HIGH PERFORMANCE CLOCK DISTRIBUTION FOR HIGH-SPEED VLSI SYSTEMS

Tohoku University堀口 進課

Optimization Schemes for Variability-Driven VLSI Design Automation

Today's IC design is facing several challenges due to increasing circuit complexity and decreasing feature size, as it pushes to extend Moore's law into nano-scale dimensions. Apart from the challenges that arise directly as a result of feature scaling (e.g., increasing leakage power, reliability issues), imperfections in the manufacturing process have recently turned into a major design hurdle, due to the variations they cause in the device and interconnect parameters from their target values. From an IC design automation perspective, a shift in paradigm, from deterministic to probabilistic, is needed to handle the unpredictable nature of these fabrication variations. In such a probabilistic paradigm, the varying circuit parameters such as leakage power or delay should be accurately modeled, and their correlations due to common sources of variations or physical location on the chip should be well captured. Moreover, variability-driven (probabilistic) design automation needs to efficiently generate a high quality solution. A particular challenge in variability-driven design automation is to define optimality measures among candidate solutions, which allow for inferior solutions to be removed from the solution space thus reducing the run-time complexity. In this dissertation, the superiority probability is introduced as such an optimality measure, and two methods are proposed to compute this probability: an accurate Conditional Monte Carlo simulation method, and an efficient moment-matching approximation method. The effectiveness of using the superiority probability is shown in the context of two important design automation applications: 1) the buffer insertion problem, 2) the dual-Vth leakage optimization problem. Another important task in variability-driven design automation is to develop optimization techniques that can provably generate the optimal solution in an efficient way. In this dissertation, the application of the gate sizing problem is explored to optimally reduce the loss due to fabrication variations in the presence of a timing constraint. The presented formulation, in contrast with the existing variability-driven approaches which are all based on heuristics, is provably optimal. Moreover, unlike existing approaches, it is independent of any assumption on the source and nature of variations

Integrated Circuits Parasitic Capacitance Extraction Using Machine Learning and its Application to Layout Optimization

The impact of parasitic elements on the overall circuit performance keeps increasing from one technology generation to the next. In advanced process nodes, the parasitic effects dominate the overall circuit performance. As a result, the accuracy requirements of parasitic extraction processes significantly increased, especially for parasitic capacitance extraction. Existing parasitic capacitance extraction tools face many challenges to cope with such new accuracy requirements that are set by semiconductor foundries (\u3c 5% error). Although field-solver methods can meet such requirements, they are very slow and have a limited capacity. The other alternative is the rule-based parasitic capacitance extraction methods, which are faster and have a high capacity; however, they cannot consistently provide good accuracy as they use a pre-characterized library of capacitance formulas that cover a limited number of layout patterns. On the other hand, the new parasitic extraction accuracy requirements also added more challenges on existing parasitic-aware routing optimization methods, where simplified parasitic models are used to optimize layouts. This dissertation provides new solutions for interconnect parasitic capacitance extraction and parasitic-aware routing optimization methodologies in order to cope with the new accuracy requirements of advanced process nodes as follows. First, machine learning compact models are developed in rule-based extractors to predict parasitic capacitances of cross-section layout patterns efficiently. The developed models mitigate the problems of the pre-characterized library approach, where each compact model is designed to extract parasitic capacitances of cross-sections of arbitrary distributed metal polygons that belong to a specific set of metal layers (i.e., layer combination) efficiently. Therefore, the number of covered layout patterns significantly increased. Second, machine learning compact models are developed to predict parasitic capacitances of middle-end-of-line (MEOL) layers around FINFETs and MOSFETs. Each compact model extracts parasitic capacitances of 3D MEOL patterns of a specific device type regardless of its metal polygons distribution. Therefore, the developed MEOL models can replace field-solvers in extracting MEOL patterns. Third, a novel accuracy-based hybrid parasitic capacitance extraction method is developed. The proposed hybrid flow divides a layout into windows and extracts the parasitic capacitances of each window using one of three parasitic capacitance extraction methods that include: 1) rule-based; 2) novel deep-neural-networks-based; and 3) field-solver methods. This hybrid methodology uses neural-networks classifiers to determine an appropriate extraction method for each window. Moreover, as an intermediate parasitic capacitance extraction method between rule-based and field-solver methods, a novel deep-neural-networks-based extraction method is developed. This intermediate level of accuracy and speed is needed since using only rule-based and field-solver methods (for hybrid extraction) results in using field-solver most of the time for any required high accuracy extraction. Eventually, a parasitic-aware layout routing optimization and analysis methodology is implemented based on an incremental parasitic extraction and a fast optimization methodology. Unlike existing flows that do not provide a mechanism to analyze the impact of modifying layout geometries on a circuit performance, the proposed methodology provides novel sensitivity circuit models to analyze the integrity of signals in layout routes. Such circuit models are based on an accurate matrix circuit representation, a cost function, and an accurate parasitic sensitivity extraction. The circuit models identify critical parasitic elements along with the corresponding layout geometries in a certain route, where they measure the sensitivity of a route’s performance to corresponding layout geometries very fast. Moreover, the proposed methodology uses a nonlinear programming technique to optimize problematic routes with pre-determined degrees of freedom using the proposed circuit models. Furthermore, it uses a novel incremental parasitic extraction method to extract parasitic elements of modified geometries efficiently, where the incremental extraction is used as a part of the routing optimization process to improve the optimization runtime and increase the optimization accuracy

