A Charge-Recycling Scheme and Ultra Low Voltage Self-Startup Charge Pump for Highly Energy Efficient Mixed Signal Systems-On-A-Chip

The advent of battery operated sensor-based electronic systems has provided a pressing need to design energy-efficient, ultra-low power integrated circuits as a means to improve the battery lifetime. This dissertation describes a scheme to lower the power requirement of a digital circuit through the use of charge-recycling and dynamic supply-voltage scaling techniques. The novel charge-recycling scheme proposed in this research demonstrates the feasibility of operating digital circuits using the charge scavenged from the leakage and dynamic load currents inherent to digital design. The proposed scheme efficiently gathers the “ground-bound” charge into storage capacitor banks. This reclaimed charge is then subsequently recycled to power the source digital circuit. The charge-recycling methodology has been implemented on a 12-bit Gray-code counter operating at frequencies of less than 50 MHz. The circuit has been designed in a 90-nm process and measurement results reveal more than 41% reduction in the average energy consumption of the counter. The total energy savings including the power consumed for the generation of control signals aggregates to an average of 23%. The proposed methodology can be applied to an existing digital path without any design change to the circuit but with only small loss to the performance. Potential applications of this scheme are described, specifically in wide-temperature dynamic power reduction and as a source for energy harvesters. The second part of this dissertation deals with the design and development of a self-starting, ultra-low voltage, switched-capacitor (SC) DC-DC converter that is essential to an energy harvesting system. The proposed charge-pump based SC-converter operates from 125-mV input and thus enables battery-less operation in ultra-low voltage energy harvesters. The charge pump does not require any external components or expensive post-fabrication processing to enable low-voltage operation. This design has been implemented in a 130-nm CMOS process. While the proposed charge pump provides significant efficiency enhancement in energy harvesters, it can also be incorporated within charge recycling systems to facilitate adaptable charge-recycling levels. In total, this dissertation provides key components needed for highly energy-efficient mixed signal systems-on-a-chip

Negative Bias Temperature Instability And Charge Trapping Effects On Analog And Digital Circuit Reliability

Nanoscale p-channel transistors under negative gate bias at an elevated temperature show threshold voltage degradation after a short period of stress time. In addition, nanoscale (45 nm) n-channel transistors using high-k (HfO2) dielectrics to reduce gate leakage power for advanced microprocessors exhibit fast transient charge trapping effect leading to threshold voltage instability and mobility reduction. A simulation methodology to quantify the circuit level degradation subjected to negative bias temperature instability (NBTI) and fast transient charge trapping effect has been developed in this thesis work. Different current mirror and two-stage operation amplifier structures are studied to evaluate the impact of NBTI on CMOS analog circuit performances for nanoscale applications. Fundamental digital circuit such as an eleven-stage ring oscillator has also been evaluated to examine the fast transient charge transient effect of HfO2 high-k transistors on the propagation delay of ring oscillator performance. The preliminary results show that the negative bias temperature instability reduces the bandwidth of CMOS operating amplifiers, but increases the amplifier\u27s voltage gain at mid-frequency range. The transient charge trapping effect increases the propagation delay of ring oscillator. The evaluation methodology developed in this thesis could be extended to study other CMOS device and circuit reliability issues subjected to electrical and temperature stresses

Negative Bias Temperature Instability And Charge Trapping Effects On Analog And Digital Circuit Reliability

Nanoscale p-channel transistors under negative gate bias at an elevated temperature show threshold voltage degradation after a short period of stress time. In addition, nanoscale (45 nm) n-channel transistors using high-k (HfO2) dielectrics to reduce gate leakage power for advanced microprocessors exhibit fast transient charge trapping effect leading to threshold voltage instability and mobility reduction. A simulation methodology to quantify the circuit level degradation subjected to negative bias temperature instability (NBTI) and fast transient charge trapping effect has been developed in this thesis work. Different current mirror and two-stage operation amplifier structures are studied to evaluate the impact of NBTI on CMOS analog circuit performances for nanoscale applications. Fundamental digital circuit such as an eleven-stage ring oscillator has also been evaluated to examine the fast transient charge transient effect of HfO2 high-k transistors on the propagation delay of ring oscillator performance. The preliminary results show that the negative bias temperature instability reduces the bandwidth of CMOS operating amplifiers, but increases the amplifier\u27s voltage gain at mid-frequency range. The transient charge trapping effect increases the propagation delay of ring oscillator. The evaluation methodology developed in this thesis could be extended to study other CMOS device and circuit reliability issues subjected to electrical and temperature stresses

