Adversarial Deep Learning and Security with a Hardware Perspective

Adversarial deep learning is the field of study which analyzes deep learning in the presence of adversarial entities. This entails understanding the capabilities, objectives, and attack scenarios available to the adversary to develop defensive mechanisms and avenues of robustness available to the benign parties. Understanding this facet of deep learning helps us improve the safety of the deep learning systems against external threats from adversaries. However, of equal importance, this perspective also helps the industry understand and respond to critical failures in the technology. The expectation of future success has driven significant interest in developing this technology broadly. Adversarial deep learning stands as a balancing force to ensure these developments remain grounded in the real-world and proceed along a responsible trajectory. Recently, the growth of deep learning has begun intersecting with the computer hardware domain to improve performance and efficiency for resource constrained application domains. The works investigated in this dissertation constitute our pioneering efforts in migrating adversarial deep learning into the hardware domain alongside its parent field of research

Within-Die Delay Variation Measurement And Analysis For Emerging Technologies Using An Embedded Test Structure

Both random and systematic within-die process variations (PV) are growing more severe with shrinking geometries and increasing die size. Escalation in the variations in delay and power with reductions in feature size places higher demands on the accuracy of variation models. Their availability can be used to improve yield, and the corresponding profitability and product quality of the fabricated integrated circuits (ICs). Sources of within-die variations include optical source limitations, and layout-based systematic effects (pitch, line-width variability, and microscopic etch loading). Unfortunately, accurate models of within-die PVs are becoming more difficult to derive because of their increasingly sensitivity to design-context. Embedded test structures (ETS) continue to play an important role in the development of models of PVs and as a mechanism to improve correlations between hardware and models. Variations in path delays are increasing with scaling, and are increasingly affected by neighborhood\u27 interactions. In order to fully characterize within-die variations, delays must be measured in the context of actual core-logic macros. Doing so requires the use of an embedded test structure, as opposed to traditional scribe line test structures such as ring oscillators (RO). Accurate measurements of within-die variations can be used, e.g., to better tune models to actual hardware (model-to-hardware correlations). In this research project, I propose an embedded test structure called REBEL (Regional dELay BEhavior) that is designed to measure path delays in a minimally invasive fashion; and its architecture measures the path delays more accurately. Design for manufacture-ability (DFM) analysis is done on the on 90 nm ASIC chips and 28nm Zynq 7000 series FPGA boards. I present ASIC results on within-die path delay variations in a floating-point unit (FPU) fabricated in IBM\u27s 90 nm technology, with 5 pipeline stages, used as a test vehicle in chip experiments carried out at nine different temperature/voltage (TV) corners. Also experimental data has been analyzed for path delay variations in short vs long paths. FPGA results on within-die variation and die-to-die variations on Advanced Encryption System (AES) using single pipelined stage are also presented. Other analysis that have been performed on the calibrated path delays are Flip Flop propagation delays for both rising and falling edge (tpHL and tpLH), uncertainty analysis, path distribution analysis, short versus long path variations and mid-length path within-die variation. I also analyze the impact on delay when the chips are subjected to industrial-level temperature and voltage variations. From the experimental results, it has been established that the proposed REBEL provides capabilities similar to an off-chip logic analyzer, i.e., it is able to capture the temporal behavior of the signal over time, including any static and dynamic hazards that may occur on the tested path. The ASIC results further show that path delays are correlated to the launch-capture (LC) interval used to time them. Therefore, calibration as proposed in this work must be carried out in order to obtain an accurate analysis of within-die variations. Results on ASIC chips show that short paths can vary up to 35% on average, while long paths vary up to 20% at nominal temperature and voltage. A similar trend occurs for within-die variations of mid-length paths where magnitudes reduced to 20% and 5%, respectively. The magnitude of delay variations in both these analyses increase as temperature and voltage are changed to increase performance. The high level of within-die delay variations are undesirable from a design perspective, but they represent a rich source of entropy for applications that make use of \u27secrets\u27 such as authentication, hardware metering and encryption. Physical unclonable functions (PUFs) are a class of primitives that leverage within-die-variations as a means of generating random bit strings for these types of applications, including hardware security and trust. Zynq FPGAs Die-to-Die and within-die variation study shows that on average there is 5% of within-Die variation and the range of die-to-Die variation can go upto 3ns. The die-to-Die variations can be explored in much further detail to study the variations spatial dependance. Additionally, I also carried out research in the area data mining to cater for big data by focusing the work on decision tree classification (DTC) to speed-up the classification step in hardware implementation. For this purpose, I devised a pipelined architecture for the implementation of axis parallel binary decision tree classification for meeting up with the requirements of execution time and minimal resource usage in terms of area. The motivation for this work is that analyzing larger data-sets have created abundant opportunities for algorithmic and architectural developments, and data-mining innovations, thus creating a great demand for faster execution of these algorithms, leading towards improving execution time and resource utilization. Decision trees (DT) have since been implemented in software programs. Though, the software implementation of DTC is highly accurate, the execution times and the resource utilization still require improvement to meet the computational demands in the ever growing industry. On the other hand, hardware implementation of DT has not been thoroughly investigated or reported in detail. Therefore, I propose a hardware acceleration of pipelined architecture that incorporates the parallel approach in acquiring the data by having parallel engines working on different partitions of data independently. Also, each engine is processing the data in a pipelined fashion to utilize the resources more efficiently and reduce the time for processing all the data records/tuples. Experimental results show that our proposed hardware acceleration of classification algorithms has increased throughput, by reducing the number of clock cycles required to process the data and generate the results, and it requires minimal resources hence it is area efficient. This architecture also enables algorithms to scale with increasingly large and complex data sets. We developed the DTC algorithm in detail and explored techniques for adapting it to a hardware implementation successfully. This system is 3.5 times faster than the existing hardware implementation of classification.\u2

