Doctor of Philosophy

dissertationThe design of integrated circuit (IC) requires an exhaustive verification and a thorough test mechanism to ensure the functionality and robustness of the circuit. This dissertation employs the theory of relative timing that has the advantage of enabling designers to create designs that have significant power and performance over traditional clocked designs. Research has been carried out to enable the relative timing approach to be supported by commercial electronic design automation (EDA) tools. This allows asynchronous and sequential designs to be designed using commercial cad tools. However, two very significant holes in the flow exist: the lack of support for timing verification and manufacturing test. Relative timing (RT) utilizes circuit delay to enforce and measure event sequencing on circuit design. Asynchronous circuits can optimize power-performance product by adjusting the circuit timing. A thorough analysis on the timing characteristic of each and every timing path is required to ensure the robustness and correctness of RT designs. All timing paths have to conform to the circuit timing constraints. This dissertation addresses back-end design robustness by validating full cyclical path timing verification with static timing analysis and implementing design for testability (DFT). Circuit reliability and correctness are necessary aspects for the technology to become commercially ready. In this study, scan-chain, a commercial DFT implementation, is applied to burst-mode RT designs. In addition, a novel testing approach is developed along with scan-chain to over achieve 90% fault coverage on two fault models: stuck-at fault model and delay fault model. This work evaluates the cost of DFT and its coverage trade-off then determines the best implementation. Designs such as a 64-point fast Fourier transform (FFT) design, an I2C design, and a mixed-signal design are built to demonstrate power, area, performance advantages of the relative timing methodology and are used as a platform for developing the backend robustness. Results are verified by performing post-silicon timing validation and test. This work strengthens overall relative timed circuit flow, reliability, and testability

Development of open verification ip for I2C controller

Before any IC is fabricated it is desired to check whether the required functionalities are preserved or not. Otherwise this may lead to a huge loss to the company in case of any failure in during the design/coding stage. Verification engineers have to make sure that before fabrication all the properties of the IC can be successfully implicated. So functional verification provides a lot of benefits to the IC designers. Today, testing and verification are alternatively used for the same thing. Testing of a large design using FPGA consumes longer compilation time in case of debugging and committing small mistakes. Simulation based testing is faster and also provides capability to check all the signals buried under the design. But due to the increasing complexity in design and the concurrency behavior of the design it has become very difficult to verify the functionality using traditional testbenches. So new languages called Hardware Verification Languages (HVL) are introduced. System Verilog is an IEEE standard Verification language. The library and package oriented feature provide an efficient way of writing testbenches. The Open Verification Methodology (OVM) Class Library provides the building blocks needed to quickly develop reusable and well-constructed verification components and test environments using SystemVerilog. In this paper we have developed testing environment using system Verilog implementation of OVM for I2C controller core. Our work introduces an automated stimulus generating testing environment for the design and checks the functionality of the I2C bus controller

Doctor of Philosophy

dissertationAsynchronous design has a very promising potential even though it has largely received a cold reception from industry. Part of this reluctance has been due to the necessity of custom design languages and computer aided design (CAD) flows to design, optimize, and validate asynchronous modules and systems. Next generation asynchronous flows should support modern programming languages (e.g., Verilog) and application specific integrated circuits (ASIC) CAD tools. They also have to support multifrequency designs with mixed synchronous (clocked) and asynchronous (unclocked) designs. This work presents a novel relative timing (RT) based methodology for generating multifrequency designs using synchronous CAD tools and flows. Synchronous CAD tools must be constrained for them to work with asynchronous circuits. Identification of these constraints and characterization flow to automatically derive the constraints is presented. The effect of the constraints on the designs and the way they are handled by the synchronous CAD tools are analyzed and reported in this work. The automation of the generation of asynchronous design templates and also the constraint generation is an important problem. Algorithms for automation of reset addition to asynchronous circuits and power and/or performance optimizations applied to the circuits using logical effort are explored thus filling an important hole in the automation flow. Constraints representing cyclic asynchronous circuits as directed acyclic graphs (DAGs) to the CAD tools is necessary for applying synchronous CAD optimizations like sizing, path delay optimizations and also using static timing analysis (STA) on these circuits. A thorough investigation for the requirements of cycle cutting while preserving timing paths is presented with an algorithm to automate the process of generating them. A large set of designs for 4 phase handshake protocol circuit implementations with early and late data validity are characterized for area, power and performance. Benchmark circuits with automated scripts to generate various configurations for better understanding of the designs are proposed and analyzed. Extension to the methodology like addition of scan insertion using automatic test pattern generation (ATPG) tools to add testability of datapath in bundled data asynchronous circuit implementations and timing closure approaches are also described. Energy, area, and performance of purely asynchronous circuits and circuits with mixed synchronous and asynchronous blocks are explored. Results indicate the benefits that can be derived by generating circuits with asynchronous components using this methodology

Scheduling and Fluid Routing for Flow-Based Microfluidic Laboratories-on-a-Chip

Microfluidic laboratories-on-a-chip (LoCs) are replacing the conventional biochemical analyzers and are able to integrate the necessary functions for biochemical analysis on-chip. There are several types of LoCs, each having its advantages and limitations. In this paper we are interested in flow-based LoCs, in which a continuous flow of liquid is manipulated using integrated microvalves. By combining several microvalves, more complex units, such as micropumps, switches, mixers, and multiplexers, can be built. We consider that the architecture of the LoC is given, and we are interested in synthesizing an implementation, consisting of the binding of operations in the application to the functional units of the architecture, the scheduling of operations and the routing and scheduling of the fluid flows, such that the application completion time is minimized. To solve this problem, we propose a list scheduling-based application mapping (LSAM) framework and evaluate it by using real-life as well as synthetic benchmarks. When biochemical applications contain fluids that may adsorb on the substrate on which they are transported, the solution is to use rinsing operations for contamination avoidance. Hence, we also propose a rinsing heuristic, which has been integrated in the LSAM framework

Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform