3,707 research outputs found

    Passive instrumentation and stimuli generation for Saturn IB equipment checkout. Volume I - Summary technical report Final technical report, 26 Jun. 1965 - 31 May 1966

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    Passive instrumentation and stimuli generation for Saturn IB equipment checkout - nondestructive testin

    Product assurance technology for custom LSI/VLSI electronics

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    The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

    Local Optical Probe of Motion and Stress in a multilayer graphene NEMS

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    Nanoelectromechanical systems (NEMSs) are emerging nanoscale elements at the crossroads between mechanics, optics and electronics, with significant potential for actuation and sensing applications. The reduction of dimensions compared to their micronic counterparts brings new effects including sensitivity to very low mass, resonant frequencies in the radiofrequency range, mechanical non-linearities and observation of quantum mechanical effects. An important issue of NEMS is the understanding of fundamental physical properties conditioning dissipation mechanisms, known to limit mechanical quality factors and to induce aging due to material degradation. There is a need for detection methods tailored for these systems which allow probing motion and stress at the nanometer scale. Here, we show a non-invasive local optical probe for the quantitative measurement of motion and stress within a multilayer graphene NEMS provided by a combination of Fizeau interferences, Raman spectroscopy and electrostatically actuated mirror. Interferometry provides a calibrated measurement of the motion, resulting from an actuation ranging from a quasi-static load up to the mechanical resonance while Raman spectroscopy allows a purely spectral detection of mechanical resonance at the nanoscale. Such spectroscopic detection reveals the coupling between a strained nano-resonator and the energy of an inelastically scattered photon, and thus offers a new approach for optomechanics

    Two decades of condition monitoring methods for power devices

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    Condition monitoring (CM) of power semiconductor devices enhances converter reliability and customer service. Many studies have investigated the semiconductor devices failure modes, the sensor technologies, and the signal processing techniques to optimize the CM. Furthermore, the improvement of power devices’ CM thanks to the use of the Internet of Things and artificial intelligence technologies is rising in smart grids, transportation electrification, and so on. These technologies will be widespread in the future, where more and more smart techniques and smart sensors will enable a better estimation of the state of the health (SOH) of the devices. Considering the increasing use of power converters, CM is essential as the analysis of the data obtained from multiple sensors enables the prediction of the SOH, which, in turn, enables to properly schedule the maintenance, i.e., accounting for the trade-off between the maintenance cost and the cost and issues due to the device failure. From this perspective, this review paper summarizes past developments and recent advances of the various methods with the aim of describing the current state-of-the-art in CM research

    A Novel Physical Unclonable Function (PUF) Featuring 0.113 FJ/B for IOT Devices

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    A physically unclonable function (PUF) is useful for authentication purposes and is a function created for its inherent uniqueness and inability of adversaries to duplicate it. In this thesis, a PUF is designed, which is a combination of both digital and analog circuits. This PUF could be designed partially based on a semi-automated approach using custom-built P-cells. The PUF is implemented using novel digital circuits, which have been designed using basic digital gates with a minimal number of transistors. The proposed PUF is developed by the introduction of a layer of multiplexers, which is triggered by a novel SR-latch based model for driving the selection lines. For a higher bit stability, the SR latch is combined with four-way asynchronous circuits, which are a class of coincident flip-flops. The resulted PUF consumes very little power and is suitable for sensors and low power applications. The proposed design was implemented in using the Cadence virtuoso IC 5.1.4 and based on the 180nm TSMC transistor models. The energy consumption and area of the proposed PUF is shown to be equal to 0.1132 fJ/bit and 8.03, which is considerably lower than the state of the arts. The uniqueness and reliability of the proposed PUF are estimated to be 48.66% and 99.33%
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