Remote Attacks on FPGA Hardware

Immer mehr Computersysteme sind weltweit miteinander verbunden und über das Internet zugänglich, was auch die Sicherheitsanforderungen an diese erhöht. Eine neuere Technologie, die zunehmend als Rechenbeschleuniger sowohl für eingebettete Systeme als auch in der Cloud verwendet wird, sind Field-Programmable Gate Arrays (FPGAs). Sie sind sehr flexible Mikrochips, die per Software konfiguriert und programmiert werden können, um beliebige digitale Schaltungen zu implementieren. Wie auch andere integrierte Schaltkreise basieren FPGAs auf modernen Halbleitertechnologien, die von Fertigungstoleranzen und verschiedenen Laufzeitschwankungen betroffen sind. Es ist bereits bekannt, dass diese Variationen die Zuverlässigkeit eines Systems beeinflussen, aber ihre Auswirkungen auf die Sicherheit wurden nicht umfassend untersucht. Diese Doktorarbeit befasst sich mit einem Querschnitt dieser Themen: Sicherheitsprobleme die dadurch entstehen wenn FPGAs von mehreren Benutzern benutzt werden, oder über das Internet zugänglich sind, in Kombination mit physikalischen Schwankungen in modernen Halbleitertechnologien. Der erste Beitrag in dieser Arbeit identifiziert transiente Spannungsschwankungen als eine der stärksten Auswirkungen auf die FPGA-Leistung und analysiert experimentell wie sich verschiedene Arbeitslasten des FPGAs darauf auswirken. In der restlichen Arbeit werden dann die Auswirkungen dieser Spannungsschwankungen auf die Sicherheit untersucht. Die Arbeit zeigt, dass verschiedene Angriffe möglich sind, von denen früher angenommen wurde, dass sie physischen Zugriff auf den Chip und die Verwendung spezieller und teurer Test- und Messgeräte erfordern. Dies zeigt, dass bekannte Isolationsmaßnahmen innerhalb FPGAs von böswilligen Benutzern umgangen werden können, um andere Benutzer im selben FPGA oder sogar das gesamte System anzugreifen. Unter Verwendung von Schaltkreisen zur Beeinflussung der Spannung innerhalb eines FPGAs zeigt diese Arbeit aktive Angriffe, die Fehler (Faults) in anderen Teilen des Systems verursachen können. Auf diese Weise sind Denial-of-Service Angriffe möglich, als auch Fault-Angriffe um geheime Schlüsselinformationen aus dem System zu extrahieren. Darüber hinaus werden passive Angriffe gezeigt, die indirekt die Spannungsschwankungen auf dem Chip messen. Diese Messungen reichen aus, um geheime Schlüsselinformationen durch Power Analysis Seitenkanalangriffe zu extrahieren. In einer weiteren Eskalationsstufe können sich diese Angriffe auch auf andere Chips auswirken die an dasselbe Netzteil angeschlossen sind wie der FPGA. Um zu beweisen, dass vergleichbare Angriffe nicht nur innerhalb FPGAs möglich sind, wird gezeigt, dass auch kleine IoT-Geräte anfällig für Angriffe sind welche die gemeinsame Spannungsversorgung innerhalb eines Chips ausnutzen. Insgesamt zeigt diese Arbeit, dass grundlegende physikalische Variationen in integrierten Schaltkreisen die Sicherheit eines gesamten Systems untergraben können, selbst wenn der Angreifer keinen direkten Zugriff auf das Gerät hat. Für FPGAs in ihrer aktuellen Form müssen diese Probleme zuerst gelöst werden, bevor man sie mit mehreren Benutzern oder mit Zugriff von Drittanbietern sicher verwenden kann. In Veröffentlichungen die nicht Teil dieser Arbeit sind wurden bereits einige erste Gegenmaßnahmen untersucht