Timing Closure in Chip Design

Achieving timing closure is a major challenge to the physical design of a computer chip. Its task is to find a physical realization fulfilling the speed specifications. In this thesis, we propose new algorithms for the key tasks of performance optimization, namely repeater tree construction; circuit sizing; clock skew scheduling; threshold voltage optimization and plane assignment. Furthermore, a new program flow for timing closure is developed that integrates these algorithms with placement and clocktree construction. For repeater tree construction a new algorithm for computing topologies, which are later filled with repeaters, is presented. To this end, we propose a new delay model for topologies that not only accounts for the path lengths, as existing approaches do, but also for the number of bifurcations on a path, which introduce extra capacitance and thereby delay. In the extreme cases of pure power optimization and pure delay optimization the optimum topologies regarding our delay model are minimum Steiner trees and alphabetic code trees with the shortest possible path lengths. We presented a new, extremely fast algorithm that scales seamlessly between the two opposite objectives. For special cases, we prove the optimality of our algorithm. The efficiency and effectiveness in practice is demonstrated by comprehensive experimental results. The task of circuit sizing is to assign millions of small elementary logic circuits to elements from a discrete set of logically equivalent, predefined physical layouts such that power consumption is minimized and all signal paths are sufficiently fast. In this thesis we develop a fast heuristic approach for global circuit sizing, followed by a local search into a local optimum. Our algorithms use, in contrast to existing approaches, the available discrete layout choices and accurate delay models with slew propagation. The global approach iteratively assigns slew targets to all source pins of the chip and chooses a discrete layout of minimum size preserving the slew targets. In comprehensive experiments on real instances, we demonstrate that the worst path delay is within 7% of its lower bound on average after a few iterations. The subsequent local search reduces this gap to 2% on average. Combining global and local sizing we are able to size more than 5.7 million circuits within 3 hours. For the clock skew scheduling problem we develop the first algorithm with a strongly polynomial running time for the cycle time minimization in the presence of different cycle times and multi-cycle paths. In practice, an iterative local search method is much more efficient. We prove that this iterative method maximizes the worst slack, even when restricting the feasible schedule to certain time intervals. Furthermore, we enhance the iterative local approach to determine a lexicographically optimum slack distribution. The clock skew scheduling problem is then generalized to allow for simultaneous data path optimization. In fact, this is a time-cost tradeoff problem. We developed the first combinatorial algorithm for computing time-cost tradeoff curves in graphs that may contain cycles. Starting from the lowest-cost solution, the algorithm iteratively computes a descent direction by a minimum cost flow computation. The maximum feasible step length is then determined by a minimum ratio cycle computation. This approach can be used in chip design for several optimization tasks, e.g. threshold voltage optimization or plane assignment. Finally, the optimization routines are combined into a timing closure flow. Here, the global placement is alternated with global performance optimization. Netweights are used to penalize the length of critical nets during placement. After the global phase, the performance is improved further by applying more comprehensive optimization routines on the most critical paths. In the end, the clock schedule is optimized and clocktrees are inserted. Computational results of the design flow are obtained on real-world computer chips

Algorithms for the scaling toward nanometer VLSI physical synthesis

Along the history of Very Large Scale Integration (VLSI), we have successfully scaled down the size of transistors, scaled up the speed of integrated circuits (IC) and the number of transistors in a chip - these are just a few examples of our achievement in VLSI scaling. It is projected to enter the nanometer (timing estimation and buffer planning for global routing and other early stages such as floorplanning. A novel path based buffer insertion scheme is also included, which can overcome the weakness of the net based approaches. Part-2 Circuit clustering techniques with the application in Field-Programmable Gate Array (FPGA) technology mapping The problem of timing driven n-way circuit partitioning with application to FPGA technology mapping is studied and a hierarchical clustering approach is presented for the latest multi-level FPGA architectures. Moreover, a more general delay model is included in order to accurately characterize the delay behavior of the clusters and circuit elements

