JPL preferred parts list: Reliable electronic components

The JPL Preferred Parts List was prepared to provide a basis for selection of electronic parts for JPL spacecraft programs. Supporting tests for the listed parts were designed to comply with specific spacecraft environmental requirements. The list tabulates the electronic, magnetic, and electromechanical parts applicable to all JPL electronic equipment wherein reliability is a major concern. The parts listed are revelant to equipment supplied by subcontractors as well as fabricated at the laboratory

A study of high-speed AD and DA converters using redundancy techniques Interim report, May 10, 1963 - May 9, 1964

High speed analog-to-digital converters compared using redundancy encoding technique

Colloquium on Solid State Devices

[no abstract

Design of 5v Digital Standard Cells And I/O Libraries for Military Standard Temperatures

The scope of this research work is to develop digital standard cell and I/O cell libraries operable at 5V power supply and operable up to 125�C using Peregrine 0.5um 3.3 V process. Device geometries are selected based on Ion/Ioff ratios at 125�C. The cell schematic, layout and abstracted views are generated for both the libraries The Standard cell and I/O libraries are characterized for timing and power and the characterization data is realized in various formats compatible with logic synthesis and place and route tools. The pads have been tested for robustness to ESD. A tutorial on abstraction of standard cells and IO cells is prepared using the Cadence Abstract Generator.School of Electrical & Computer Engineerin

Semiconductor light sources for photonic quantum computing

The isolation of qubits from decoherence is crucial to the prospect of building revolutionary quantum devices. This work is devoted to an optical study of the decoherence on spin qubits in self-assembled quantum dots. This thesis contributes towards a complete understanding of quantum decoherence, of which highlighted discoveries include bypassing the spectral diffusion in neutral quantum dot emission lines; observing for the first time the self-polarization phenomenon of nuclear spins, via the resonance-locking effect on a negatively charged quantum dot; and revealing the limiting factors on hole spin dephasing, by measuring polarization correlations on a positively charged quantum dot. Three studies were conducted using two different spectroscopy techniques. For the first study, the spectral diffusion of emission line due to random electrostatic fluctuations was revealed, by scanning a neutral quantum dot transition across the laser resonance. Exciting the quantum dot resonantly bypassed this problem, paving the way for an on-demand antibunched source that generates narrow-band photons. For the second study, evidences supporting the spontaneous self-polarization of nuclear spins were observed for the first time, since it was predicted nearly four decades ago by M. Dyankonov and V.I. Perel. The self-polarization phenomenon is a remarkable demonstration of dynamic nuclear spin polarization since it manifests without the ground state electron being spin-polarized. In the last study, factors limiting the hole spin lifetime was inferred from measuring polarization correlation of successively emitted photons from a positively charged quantum dot. Evidences support a strong dependence on the carrier repopulation rate and the single electron spin dephasing in the upper state, due to the Overhauser field. In combination with the observation of spontaneous nuclear polarization, this opens the possibility of an electron spin sensor, which can indirectly probe the nuclear field.Open Acces

Investigation of radiation-hardened design of electronic systems with applications to post-accident monitoring for nuclear power plants

