Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure

In this paper, we present a novel coarse-grained technique for monitoring online the bias temperature instability (BTI) aging of circuits by exploiting their power gating infrastructure. The proposed technique relies on monitoring the discharge time of the virtual-power-network during standby operations, the value of which depends on the threshold voltage of the CMOS devices in a power-gated design (PGD). It does not require any distributed sensors, because the virtual-power-network is already distributed in a PGD. It consists of a hardware block for measuring the discharge time concurrently with normal standby operations and a processing block for estimating the BTI aging status of the PGD according to collected measurements. Through SPICE simulation, we demonstrate that the BTI aging estimation error of the proposed technique is less than 1% and 6.2% for PGDs with static operating frequency and dynamic voltage and frequency scaling, respectively. Its area cost is also found negligible. The power gating minimum idle time (MIT) cost induced by the energy consumed for monitoring the discharge time is evaluated on two scalar machine models using either x86 or ARM instruction sets. It is found less than 1.3× and 1.45× the original power gating MIT, respectively. We validate the proposed technique through accelerated aging experiments conducted with five actual chips that contain an ARM cortex M0 processor, manufactured with a 65 nm CMOS technology

Leveraging CMOS Aging for Efficient Microelectronics Design

Aging is known to impact electronic systems affecting performance and reliability. However, it has been shown that it also brings benefits for power saving and area optimization. This paper presents highlights of those benefits and further shows how aging effects can be leveraged by novel methods to contribute towards improving hardware oriented security and reliability of electronic circuits. We have demonstrated static power reduction in complex circuits from IWLS05 benchmark suite, reaching a noticeable 7S% of reduction in ten years of operation. In hardware oriented security, a novel aging sensor has been proposed for detection of recycled ICs, measuring discharge time Tdv of the virtual power (VV dd ) network in power-gated designs. This sensor utilizes discharge time of VV dd network through leakage current that is much more sensitive to aging than path delay, exhibiting up to 15.7X increment in 10 years. Furthermore, we show how frequency degradation caused by aging is used for online prediction of remaining useful lifetime (RUL) of electronic circuits. Results show an average RUL prediction deviation of less than 0.1 years. This methodology provides node calculations rather than a mean time to failure (MTTF) of the population. The set of techniques that are presented in this paper takes advantage of aging effects, having a positive impact in various aspects of microelectronic systems

Hardware / Software Architectural and Technological Exploration for Energy-Efficient and Reliable Biomedical Devices

Nowadays, the ubiquity of smart appliances in our everyday lives is increasingly strengthening the links between humans and machines. Beyond making our lives easier and more convenient, smart devices are now playing an important role in personalized healthcare delivery. This technological breakthrough is particularly relevant in a world where population aging and unhealthy habits have made non-communicable diseases the first leading cause of death worldwide according to international public health organizations. In this context, smart health monitoring systems termed Wireless Body Sensor Nodes (WBSNs), represent a paradigm shift in the healthcare landscape by greatly lowering the cost of long-term monitoring of chronic diseases, as well as improving patients' lifestyles. WBSNs are able to autonomously acquire biological signals and embed on-node Digital Signal Processing (DSP) capabilities to deliver clinically-accurate health diagnoses in real-time, even outside of a hospital environment. Energy efficiency and reliability are fundamental requirements for WBSNs, since they must operate for extended periods of time, while relying on compact batteries. These constraints, in turn, impose carefully designed hardware and software architectures for hosting the execution of complex biomedical applications. In this thesis, I develop and explore novel solutions at the architectural and technological level of the integrated circuit design domain, to enhance the energy efficiency and reliability of current WBSNs. Firstly, following a top-down approach driven by the characteristics of biomedical algorithms, I perform an architectural exploration of a heterogeneous and reconfigurable computing platform devoted to bio-signal analysis. By interfacing a shared Coarse-Grained Reconfigurable Array (CGRA) accelerator, this domain-specific platform can achieve higher performance and energy savings, beyond the capabilities offered by a baseline multi-processor system. More precisely, I propose three CGRA architectures, each contributing differently to the maximization of the application parallelization. The proposed Single, Multi and Interleaved-Datapath CGRA designs allow the developed platform to achieve substantial energy savings of up to 37%, when executing complex biomedical applications, with respect to a multi-core-only platform. Secondly, I investigate how the modeling of technology reliability issues in logic and memory components can be exploited to adequately adjust the frequency and supply voltage of a circuit, with the aim of optimizing its computing performance and energy efficiency. To this end, I propose a novel framework for workload-dependent Bias Temperature Instability (BTI) impact analysis on biomedical application results quality. Remarkably, the framework is able to determine the range of safe circuit operating frequencies without introducing worst-case guard bands. Experiments highlight the possibility to safely raise the frequency up to 101% above the maximum obtained with the classical static timing analysis. Finally, through the study of several well-known biomedical algorithms, I propose an approach allowing energy savings by dynamically and unequally protecting an under-powered data memory in a new way compared to regular error protection schemes. This solution relies on the Dynamic eRror compEnsation And Masking (DREAM) technique that reduces by approximately 21% the energy consumed by traditional error correction codes

Improving the Reliability of Microprocessors under BTI and TDDB Degradations

Reliability is a fundamental challenge for current and future microprocessors with advanced nanoscale technologies. With smaller gates, thinner dielectric and higher temperature microprocessors are vulnerable under aging mechanisms such as Bias Temperature Instability (BTI) and Temperature Dependent Dielectric Breakdown (TDDB). Under continuous stress both parametric and functional errors occur, resulting compromised microprocessor lifetime. In this thesis, based on the thorough study on BTI and TDDB mechanisms, solutions are proposed to mitigating the aging processes on memory based and random logic structures in modern out-of-order microprocessors. A large area of processor core is occupied by memory based structure that is vulnerable to BTI induced errors. The problem is exacerbated when PBTI degradation in NMOS is as severe as NBTI in PMOS in high-k metal gate technology. Hence a novel design is proposed to recover 4 internal gates within a SRAM cell simultaneously to mitigate both NBTI and PBTI effects. This technique is applied to both the L2 cache banks and the busy function units with storage cells in out-of-order pipeline in two different ways. For the L2 cache banks, redundant cache bank is added exclusively for proactive recovery rotation. For the critical and busy function units in out-of-order pipelines, idle cycles are exploited at per-buffer-entry level. Different from memory based structures, combinational logic structures such as function units in execution stage can not use low overhead redundancy to tolerate errors due to their irregular structure. A design framework that aims to improve the reliability of the vulnerable functional units of a processor core is designed and implemented. The approach is designing a generic function unit (GFU) that can be reconfigured to replace a particular functional unit (FU) while it is being recovered for improved lifetime. Although flexible, the GFU is slower than the original target FUs. So GFU is carefully designed so as to minimize the performance loss when it is in-use. More schemes are also designed to avoid using the GFU on performance critical paths of a program execution

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

Data-set supporting the article entitled "Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure"

This dataset supports the article entitled &quot;Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure&quot;, accepted for the publication in IEEE Transactions on Very Large Scale Integration Systems.</span

Towards Computational Efficiency of Next Generation Multimedia Systems

To address throughput demands of complex applications (like Multimedia), a next-generation system designer needs to co-design and co-optimize the hardware and software layers. Hardware/software knobs must be tuned in synergy to increase the throughput efficiency. This thesis provides such algorithmic and architectural solutions, while considering the new technology challenges (power-cap and memory aging). The goal is to maximize the throughput efficiency, under timing- and hardware-constraints