Minimizing the cost of fault location when testing from a finite state machine

If a test does not produce the expected output, the incorrect output may have been caused by an earlier state transfer failure. Ghedamsi and coworkers generate a set of candidates and then produce further tests to locate the failures within this set. We consider a special case where there is a state identification process that is known to be correct. A number of preset and adaptive approaches to fault location are described and the problem of minimizing the cost is explored. Some of the approaches lead to NP-hard optimization problems for which possible heuristics are suggested

Berry Esseen bounds for combinatorial central limit theorems and pattern occurrences, using zero and size biasing

Berry Esseen type bounds to the normal, based on zero- and size-bias couplings, are derived using Stein's method. The zero biasing bounds are illustrated with an application to combinatorial central limit theorems where the random permutation has either the uniform distribution or one which is constant over permutations with the same cycle type and having no fixed points. The size biasing bounds are applied to the occurrences of fixed relatively ordered sub-sequences (such as rising sequences) in a random permutation, and to the occurrences of patterns, extreme values, and subgraphs on finite graphs.Comment: 23 page