Integrated Circuits for Programming Flash Memories in Portable Applications

Smart devices such as smart grids, smart home devices, etc. are infrastructure systems that connect the world around us more than before. These devices can communicate with each other and help us manage our environment. This concept is called the Internet of Things (IoT). Not many smart nodes exist that are both low-power and programmable. Floating-gate (FG) transistors could be used to create adaptive sensor nodes by providing programmable bias currents. FG transistors are mostly used in digital applications like Flash memories. However, FG transistors can be used in analog applications, too. Unfortunately, due to the expensive infrastructure required for programming these transistors, they have not been economical to be used in portable applications. In this work, we present low-power approaches to programming FG transistors which make them a good candidate to be employed in future wireless sensor nodes and portable systems. First, we focus on the design of low-power circuits which can be used in programming the FG transistors such as high-voltage charge pumps, low-drop-out regulators, and voltage reference cells. Then, to achieve the goal of reducing the power consumption in programmable sensor nodes and reducing the programming infrastructure, we present a method to program FG transistors using negative voltages. We also present charge-pump structures to generate the necessary negative voltages for programming in this new configuration

Phase Frequency Detector and Charge Pump for Low Jitter PLL Applications

In this paper a new technique is presented to improve the jitter performance of conventional phase frequency detectors by completely removing the unnecessary one-shot pulse. This technique uses a variable pulse-height circuit to control the unnecessary one-shot pulse height. In addition, a novel charge-pump circuit with perfect current-matching characteristics is used to improve the output jitter performance of conventional charge pumps. This circuit is composed of a pair of symmetrical pump circuits to obtain a good current matching. As a result, the proposed charge-pump circuit has perfect current-matching characteristics, wide output range, no glitch output current, and no jump output voltage. In order to verify such operation, circuit simulation is performed using 0.18 μm CMOS process parameters

Negative Bias Temperature Instability (NBTI) Monitoring and Mitigation Technique for MOSFET

修士論

High-Performance Silicon Nanowire Electronics

This thesis explores 10-nm wide Si nanowire (SiNW) field-effect transistors (FETs) for logic applications via the fabrication and testing of SiNW-based ring oscillators. Both SiNW surface treatments and dielectric annealing are reported for producing SiNW FETs that exhibit high performance in terms of large on/off-state current ratio (~108), low drain-induced barrier lowering (~30 mV), high carrier mobilities (~269 cm2/V•s), and low subthreshold swing (~80 mV/dec). The performance of inverter and ring-oscillator circuits fabricated from these nanowire FETs is explored as well. The inverter demonstrates the highest voltage gain (~148) reported for a SiNW-based NOT gate, and the ring oscillator exhibits near rail-to-rail oscillation centered at 13.4 MHz. The static and dynamic characteristics of these NW devices indicate that these SiNW-based FET circuits are excellent candidates for various high-performance nanoelectronic applications. A set of novel charge-trap non-volatile memory devices based on high-performance SiNW FETs are well investigated. These memory devices integrate Fe2O3 quantum dots (FeO QDs) as charge storage elements. A template-assisted assembly technique is used to align FeO QDs into a close-packed, ordered matrix within the trenches that separate highly aligned SiNWs, and thus store injected charges. A Fowler-Nordheim tunneling mechanism describes both the program and erase operations. The memory prototype demonstrates promising characteristics in terms of large threshold voltage shift (~1.3 V) and long data retention time (~3 × 106 s), and also allows for key components to be systematically varied. For example, varying the size of the QDs indicates that larger diameter QDs exhibit a larger memory window, suggesting the QD charging energy plays an important role in the carrier transport. The device temperature characteristics reveal an optimal window for device performance between 275K and 350K. The flexibility of integrating the charge-trap memory devices with the SiNW logic devices offers a low-cost embedded non-volatile memory solution. A building block for a SiNW-based field-programmable gate array (FPGA) is proposed in the future work.</p

Front End of a 900MHz RFID for Biological Sensing

This thesis presents the front end of a 900MHz passive RFID for biological sensing. The components blocks of the front end consist of power harvester, switch capacitor voltage regulator, phase lock loop and a modulator and demodulator. As the RFID is passive so the power resource is limited hence the main focus while implementing all the block was low power and high efficiency power conversion. All the individual block were optimized to provide maximum efficiency. For the harvester to achieve high efficiency and high output voltage a design approach is discussed by which the device sizes are optimized and the values of the matching network components are solved. The efficiency achieved with this approach is 34% while supplying 74�[email protected]. The switch capacitor voltage regulator would supply power to the digital core of the RFID, which will operate at subtheshold or moderate inversion. The switch capacitor implemented in this work is a adaptive voltage regulator, as I intend to use the dynamic supply voltage scaling technique to compensate for the reduction in reliability of performance of the circuit due to variation of VTH across process due to random doping effects and temperature in subthreshold.The phase lock loop (PLL) block in this front end provide the system clock synchronized with the base station to all the backend blocks like the digital controller, memory, and the analog to digital converter ADC and the switch capacitor voltage regulator. The PLL is a low power with jitter of 24nsec and is capable of clock data recovery from EPC gen 2 protocol format data and consumes 3�W of power Finally a ultra low power AM (amplitude modulation) demodulator is presented which is consumes only 100nW and is capable of demodulating a double-sideband amplitude modulated (DSB-AM) signal centered at 900MHz and the modulating frequency is 160KHz. The demodulator can demodulate signal having as low as -5dBm power and 50% modulation index. The modulation for transmitting signal is achieved by BPSK(back scatter phase shift keying).Electrical Engineerin