Single-Event Upset Analysis and Protection in High Speed Circuits

The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at the input of a flip-flop and consequently is latched in the flip-flop and generates a soft-error. When an SET conjoined with a transition at a node along a critical path of the combinational part of a design, a transient delay fault may occur at the input of a flip-flop. On the other hand, increasing pipeline depth and using low power techniques such as multi-level power supply, and multi-threshold transistor convert almost all paths in a circuit to critical ones. Thus, studying the behavior of the SET in these kinds of circuits needs special attention. This paper studies the dynamic behavior of a circuit with massive critical paths in the presence of an SET. We also propose a novel flip-flop architecture to mitigate the effects of such SETs in combinational circuits. Furthermore, the proposed architecture can tolerant a single event upset (SEU) caused by particle strike on the internal nodes of a flip-flo

Automated Synthesis of SEU Tolerant Architectures from OO Descriptions

SEU faults are a well-known problem in aerospace environment but recently their relevance grew up also at ground level in commodity applications coupled, in this frame, with strong economic constraints in terms of costs reduction. On the other hand, latest hardware description languages and synthesis tools allow reducing the boundary between software and hardware domains making the high-level descriptions of hardware components very similar to software programs. Moving from these considerations, the present paper analyses the possibility of reusing Software Implemented Hardware Fault Tolerance (SIHFT) techniques, typically exploited in micro-processor based systems, to design SEU tolerant architectures. The main characteristics of SIHFT techniques have been examined as well as how they have to be modified to be compatible with the synthesis flow. A complete environment is provided to automate the design instrumentation using the proposed techniques, and to perform fault injection experiments both at behavioural and gate level. Preliminary results presented in this paper show the effectiveness of the approach in terms of reliability improvement and reduced design effort

Cross-layer Soft Error Analysis and Mitigation at Nanoscale Technologies

This thesis addresses the challenge of soft error modeling and mitigation in nansoscale technology nodes and pushes the state-of-the-art forward by proposing novel modeling, analyze and mitigation techniques. The proposed soft error sensitivity analysis platform accurately models both error generation and propagation starting from a technology dependent device level simulations all the way to workload dependent application level analysis

Synthesis for circuit reliability

textElectrical and Computer Engineerin

ASSESSING AND IMPROVING THE RELIABILITY AND SECURITY OF CIRCUITS AFFECTED BY NATURAL AND INTENTIONAL FAULTS

The reliability and security vulnerability of modern electronic systems have emerged as concerns due to the increasing natural and intentional interferences. Radiation of high-energy charged particles generated from space environment or packaging materials on the substrate of integrated circuits results in natural faults. As the technology scales down, factors such as critical charge, voltage supply, and frequency change tremendously that increase the sensitivity of integrated circuits to natural faults even for systems operating at sea level. An attacker is able to simulate the impact of natural faults and compromise the circuit or cause denial of service. Therefore, instead of utilizing different approaches to counteract the effect of natural and intentional faults, a unified countermeasure is introduced. The unified countermeasure thwarts the impact of both reliability and security threats without paying the price of more area overhead, power consumption, and required time. This thesis first proposes a systematic analysis method to assess the probability of natural faults propagating the circuit and eventually being latched. The second part of this work focuses on the methods to thwart the impact of intentional faults in cryptosystems. We exploit a power-based side-channel analysis method to analyze the effect of the existing fault detection methods for natural faults on fault attack. Countermeasures for different security threats on cryptosystems are investigated separately. Furthermore, a new micro-architecture is proposed to thwart the combination of fault attacks and side-channel attacks, reducing the fault bypass rate and slowing down the key retrieval speed. The third contribution of this thesis is a unified countermeasure to thwart the impact of both natural faults and attacks. The unified countermeasure utilizes dynamically alternated multiple generator polynomials for the cyclic redundancy check (CRC) codec to resist the reverse engineering attack