Periodic Application of Concurrent Error Detection in Processor Array Architectures

Processor arrays can provide an attractive architecture for some applications. Featuring modularity, regular interconnection and high parallelism, such arrays are well-suited for VLSI/WSI implementations, and applications with high computational requirements, such as real-time signal processing. Preserving the integrity of results can be of paramount importance for certain applications. In these cases, fault tolerance should be used to ensure reliable delivery of a system's service. One aspect of fault tolerance is the detection of errors caused by faults. Concurrent error detection (CED) techniques offer the advantage that transient and intermittent faults may be detected with greater probability than with off-line diagnostic tests. Applying time-redundant CED techniques can reduce hardware redundancy costs. However, most time-redundant CED techniques degrade a system's performance

Affordable techniques for dependable microprocessor design

As high computing power is available at an affordable cost, we rely on microprocessor-based systems for much greater variety of applications. This dependence indicates that a processor failure could have more diverse impacts on our daily lives. Therefore, dependability is becoming an increasingly important quality measure of microprocessors.;Temporary hardware malfunctions caused by unstable environmental conditions can lead the processor to an incorrect state. This is referred to as a transient error or soft error. Studies have shown that soft errors are the major source of system failures. This dissertation characterizes the soft error behavior on microprocessors and presents new microarchitectural approaches that can realize high dependability with low overhead.;Our fault injection studies using RISC processors have demonstrated that different functional blocks of the processor have distinct susceptibilities to soft errors. The error susceptibility information must be reflected in devising fault tolerance schemes for cost-sensitive applications. Considering the common use of on-chip caches in modern processors, we investigated area-efficient protection schemes for memory arrays. The idea of caching redundant information was exploited to optimize resource utilization for increased dependability. We also developed a mechanism to verify the integrity of data transfer from lower level memories to the primary caches. The results of this study show that by exploiting bus idle cycles and the information redundancy, an almost complete check for the initial memory data transfer is possible without incurring a performance penalty.;For protecting the processor\u27s control logic, which usually remains unprotected, we propose a low-cost reliability enhancement strategy. We classified control logic signals into static and dynamic control depending on their changeability, and applied various techniques including commit-time checking, signature caching, component-level duplication, and control flow monitoring. Our schemes can achieve more than 99% coverage with a very small hardware addition. Finally, a virtual duplex architecture for superscalar processors is presented. In this system-level approach, the processor pipeline is backed up by a partially replicated pipeline. The replication-based checker minimizes the design and verification overheads. For a large-scale superscalar processor, the proposed architecture can bring 61.4% reduction in die area while sustaining the maximum performance

Compiler-Assisted Multiple Instruction Rollback Recovery Using a Read Buffer

Multiple instruction rollback (MIR) is a technique to provide rapid recovery from transient processor failures and was implemented in hardware by researchers and slow in mainframe computers. Hardware-based MIR designs eliminate rollback data hazards by providing data redundancy implemented in hardware. Compiler-based MIR designs were also developed which remove rollback data hazards directly with data flow manipulations, thus eliminating the need for most data redundancy hardware. Compiler-assisted techniques to achieve multiple instruction rollback recovery are addressed. It is observed that data some hazards resulting from instruction rollback can be resolved more efficiently by providing hardware redundancy while others are resolved more efficiently with compiler transformations. A compiler-assisted multiple instruction rollback scheme is developed which combines hardware-implemented data redundancy with compiler-driven hazard removal transformations. Experimental performance evaluations were conducted which indicate improved efficiency over previous hardware-based and compiler-based schemes. Various enhancements to the compiler transformations and to the data redundancy hardware developed for the compiler-assisted MIR scheme are described and evaluated. The final topic deals with the application of compiler-assisted MIR techniques to aid in exception repair and branch repair in a speculative execution architecture

Fault-tolerant computation using algebraic homomorphisms

Also issued as Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1992.Includes bibliographical references (p. 193-196).Supported by the Defense Advanced Research Projects Agency, monitored by the U.S. Navy Office of Naval Research. N00014-89-J-1489 Supported by the Charles S. Draper Laboratories. DL-H-418472Paul E. Beckmann

Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours

A Comprehensive Fault Model for Concurrent Error Detection in MOS Circuits

Naval Electronics Sys. Comm. and Office of Naval Research / N00039-80-C-0556Ope