Analog and Mixed Signal Verification

More and more electronic systems have components that are not purely digital. Verification of such systems is a much less developed discipline than the digital equivalents and the application of formal (mathematically complete) techniques is a nascent area. In this paper, we will discuss the nature of analog circuit design and describe the way verification is done in practice today. We will describe some “formal” approaches coming from the analog design community. We will describe some of the approaches to formal verification that have been presented in recent literature. Finally, we will mention some areas where there are opportunities for future work

A new nonlinear time-domain op-amp macromodel using threshold functions and digitally controlled network elements

A general-purpose nonlinear macromodel for the time-domain simulation of integrated circuit operational amplifiers (op amps), either bipolar or MOS, is presented. Three main differences exist between the macromodel and those previously reported in the literature for the time domain. First, all the op-amp nonlinearities are simulated using threshold elements and digital components, thus making them well suited for a mixed electrical/logical simulator. Secondly, the macromodel exhibits a superior performance in those cases where the op amp is driven by a large signal. Finally, the macromodel is advantageous in terms of CPU time. Several examples are included illustrating all of these advantages. The main application of this macromodel is for the accurate simulation of the analog part of a combined analog/digital integrated circui

A design for testability study on a high performance automatic gain control circuit.

A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente

Genuine lab experiences for students in resource constrained environments: The RealLab with integrated intelligent assessment.

Laboratory activities are indispensable for developing engineering skills. Computer Aided Learning (CAL) tools can be used to enhance laboratory learning in various ways, the latest approach being the virtual laboratory technique that emulates traditional laboratory processes. This new approach makes it possible to give students complete and genuine laboratory experiences in situations constrained by limited resources in the provision of laboratory facilities and infrastructure and/or where there is need for laboratory education, for large classes, with only one laboratory stand. This may especially be the case in countries in transition. Most existing virtual laboratories are not available for purchase. Where they are, they may not be cost friendly for resource constrained environments. Also, most do not integrate any form of assessment structure. In this paper, we present a very cost friendly virtual laboratory solution for genuine laboratory experiences in resource constrained environments, with integrated intelligent assessment

A Multiproject Chip Approach to the Teaching of Analog MOS LSI and VLSI

Multiproject chip implementation has been used in teaching analog MOS circuit design. After having worked with computer simulation and layout aids in homework problems, students designed novel circuits including several high performance op amps, an A/D converter, a switched capacitor filter, a 1 K dynamic RAM, and a variety of less conventional MOS circuits such as a VII converter, an AC/DC converter, an AM radio receiver, a digitally-controlled analog signal processor, and on-chip circuitry for measuring transistor capacitances. These circuits were laid out as part of an NMOS multiproject chip. Several of the designs exhibit a considerable degree of innovation; fabrication pending, computer simulation shows that some may be pushing the state of the art. Several designs are of interest to digital designers; in fact, the course has provided knowledge and technique needed for detailed digital circuit design at the gate level

E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods

During post-silicon validation, manufactured integrated circuits are extensively tested in actual system environments to detect design bugs. Bug localization involves identification of a bug trace (a sequence of inputs that activates and detects the bug) and a hardware design block where the bug is located. Existing bug localization practices during post-silicon validation are mostly manual and ad hoc, and, hence, extremely expensive and time consuming. This is particularly true for subtle electrical bugs caused by unexpected interactions between a design and its electrical state. We present E-QED, a new approach that automatically localizes electrical bugs during post-silicon validation. Our results on the OpenSPARC T2, an open-source 500-million-transistor multicore chip design, demonstrate the effectiveness and practicality of E-QED: starting with a failed post-silicon test, in a few hours (9 hours on average) we can automatically narrow the location of the bug to (the fan-in logic cone of) a handful of candidate flip-flops (18 flip-flops on average for a design with ~ 1 Million flip-flops) and also obtain the corresponding bug trace. The area impact of E-QED is ~2.5%. In contrast, deter-mining this same information might take weeks (or even months) of mostly manual work using traditional approaches

Tensor Computation: A New Framework for High-Dimensional Problems in EDA

Many critical EDA problems suffer from the curse of dimensionality, i.e. the very fast-scaling computational burden produced by large number of parameters and/or unknown variables. This phenomenon may be caused by multiple spatial or temporal factors (e.g. 3-D field solvers discretizations and multi-rate circuit simulation), nonlinearity of devices and circuits, large number of design or optimization parameters (e.g. full-chip routing/placement and circuit sizing), or extensive process variations (e.g. variability/reliability analysis and design for manufacturability). The computational challenges generated by such high dimensional problems are generally hard to handle efficiently with traditional EDA core algorithms that are based on matrix and vector computation. This paper presents "tensor computation" as an alternative general framework for the development of efficient EDA algorithms and tools. A tensor is a high-dimensional generalization of a matrix and a vector, and is a natural choice for both storing and solving efficiently high-dimensional EDA problems. This paper gives a basic tutorial on tensors, demonstrates some recent examples of EDA applications (e.g., nonlinear circuit modeling and high-dimensional uncertainty quantification), and suggests further open EDA problems where the use of tensor computation could be of advantage.Comment: 14 figures. Accepted by IEEE Trans. CAD of Integrated Circuits and System

Stability, Causality, and Passivity in Electrical Interconnect Models

Modern packaging design requires extensive signal integrity simulations in order to assess the electrical performance of the system. The feasibility of such simulations is granted only when accurate and efficient models are available for all system parts and components having a significant influence on the signals. Unfortunately, model derivation is still a challenging task, despite the extensive research that has been devoted to this topic. In fact, it is a common experience that modeling or simulation tasks sometimes fail, often without a clear understanding of the main reason. This paper presents the fundamental properties of causality, stability, and passivity that electrical interconnect models must satisfy in order to be physically consistent. All basic definitions are reviewed in time domain, Laplace domain, and frequency domain, and all significant interrelations between these properties are outlined. This background material is used to interpret several common situations where either model derivation or model use in a computer-aided design environment fails dramatically.We show that the root cause for these difficulties can always be traced back to the lack of stability, causality, or passivity in the data providing the structure characterization and/or in the model itsel

Individual flip-flops with gated clocks for low power datapaths

Energy consumption has become one of the important factors in digital systems, because of the requirement to dissipate this energy in high-density circuits and to extend the battery life in portable systems such as devices with wireless communication capabilities. Flip-flops are one of the most energy-consuming components of digital circuits. This paper presents techniques to reduce energy consumption by individually deactivating the clock when flip-flops do not have to change their value. Flip-flop structures are proposed and selection criteria given to obtain minimum energy consumption. The structures have been evaluated using energy models and validated by switch-level simulations. For the applications considered, significant energy reductions are achieved.Peer ReviewedPostprint (published version