Producing Trustworthy Hardware Using Untrusted Components, Personnel and Resources

Computer security is a full-system property, and attackers will always go after the weakest link in a system. In modern computer systems, the hardware supply chain is an obvious and vulnerable point of attack. The ever-increasing complexity of hardware systems, along with the globalization of the hardware supply chain, has made it unreasonable to trust hardware. Hardware-based attacks, known as backdoors, are easy to implement and can undermine the security of systems built on top of compromised hardware. Operating systems and other software can only be secure if they can trust the underlying hardware systems. The full supply chain for creating hardware includes multiple processes, which are often addressed in disparate threads of research, but which we consider as one unified process. On the front-end side, there is the soft design of hardware, along with validation and synthesis, to ultimately create a netlist, the document that defines the physical layout of hardware. On the back-end side, there is a physical fabrication process, where a chip is produced at a foundry from a supplied netlist, followed in some cases by post-fabrication testing. Producing a trustworthy chip means securing the process from the early design stages through to the post-fabrication tests. We propose, implement and analyze a series of methods for making the hardware supply chain resilient against a wide array of known and possible attacks. These methods allow for the design and fabrication of hardware using untrustworthy personnel, designs, tools and resources, while protecting the final product from large classes of attacks, some known previously and some discovered and taxonomized in this work. The overarching idea in this work is to take a full-process view of the hardware supply chain. We begin by securing the hardware design and synthesis processes uses a defense-in-depth approach. We combine this work with foundry-side techniques to prevent malicious modifications and counterfeiting, and finally apply novel attestation techniques to ensure that hardware is trustworthy when it reaches users. For our design-side security approach, we use defense-in-depth because in practice, any security method can potentially subverted, and defense-in-depth is the best way to handle that assumption. Our approach involves three independent steps. The first is a functional analysis tool (called FANCI), applied statically to designs during the coding and validation stages to remove any malicious circuits. The second step is to include physical security circuits that operate at runtime. These circuits, which we call trigger obfuscation circuits, scramble data at the microarchitectural level so that any hardware backdoors remaining in the design cannot be triggered at runtime. The third and final step is to include a runtime monitoring system that detects any backdoor payloads that might have been achieved despite the previous two steps. We design two different versions of this monitoring system. The first, TrustNet, is extremely lightweight and protects against an important class of attacks called emitter backdoors. The second, DataWatch, is slightly more heavyweight (though still efficient and low overhead) that can catch a wider variety of attacks and can be adapted to protect against nearly any type of digital payload. We taxonomize the types of attacks that are possible against each of the three steps of our defense-in-depth system and show that each defense provides strong coverage with low (or negligible) overheads to performance, area and power consumption. For our foundry-side security approach, we develop the first foundry-side defense system that is aware of design-side security. We create a power-based side-channel, called a beacon. This beacon is essentially a benign backdoor. It can be turned on by a special key (not provided to the foundry), allowing for security attestation during post-fabrication testing. By designing this beacon into the design itself, the beacon requires neither keys nor storage, and as such exists in the final chip purely by virtue of existing in the netlist. We further obfuscate the netlist itself, rendering the task of reverse engineering the beacon (for a foundry-side adversary) intractable. Both the inclusion of the beacon and the obfuscation process add little to area and power costs and have no impact on performance. All together, these methods provide a foundation on which hardware security can be developed and enhanced. They are low overhead and practical, making them suitable for inclusion in next generation hardware. Moving forward, the criticality of having trustworthy hardware can only increase. Ensuring that the hardware supply chain can be trusted in the face of sophisticated adversaries is vital. Both hardware design and hardware fabrication are increasingly international processes, and we believe continuing with this unified approach is the correct path for future research. In order for companies and governments to place trust in mission-critical hardware, it is necessary for hardware to be certified as secure and trustworthy. The methods we propose can be the first steps toward making this certification a reality

