Timing models for high-level synthesis

In this paper, we describe a timing model for clock estimation during high-level synthesis. In order to obtain realistic timing estimates, the proposed model considers all delay elements, including datapath, control and wire delays, and several technology factors, such as layout architecture, technology mapping, buffers insertion and loading effects. The experimental results show that this model can provide much better estimates than previous models. This model is well suited for automatic and interactive synthesis as well as feedback-driven synthesis where performance matrices must be rapidly and incrementally calculated

Redundant Logic Insertion and Fault Tolerance Improvement in Combinational Circuits

This paper presents a novel method to identify and insert redundant logic into a combinational circuit to improve its fault tolerance without having to replicate the entire circuit as is the case with conventional redundancy techniques. In this context, it is discussed how to estimate the fault masking capability of a combinational circuit using the truth-cum-fault enumeration table, and then it is shown how to identify the logic that can introduced to add redundancy into the original circuit without affecting its native functionality and with the aim of improving its fault tolerance though this would involve some trade-off in the design metrics. However, care should be taken while introducing redundant logic since redundant logic insertion may give rise to new internal nodes and faults on those may impact the fault tolerance of the resulting circuit. The combinational circuit that is considered and its redundant counterparts are all implemented in semi-custom design style using a 32/28nm CMOS digital cell library and their respective design metrics and fault tolerances are compared

Evolving more efficient digital circuits by allowing circuit layout evolution and multi-objective fitness

We use evolutionary search to design combinational logic circuits. The technique is based on evolving the functionality and connectivity of a rectangular array of logic cells whose dimension is defined by the circuit layout. The main idea of this approach is to improve quality of the circuits evolved by the GA by reducing the number of active gates used. We accomplish this by combining two ideas: 1) using multi-objective fitness function; 2) evolving circuit layout. It will be shown that using these two approaches allows us to increase the quality of evolved circuits. The circuits are evolved in two phases. Initially the genome fitness in given by the percentage of output bits that are correct. Once 100% functional circuits have been evolved, the number of gates actually used in the circuit is taken into account in the fitness function. This allows us to evolve circuits with 100% functionality and minimise the number of active gates in circuit structure. The population is initialised with heterogeneous circuit layouts and the circuit layout is allowed to vary during the evolutionary process. Evolving the circuit layout together with the function is one of the distinctive features of proposed approach. The experimental results show that allowing the circuit layout to be flexible is useful when we want to evolve circuits with the smallest number of gates used. We find that it is better to use a fixed circuit layout when the objective is to achieve the highest number of 100% functional circuits. The two-fitness strategy is most effective when we allow a large number of generations

OPTIMAL AREA AND PERFORMANCE MAPPING OF K-LUT BASED FPGAS

FPGA circuits are increasingly used in many fields: for rapid prototyping of new products (including fast ASIC implementation), for logic emulation, for producing a small number of a device, or if a device should be reconfigurable in use (reconfigurable computing). Determining if an arbitrary, given wide, function can be implemented by a programmable logic block, unfortunately, it is generally, a very difficult problem. This problem is called the Boolean matching problem. This paper introduces a new implemented algorithm able to map, both for area and performance, combinational networks using k-LUT based FPGAs.k-LUT based FPGAs, combinational circuits, performance-driven mapping.

EffiTest: Efficient Delay Test and Statistical Prediction for Configuring Post-silicon Tunable Buffers

At nanometer manufacturing technology nodes, process variations significantly affect circuit performance. To combat them, post- silicon clock tuning buffers can be deployed to balance timing bud- gets of critical paths for each individual chip after manufacturing. The challenge of this method is that path delays should be mea- sured for each chip to configure the tuning buffers properly. Current methods for this delay measurement rely on path-wise frequency stepping. This strategy, however, requires too much time from ex- pensive testers. In this paper, we propose an efficient delay test framework (EffiTest) to solve the post-silicon testing problem by aligning path delays using the already-existing tuning buffers in the circuit. In addition, we only test representative paths and the delays of other paths are estimated by statistical delay prediction. Exper- imental results demonstrate that the proposed method can reduce the number of frequency stepping iterations by more than 94% with only a slight yield loss.Comment: ACM/IEEE Design Automation Conference (DAC), June 201

On Timing Model Extraction and Hierarchical Statistical Timing Analysis

In this paper, we investigate the challenges to apply Statistical Static Timing Analysis (SSTA) in hierarchical design flow, where modules supplied by IP vendors are used to hide design details for IP protection and to reduce the complexity of design and verification. For the three basic circuit types, combinational, flip-flop-based and latch-controlled, we propose methods to extract timing models which contain interfacing as well as compressed internal constraints. Using these compact timing models the runtime of full-chip timing analysis can be reduced, while circuit details from IP vendors are not exposed. We also propose a method to reconstruct the correlation between modules during full-chip timing analysis. This correlation can not be incorporated into timing models because it depends on the layout of the corresponding modules in the chip. In addition, we investigate how to apply the extracted timing models with the reconstructed correlation to evaluate the performance of the complete design. Experiments demonstrate that using the extracted timing models and reconstructed correlation full-chip timing analysis can be several times faster than applying the flattened circuit directly, while the accuracy of statistical timing analysis is still well maintained