Parametric Yield of VLSI Systems under Variability: Analysis and Design Solutions

Variability has become one of the vital challenges that the designers of integrated circuits encounter. variability becomes increasingly important. Imperfect manufacturing process manifest itself as variations in the design parameters. These variations and those in the operating environment of VLSI circuits result in unexpected changes in the timing, power, and reliability of the circuits. With scaling transistor dimensions, process and environmental variations become significantly important in the modern VLSI design. A smaller feature size means that the physical characteristics of a device are more prone to these unaccounted-for changes. To achieve a robust design, the random and systematic fluctuations in the manufacturing process and the variations in the environmental parameters should be analyzed and the impact on the parametric yield should be addressed. This thesis studies the challenges and comprises solutions for designing robust VLSI systems in the presence of variations. Initially, to get some insight into the system design under variability, the parametric yield is examined for a small circuit. Understanding the impact of variations on the yield at the circuit level is vital to accurately estimate and optimize the yield at the system granularity. Motivated by the observations and results, found at the circuit level, statistical analyses are performed, and solutions are proposed, at the system level of abstraction, to reduce the impact of the variations and increase the parametric yield. At the circuit level, the impact of the supply and threshold voltage variations on the parametric yield is discussed. Here, a design centering methodology is proposed to maximize the parametric yield and optimize the power-performance trade-off under variations. In addition, the scaling trend in the yield loss is studied. Also, some considerations for design centering in the current and future CMOS technologies are explored. The investigation, at the circuit level, suggests that the operating temperature significantly affects the parametric yield. In addition, the yield is very sensitive to the magnitude of the variations in supply and threshold voltage. Therefore, the spatial variations in process and environmental variations make it necessary to analyze the yield at a higher granularity. Here, temperature and voltage variations are mapped across the chip to accurately estimate the yield loss at the system level. At the system level, initially the impact of process-induced temperature variations on the power grid design is analyzed. Also, an efficient verification method is provided that ensures the robustness of the power grid in the presence of variations. Then, a statistical analysis of the timing yield is conducted, by taking into account both the process and environmental variations. By considering the statistical profile of the temperature and supply voltage, the process variations are mapped to the delay variations across a die. This ensures an accurate estimation of the timing yield. In addition, a method is proposed to accurately estimate the power yield considering process-induced temperature and supply voltage variations. This helps check the robustness of the circuits early in the design process. Lastly, design solutions are presented to reduce the power consumption and increase the timing yield under the variations. In the first solution, a guideline for floorplaning optimization in the presence of temperature variations is offered. Non-uniformity in the thermal profiles of integrated circuits is an issue that impacts the parametric yield and threatens chip reliability. Therefore, the correlation between the total power consumption and the temperature variations across a chip is examined. As a result, floorplanning guidelines are proposed that uses the correlation to efficiently optimize the chip's total power and takes into account the thermal uniformity. The second design solution provides an optimization methodology for assigning the power supply pads across the chip for maximizing the timing yield. A mixed-integer nonlinear programming (MINLP) optimization problem, subject to voltage drop and current constraint, is efficiently solved to find the optimum number and location of the pads

Variability-Aware VLSI Design Automation For Nanoscale Technologies

As technology scaling enters the nanometer regime, design of large scale ICs gets more challenging due to shrinking feature sizes and increasing design complexity. Aggressive scaling causes significant degradation in reliability, increased susceptibility to fabrication and environmental randomness and increased dynamic and leakage power dissipation. In this work, we investigate these scaling issues in large scale integrated systems. This dissertation proposes to develop variability-aware design methodologies by proposing design analysis, design-time optimization, post-silicon tunability and runtime-adaptivity based optimization techniques for handling variability. We discuss our research in the area of variability-aware analysis, specifically focusing on the problem of statistical timing analysis. The first technique presents the concept of error budgeting that achieves significant runtime speedups during statistical timing analysis. The second work presents a general framework for non-linear non-Gaussian statistical timing analysis considering correlations. Further, we present our work on design-time optimization schemes that are applicable during physical synthesis. Firstly, we present a buffer insertion technique that considers wire-length uncertainty and proposes algorithms to perform probabilistic buffer insertion. Secondly, we present a stochastic optimization framework based on Monte-Carlo technique considering fabrication variability. This optimization framework can be applied to problems that can be modeled as linear programs without without imposing any assumptions on the nature of the variability. Subsequently, we present our work on post-silicon tunability based design optimization. This work presents a design management framework that can be used to balance the effort spent on pre-silicon (through gate sizing) and post-silicon optimization (through tunable clock-tree buffers) while maximizing the yield gains. Lastly, we present our work on variability-aware runtime optimization techniques. We look at the problem of runtime supply voltage scaling for dynamic power optimization, and propose a framework to consider the impact of variability on the reliability of such designs. We propose a probabilistic design synthesis technique where reliability of the design is a primary optimization metric