Runtime Monitoring for Dependable Hardware Design

Mit dem Voranschreiten der Technologieskalierung und der Globalisierung der Produktion von integrierten Schaltkreisen eröffnen sich eine Fülle von Schwachstellen bezüglich der Verlässlichkeit von Computerhardware. Jeder Mikrochip wird aufgrund von Produktionsschwankungen mit einem einzigartigen Charakter geboren, welcher sich durch seine Arbeitsbedingungen, Belastung und Umgebung in individueller Weise entwickelt. Daher sind deterministische Modelle, welche zur Entwurfszeit die Verlässlichkeit prognostizieren, nicht mehr ausreichend um Integrierte Schaltkreise mit Nanometertechnologie sinnvoll abbilden zu können. Der Bedarf einer Laufzeitanalyse des Zustandes steigt und mit ihm die notwendigen Maßnahmen zum Erhalt der Zuverlässigkeit. Transistoren sind anfällig für auslastungsbedingte Alterung, die die Laufzeit der Schaltung erhöht und mit ihr die Möglichkeit einer Fehlberechnung. Hinzu kommen spezielle Abläufe die das schnelle Altern des Chips befördern und somit seine zuverlässige Lebenszeit reduzieren. Zusätzlich können strahlungsbedingte Laufzeitfehler (Soft-Errors) des Chips abnormales Verhalten kritischer Systeme verursachen. Sowohl das Ausbreiten als auch das Maskieren dieser Fehler wiederum sind abhängig von der Arbeitslast des Systems. Fabrizierten Chips können ebenfalls vorsätzlich während der Produktion boshafte Schaltungen, sogenannte Hardwaretrojaner, hinzugefügt werden. Dies kompromittiert die Sicherheit des Chips. Da diese Art der Manipulation vor ihrer Aktivierung kaum zu erfassen ist, ist der Nachweis von Trojanern auf einem Chip direkt nach der Produktion extrem schwierig. Die Komplexität dieser Verlässlichkeitsprobleme machen ein einfaches Modellieren der Zuverlässigkeit und Gegenmaßnahmen ineffizient. Sie entsteht aufgrund verschiedener Quellen, eingeschlossen der Entwicklungsparameter (Technologie, Gerät, Schaltung und Architektur), der Herstellungsparameter, der Laufzeitauslastung und der Arbeitsumgebung. Dies motiviert das Erforschen von maschinellem Lernen und Laufzeitmethoden, welche potentiell mit dieser Komplexität arbeiten können. In dieser Arbeit stellen wir Lösungen vor, die in der Lage sind, eine verlässliche Ausführung von Computerhardware mit unterschiedlichem Laufzeitverhalten und Arbeitsbedingungen zu gewährleisten. Wir entwickelten Techniken des maschinellen Lernens um verschiedene Zuverlässigkeitseffekte zu modellieren, zu überwachen und auszugleichen. Verschiedene Lernmethoden werden genutzt, um günstige Überwachungspunkte zur Kontrolle der Arbeitsbelastung zu finden. Diese werden zusammen mit Zuverlässigkeitsmetriken, aufbauend auf Ausfallsicherheit und generellen Sicherheitsattributen, zum Erstellen von Vorhersagemodellen genutzt. Des Weiteren präsentieren wir eine kosten-optimierte Hardwaremonitorschaltung, welche die Überwachungspunkte zur Laufzeit auswertet. Im Gegensatz zum aktuellen Stand der Technik, welcher mikroarchitektonische Überwachungspunkte ausnutzt, evaluieren wir das Potential von Arbeitsbelastungscharakteristiken auf der Logikebene der zugrundeliegenden Hardware. Wir identifizieren verbesserte Features auf Logikebene um feingranulare Laufzeitüberwachung zu ermöglichen. Diese Logikanalyse wiederum hat verschiedene Stellschrauben um auf höhere Genauigkeit und niedrigeren Overhead zu optimieren. Wir untersuchten die Philosophie, Überwachungspunkte auf Logikebene mit Hilfe von Lernmethoden zu identifizieren und günstigen Monitore zu implementieren um eine adaptive Vorbeugung gegen statisches Altern, dynamisches Altern und strahlungsinduzierte Soft-Errors zu schaffen und zusätzlich die Aktivierung von Hardwaretrojanern zu erkennen. Diesbezüglich haben wir ein Vorhersagemodell entworfen, welches den Arbeitslasteinfluss auf alterungsbedingte Verschlechterungen des Chips mitverfolgt und dazu genutzt werden kann, dynamisch zur Laufzeit vorbeugende Techniken, wie Task-Mitigation, Spannungs- und Frequenzskalierung zu benutzen. Dieses Vorhersagemodell wurde in Software implementiert, welche verschiedene Arbeitslasten aufgrund ihrer Alterungswirkung einordnet. Um die Widerstandsfähigkeit gegenüber beschleunigter Alterung sicherzustellen, stellen wir eine Überwachungshardware vor, welche einen Teil der kritischen Flip-Flops beaufsichtigt, nach beschleunigter Alterung Ausschau hält und davor warnt, wenn ein zeitkritischer Pfad unter starker Alterungsbelastung steht. Wir geben die Implementierung einer Technik zum Reduzieren der durch das Ausführen spezifischer Subroutinen auftretenden Belastung von zeitkritischen Pfaden. Zusätzlich schlagen wir eine Technik zur Abschätzung von online Soft-Error-Schwachstellen von Speicherarrays und Logikkernen vor, welche auf der Überwachung einer kleinen Gruppe Flip-Flops des Entwurfs basiert. Des Weiteren haben wir eine Methode basierend auf Anomalieerkennung entwickelt, um Arbeitslastsignaturen von Hardwaretrojanern während deren Aktivierung zur Laufzeit zu erkennen und somit eine letzte Verteidigungslinie zu bilden. Basierend auf diesen Experimenten demonstriert diese Arbeit das Potential von fortgeschrittener Feature-Extraktion auf Logikebene und lernbasierter Vorhersage basierend auf Laufzeitdaten zur Verbesserung der Zuverlässigkeit von Harwareentwürfen

