Temperature-dependent Characterization of Power Amplifiers Using an Efficient Electrothermal Analysis Technique

In this paper, we propose an efficient methodology for the electrothermal characterization of power amplifier (PA) integrated circuits. The proposed electrothermal analysis method predicts the effect of temperature variations on the key performances of PAs, such as gain and linearity, under realistic dynamic operating conditions. A comprehensive technique for identifying an equivalent compact thermal model, using data from 3-D finite element method thermal simulation and nonlinear curve fitting algorithms, is described. Two efficient methods for electrothermal analysis applying the developed compact thermal model are reported. The validity of the methods is evaluated using commercially available electrothermal computer-aided design (CAD) tools and through extensive pulsed RF signal measurements of a PA device under test. The measurement results confirm the validity of the proposed electrothermal analysis methods. The proposed methods show significantly faster simulation speed comparing to available CAD tools for electrothermal analysis. Moreover, the results reveal the importance of electrothermal characterization in the prediction of the temperature-aware PA dynamic operation

Decoupled Thermal Simulation

Small transistors and high clock frequency have resulted in high power density, which makes temperature a strong constraint in today's microprocessor design. For maximizing performance, the thermal design power must be set according to average, instead of worst case, conditions. Consequently, current processors feature temperature sensors and throt-tling mechanisms to keep the chip temperature at a safe level. To study future thermally-constrained processors and systems, researchers and engineers use cycle-accurate performance simulators modeling power consumption and temperature. Cycle-accurate simulators are relatively slow and make it difficult to study long-term thermal behaviors that may require to simulate several minutes or even hours of processor execution. Sampling or phase analysis cannot be applied directly in this case because temperature depends on all past energy events. We propose a partial solution to this problem, which consists in decoupling cycle-accurate simulations and thermal ones. Temperature-unaware cycle-accurate simulation is used to generate an energy trace representing the complete execution of an application. Phase analysis can be used to decrease the trace generation time and make compact traces. Temperature and thermal-throttling are simulated in a separate thermal simulator that reads energy traces. The thermal simulator is faster than the cycle-accurate one and can be used to explore, with the same energy trace, parameters that are not modeled in cycle-accurate simulation