AUTSEG: Automatic Test Set Generator for Embedded Reactive Systems

Part 2: Tools and FrameworksInternational audienceOne of the biggest challenges in hardware and software design is to ensure that a system is error-free. Small errors in reactive embedded systems can have disastrous and costly consequences for a project. Preventing such errors by identifying the most probable cases of erratic system behavior is quite challenging. In this paper, we introduce an automatic test set generator called AUTSEG. Its input is a generic model of the target system, generated using the synchronous approach. Our tool finds the optimal preconditions for restricting the state space of the model. It only works locally on significant subspaces. Our approach exhibits a simpler and efficient quasi-flattening algorithm than existing techniques and a useful compiled form to check security properties and reduce the combinatorial explosion problem of state space. To illustrate our approach, AUTSEG was applied to the case of a transportation contactless card

A Low-Overhead Method for Pre-bond Test of Resonant 3-D Clock Distribution Networks

Designing a low power clock network in synchronous circuits is an important task. This requirement is stricter for 3-D circuits due to the increased power densities. Resonant clock networks are considered efficient low power alternatives to con- ventional clock distribution schemes. These networks utilize ad- ditional inductive circuits to reduce power while delivering a full swing clock signal to the sink nodes. Test is another complex task for 3-D ICs, where pre-bond test is a prerequisite. Contactless test has been considered as an alternative for conventional test methods. This paper, consequently, introduces a design method- ology for resonant 3-D clock networks that supports wireless pre- bond testing through the use of inductive links. By employing the inductors comprising the LC tanks of the resonant clock net- works as the receiver circuit for the links, the need for additional circuits and/or interconnect resources during pre-bond test is essentially eliminated. The proposed technique produces low power and pre-bond testable 3-D clock distribution networks. Simulation results indicate 98.5% and 99% decrease in the area overhead and power consumed by the contactless testing method as compared to existing methods

Programmable photonics : an opportunity for an accessible large-volume PIC ecosystem

We look at the opportunities presented by the new concepts of generic programmable photonic integrated circuits (PIC) to deploy photonics on a larger scale. Programmable PICs consist of waveguide meshes of tunable couplers and phase shifters that can be reconfigured in software to define diverse functions and arbitrary connectivity between the input and output ports. Off-the-shelf programmable PICs can dramatically shorten the development time and deployment costs of new photonic products, as they bypass the design-fabrication cycle of a custom PIC. These chips, which actually consist of an entire technology stack of photonics, electronics packaging and software, can potentially be manufactured cheaper and in larger volumes than application-specific PICs. We look into the technology requirements of these generic programmable PICs and discuss the economy of scale. Finally, we make a qualitative analysis of the possible application spaces where generic programmable PICs can play an enabling role, especially to companies who do not have an in-depth background in PIC technology