Broadening the Scope of Multi-Objective Optimizations in Physical Synthesis of Integrated Circuits.

In modern VLSI design, physical synthesis tools are primarily responsible for satisfying chip-performance constraints by invoking a broad range of circuit optimizations, such as buffer insertion, logic restructuring, gate sizing and relocation. This process is known as timing closure. Our research seeks more powerful and efficient optimizations to improve the state of the art in modern chip design. In particular, we integrate timing-driven relocation, retiming, logic cloning, buffer insertion and gate sizing in novel ways to create powerful circuit transformations that help satisfy setup-time constraints. State-of-the-art physical synthesis optimizations are typically applied at two scales: i) global algorithms that affect the entire netlist and ii) local transformations that focus on a handful of gates or interconnections. The scale of modern chip designs dictates that only near-linear-time optimization algorithms can be applied at the global scope — typically limited to wirelength-driven placement and legalization. Localized transformations can rely on more time-consuming optimizations with accurate delay models. Few techniques bridge the gap between fully-global and localized optimizations. This dissertation broadens the scope of physical synthesis optimization to include accurate transformations operating between the global and local scales. In particular, we integrate groups of related transformations to break circular dependencies and increase the number of circuit elements that can be jointly optimized to escape local minima. Integrated transformations in this dissertation are developed by identifying and removing obstacles to successful optimizations. Integration is achieved through mapping multiple operations to rigorous mathematical optimization problems that can be solved simultaneously. We achieve computational scalability in our techniques by leveraging analytical delay models and focusing optimization efforts on carefully selected regions of the chip. In this regard, we make extensive use of a linear interconnect-delay model that accounts for the impact of subsequent repeated insertion. Our integrated transformations are evaluated on high-performance circuits with over 100,000 gates. Integrated optimization techniques described in this dissertation ensure graceful timing-closure process and impact nearly every aspect of a typical physical synthesis flow. They have been validated in EDA tools used at IBM for physical synthesis of high-performance CPU and ASIC designs, where they significantly improved chip performance.Ph.D.Computer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/78744/1/iamyou_1.pd

Timing-Constrained Global Routing with Buffered Steiner Trees

This dissertation deals with the combination of two key problems that arise in the physical design of computer chips: global routing and buffering. The task of buffering is the insertion of buffers and inverters into the chip's netlist to speed-up signal delays and to improve electrical properties of the chip. Insertion of buffers and inverters goes alongside with construction of Steiner trees that connect logical sources with possibly many logical sinks and have buffers and inverters as parts of these connections. Classical global routing focuses on packing Steiner trees within the limited routing space. Buffering and global routing have been solved separately in the past. In this thesis we overcome the limitations of the classical approaches by considering the buffering problem as a global, multi-objective problem. We study its theoretical aspects and propose algorithms which we implement in the tool BonnRouteBuffer for timing-constrained global routing with buffered Steiner trees. At its core, we propose a new theoretically founded framework to model timing constraints inherently within global routing. As most important sub-task we have to compute a buffered Steiner tree for a single net minimizing the sum of prices for delays, routing congestion, placement congestion, power consumption, and net length. For this sub-task we present a fully polynomial time approximation scheme to compute an almost-cheapest Steiner tree with a given routing topology and prove that an exact algorithm cannot exist unless P=NP. For topology computation we present a bicriteria approximation algorithm that bounds both the geometric length and the worst slack of the topology. To improve the practical results we present many heuristic modifications, speed-up- and post-optimization techniques for buffered Steiner trees. We conduct experiments on challenging real-world test cases provided by our cooperation partner IBM to demonstrate the quality of our tool. Our new algorithm could produce better solutions with respect to both timing and routability. After post-processing with gate sizing and Vt-assignment, we can even reduce the power consumption on most instances. Overall, our results show that our tool BonnRouteBuffer for timing-constrained global routing is superior to industrial state-of-the-art tools