This research aims at improving the robustness of electronic systems used-in high level radiation environments by combining with radiation-hardened (rad-hardened) design and fault-tolerant techniques based on commercial off-the-shelf (COTS) components. A specific of the research is to use such systems for wireless post-accident monitoring in nuclear power plants (NPPs). More specifically, the following methods and systems are developed and investigated to accomplish expected research objectives: analysis of radiation responses, design of a radiation-tolerant system, implementation of a wireless post-accident monitoring system for NPPs, performance evaluation without repeat physical tests, and experimental validation in a radiation environment. A method is developed to analyze ionizing radiation responses of COTS-based devices and circuits in various radiation conditions, which can be applied to design circuits robust to ionizing radiation effects without repeated destructive tests in a physical radiation environment. Some mathematical models of semiconductor devices for post-irradiation conditions are investigated, and their radiation responses are analyzed using Technology Computer Aided Design (TCAD) simulator. Those models are then used in the analysis of circuits and systems under radiation condition. Based on the simulation results, method of rapid power off may be effectively to protect electronic systems under ionizing radiation. It can be a potential solution to mitigate damages of electronic components caused by radiation. With simulation studies of photocurrent responses of semiconductor devices, two methods are presented to mitigate the damages of total ionizing dose: component selection and radiation shielding protection. According to the investigation of radiation-tolerance of regular COTS components, most COTS-based semiconductor components may experience performance degradation and radiation damages when the total dose is greater than 20 K Rad (Si). A principle of component selection is given to obtain the suitable components, as well as a method is proposed to assess the component reliability under radiation environments, which uses radiation degradation factors, instead of the usual failure rate data in the reliability model. Radiation degradation factor is as the input to describe the radiation response of a component under a total radiation dose. In addition, a number of typical semiconductor components are also selected as the candidate components for the application of wireless monitoring in nuclear power plants. On the other hand, a multi-layer shielding protection is used to reduce the total dose to be less than 20 K Rad (Si) for a given radiation condition; the selected semiconductor devices can then survive in the radiation condition with the reduced total dose. The calculation method of required shielding thickness is also proposed to achieve the design objectives. Several shielding solutions are also developed and compared for applications in wireless monitoring system in nuclear power plants. A radiation-tolerant architecture is proposed to allow COTS-based electronic systems to be used in high-level radiation environments without using rad-hardened components. Regular COTS components are used with some fault-tolerant techniques to mitigate damages of the system through redundancy, online fault detection, real-time preventive remedial actions, and rapid power off. The functions of measurement, processing, communication, and fault-tolerance are integrated locally within all channels without additional detection units. A hardware emulation bench with redundant channels is constructed to verify the effectiveness of the developed radiation-tolerant architecture. Experimental results have shown that the developed architecture works effectively and redundant channels can switch smoothly in 500 milliseconds or less when a single fault or multiple faults occur. An online mechanism is also investigated to timely detect and diagnose radiation damages in the developed redundant architecture for its radiation tolerance enhancement. This is implemented by the built-in-test technique. A number of tests by using fault injection techniques have been carried out in the developed hardware emulation bench to validate the proposed detection mechanism. The test results have shown that faults and errors can be effectively detected and diagnosed. For the developed redundant wireless devices under given radiation dose (20 K Rad (Si)), the fault detection coverage is about 62.11%. This level of protection could be improved further by putting more resources (CPU consumption, etc.) into the function of fault detection, but the cost will increase. To apply the above investigated techniques and systems, under a severe accident condition in a nuclear power plant, a prototype of wireless post-accident monitoring system (WPAMS) is designed and constructed. Specifically, the radiation-tolerant wireless device is implemented with redundant and diversified channels. The developed system operates effectively to measure up-to-date information from a specific area/process and to transmit that information to remote monitoring station wirelessly. Hence, the correctness of the proposed architecture and approaches in this research has been successfully validated. In the design phase, an assessment method without performing repeated destructive physical tests is investigated to evaluate the radiation-tolerance of electronic systems by combining the evaluation of radiation protection and the analysis of the system reliability under the given radiation conditions. The results of the assessment studies have shown that, under given radiation conditions, the reliability of the developed radiation-tolerant wireless system can be much higher than those of non-redundant channels; and it can work in high-level radiation environments with total dose up to 1 M Rad (Si). Finally, a number of total dose tests are performed to investigate radiation effects induced by gamma radiation on distinct modern wireless monitoring devices. An experimental setup is developed to monitor the performance of signal measurement online and transmission of the developed distinct wireless electronic devices directly under gamma radiator at The Ohio State University Nuclear Reactor Lab (OSU-NRL). The gamma irradiator generates dose rates of 20 K Rad/h and 200 Rad/h on the samples, respectively. It was found that both measurement and transmission functions of distinct wireless measurement and transmission devices work well under gamma radiation conditions before the devices permanently damage. The experimental results have also shown that the developed radiation-tolerant design can be applied to effectively extend the lifespan of COTS-based electronic systems in the high-level radiation environment, as well as to improve the performance of wireless communication systems. According to testing results, the developed radiation-tolerant wireless device with a shielding protection can work at least 21 hours under the highest dose rate (20 K Rad/h). In summary, this research has addressed important issues on the design of radiation-tolerant systems without using rad-hardened electronic components. The proposed methods and systems provide an effective and economical solution to implement monitoring systems for obtaining up-to-date information in high-level radiation environments. The reported contributions are of significance both academically and in practice

