization of modern microelectronic modules made Analog-to- Digital converters (ADC) key components in many systems. With resolutions up to 14bits and sampling rates in the 100s of MHz, the pipeline ADC is a prime candidate for a wide range of applications such as instrumentation, communications and consumer electronics. However, while past work focused on enhancing the performance of the pipeline ADC from an architectural standpoint, little has been done to individually address its fundamental building blocks. This work aims to achieve the latter by proposing design techniques to improve the performance of these blocks with minimal power consumption in low voltage environments, such that collectively high performance is achieved in the pipeline ADC. Towards this goal, a Recycling Folded Cascode (RFC) amplifier is proposed as an enhancement to the general performance of the conventional folded cascode. Tested in Taiwan Semiconductor Manufacturing Company (TSMC) 0.18?m Complementary Metal Oxide Semiconductor (CMOS) technology, the RFC provides twice the bandwidth, 8-10dB additional gain, more than twice the slew rate and improved noise performance over the conventional folded cascode-all at no additional power or silicon area. The direct auto-zeroing offset cancellation scheme is optimized for low voltage environments using a dual level common mode feedback (CMFB) circuit, and amplifier differential offsets up to 50mV are effectively cancelled. Together with the RFC, the dual level CMFB was used to implement a sample and hold amplifier driving a singleended load of 1.4pF and using only 2.6mA; at 200MS/s better than 9bit linearity is achieved. Finally a power conscious technique is proposed to reduce the kickback noise of dynamic comparators without resorting to the use of pre-amplifiers. When all techniques are collectively used to implement a 1Vpp 10bit 160MS/s pipeline ADC in Semiconductor Manufacturing International Corporation (SMIC) 0.18[mu]m CMOS, 9.2 effective number of bits (ENOB) is achieved with a near Nyquist-rate full scale signal. The ADC uses an area of 1.1mm2 and consumes 42mW in its analog core. Compared to recent state-of-the-art implementations in the 100-200MS/s range, the presented pipeline ADC uses the least power per conversion rated at 0.45pJ/conversion-step

A Highly Digital VCO-Based ADC With Lookup-Table-Based Background Calibration

CMOS technology scaling has enabled dramatic improvement for digital circuits both in terms of speed and power efficiency. However, most traditional analog-to-digital converter (ADC) architectures are challenged by ever-decreasing supply voltage. The improvement in time resolution enabled by increased digital speeds drives design towards time-domain architectures such as voltage-controlled-oscillator (VCO) based ADCs. The main challenge in VCO-based ADC design is mitigating the nonlinearity of VCO Voltage-to-frequency (V-to-f) characteristics. Achieving signal-to-noise ratio (SNR) performance better than 40dB requires some form of calibration, which can be realized by analog or digital techniques, or some combination. This dissertation proposes a highly digital, reconfigurable VCO-based ADC with lookup-table (LUT) based background calibration based on split ADC architecture. Each of the two split channels, ADC A and B , contains two VCOs in a differential configuration. This helps alleviate even-order distortions as well as increase the dynamic range. A digital controller on chip can reconfigure the ADCs\u27 sampling rates and resolutions to adapt to various application scenarios. Different types of input signals can be used to train the ADC’s LUT parameters through the simple, anti-aliasing continuous-time input to achieve target resolution. The chip is fabricated in a 180 nm CMOS process, and the active area of analog and digital circuits is 0.09 and 0.16mm^2, respectively. Power consumption of the core ADC function is 25 mW. Measured results for this prototype design with 12-b resolution show ENOB improves from uncorrected 5-b to 11.5-b with calibration time within 200 ms (780K conversions at 5 MSps sample rate)

Nyquist-Rate Switched-Capacitor Analog-to-Digital Converters

The miniaturization and digitization of modern microelectronic systems have made Analog-to-Digital converters (ADC) key building components in many applications. Internet and entertainment technologies demand higher and higher performance from the hardware components in many communication and multimedia systems, but at the same time increased mobility demands less and less power consumption. Many applications, such as instrumentation, video, radar and communications, require very high accuracy and speed and with resolutions up to 16 bits and sampling rates in the 100s of MHz, pipelined ADCs are very suitable for such purposes. Resolutions above 10 bits often require very high power consumption and silicon area if no error correction technique is employed. Calibration relaxes the accuracy requirement of the individual building blocks of the ADC and enables power and area savings. Digital calibration is preferred over analog calibration due to higher robustness and accuracy. Furthermore, the microprocessors that process the digital information from the ADCs have constantly reduced cost and power consumption and improved performance due to technology scaling and innovative microprocessor architectures. The work in this dissertation presents a novel digital background calibration technique for high-speed, high-resolution pipelined ADCs. The technique is implemented in a 14 bit, 100 MS/s pipelined ADC fabricated in Taiwan Semiconductor Manufacturing Company (TSMC) 0.13µm Complementary Metal Oxide Semiconductor (CMOS) digital technology. The prototype ADC achieves better than 11.5 bits linearity at 100 MS/s and achieves a best-in-class figure of merit of 360 fJ/conversion-step. The core ADC has a power consumption of 105 mW and occupies an active area of 1.25 mm^2. The work in this dissertation also presents a low-power, 8-bit algorithmic ADC. This ADC reduces power consumption at system level by minimizing voltage reference generation and ADC input capacitance. This ADC is implemented in International Business Machines Corporation (IBM) 90nm digital CMOS technology and achieves around 7.5 bits linearity at 0.25 MS/s with a power consumption of 300 µW and an active area of 0.27 mm^2

MATLAB as a Design and Verification Tool for the Hardware Prototyping of Wireless Communication Systems

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