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

Security techniques for sensor systems and the Internet of Things

Sensor systems are becoming pervasive in many domains, and are recently being generalized by the Internet of Things (IoT). This wide deployment, however, presents significant security issues. We develop security techniques for sensor systems and IoT, addressing all security management phases. Prior to deployment, the nodes need to be hardened. We develop nesCheck, a novel approach that combines static analysis and dynamic checking to efficiently enforce memory safety on TinyOS applications. As security guarantees come at a cost, determining which resources to protect becomes important. Our solution, OptAll, leverages game-theoretic techniques to determine the optimal allocation of security resources in IoT networks, taking into account fixed and variable costs, criticality of different portions of the network, and risk metrics related to a specified security goal. Monitoring IoT devices and sensors during operation is necessary to detect incidents. We design Kalis, a knowledge-driven intrusion detection technique for IoT that does not target a single protocol or application, and adapts the detection strategy to the network features. As the scale of IoT makes the devices good targets for botnets, we design Heimdall, a whitelist-based anomaly detection technique for detecting and protecting against IoT-based denial of service attacks. Once our monitoring tools detect an attack, determining its actual cause is crucial to an effective reaction. We design a fine-grained analysis tool for sensor networks that leverages resident packet parameters to determine whether a packet loss attack is node- or link-related and, in the second case, locate the attack source. Moreover, we design a statistical model for determining optimal system thresholds by exploiting packet parameters variances. With our techniques\u27 diagnosis information, we develop Kinesis, a security incident response system for sensor networks designed to recover from attacks without significant interruption, dynamically selecting response actions while being lightweight in communication and energy overhead