Reliability Abstracts and Technical Reviews 1964

No abstract availabl

Semiconductor Memory Applications in Radiation Environment, Hardware Security and Machine Learning System

abstract: Semiconductor memory is a key component of the computing systems. Beyond the conventional memory and data storage applications, in this dissertation, both mainstream and eNVM memory technologies are explored for radiation environment, hardware security system and machine learning applications. In the radiation environment, e.g. aerospace, the memory devices face different energetic particles. The strike of these energetic particles can generate electron-hole pairs (directly or indirectly) as they pass through the semiconductor device, resulting in photo-induced current, and may change the memory state. First, the trend of radiation effects of the mainstream memory technologies with technology node scaling is reviewed. Then, single event effects of the oxide based resistive switching random memory (RRAM), one of eNVM technologies, is investigated from the circuit-level to the system level. Physical Unclonable Function (PUF) has been widely investigated as a promising hardware security primitive, which employs the inherent randomness in a physical system (e.g. the intrinsic semiconductor manufacturing variability). In the dissertation, two RRAM-based PUF implementations are proposed for cryptographic key generation (weak PUF) and device authentication (strong PUF), respectively. The performance of the RRAM PUFs are evaluated with experiment and simulation. The impact of non-ideal circuit effects on the performance of the PUFs is also investigated and optimization strategies are proposed to solve the non-ideal effects. Besides, the security resistance against modeling and machine learning attacks is analyzed as well. Deep neural networks (DNNs) have shown remarkable improvements in various intelligent applications such as image classification, speech classification and object localization and detection. Increasing efforts have been devoted to develop hardware accelerators. In this dissertation, two types of compute-in-memory (CIM) based hardware accelerator designs with SRAM and eNVM technologies are proposed for two binary neural networks, i.e. hybrid BNN (HBNN) and XNOR-BNN, respectively, which are explored for the hardware resource-limited platforms, e.g. edge devices.. These designs feature with high the throughput, scalability, low latency and high energy efficiency. Finally, we have successfully taped-out and validated the proposed designs with SRAM technology in TSMC 65 nm. Overall, this dissertation paves the paths for memory technologies’ new applications towards the secure and energy-efficient artificial intelligence system.Dissertation/ThesisDoctoral Dissertation Electrical Engineering 201

NASA thesaurus. Volume 3: Definitions

Publication of NASA Thesaurus definitions began with Supplement 1 to the 1985 NASA Thesaurus. The definitions given here represent the complete file of over 3,200 definitions, complimented by nearly 1,000 use references. Definitions of more common or general scientific terms are given a NASA slant if one exists. Certain terms are not defined as a matter of policy: common names, chemical elements, specific models of computers, and nontechnical terms. The NASA Thesaurus predates by a number of years the systematic effort to define terms, therefore not all Thesaurus terms have been defined. Nevertheless, definitions of older terms are continually being added. The following data are provided for each entry: term in uppercase/lowercase form, definition, source, and year the term (not the definition) was added to the NASA Thesaurus. The NASA History Office is the authority for capitalization in satellite and spacecraft names. Definitions with no source given were constructed by lexicographers at the NASA Scientific and Technical Information (STI) Facility who rely on the following sources for their information: experts in the field, literature searches from the NASA STI database, and specialized references