Penelope: The NBTI-aware processor

Transistors consist of lower number of atoms with every technology generation. Such atoms may be displaced due to the stress caused by high temperature, frequency and current, leading to failures. NBTI (negative bias temperature instability) is one of the most important sources of failure affecting transistors. NBTI degrades PMOS transistors whenever the voltage at the gate is negative (logic inputPeer ReviewedPostprint (published version

Refueling: Preventing wire degradation due to electromigration

Electromigration is a major source of wire and via failure. Refueling undoes EM for bidirectional wires and power/ground grids-some of a chip's most vulnerable wires. Refueling exploits EM's self-healing effect by balancing the amount of current flowing in both directions of a wire. It can significantly extend a wire's lifetime while reducing the chip area devoted to wires.Peer ReviewedPostprint (published version

Soft-error resilient on-chip memory structures

Soft errors induced by energetic particle strikes in on-chip memory structures, such as L1 data/instruction caches and register files, have become an increasing challenge in designing new generation reliable microprocessors. Due to their transient/random nature, soft errors cannot be captured by traditional verification and testing process due to the irrelevancy to the correctness of the logic. This dissertation is thus focusing on the reliability characterization and cost-effective reliable design of on-chip memories against soft errors. Due to various performance, area/size, and energy constraints in various target systems, many existing unoptimized protection schemes on cache memories may eventually prove significantly inadequate and ineffective. This work develops new lifetime models for data and tag arrays residing in both the data and instruction caches. These models facilitate the characterization of cache vulnerability of the stored items at various lifetime phases. The design methodology is further exemplified by the proposed reliability schemes targeting at specific vulnerable phases. Benchmarking is carried out to showcase the effectiveness of these approaches. The tag array demands high reliability against soft errors while the data array is fully protected in on-chip caches, because of its crucial importance to the correctness of cache accesses. Exploiting the address locality of memory accesses, this work proposes a Tag Replication Buffer (TRB) to protect information integrity of the tag array in the data cache with low performance, energy and area overheads. To provide a comprehensive evaluation of the tag array reliability, this work also proposes a refined evaluation metric, detected-without-replica-TVF (DOR-TVF), which combines the TVF and access-with-replica (AWR) analysis. Based on the DOR-TVF analysis, a TRB scheme with early write-back (TRB-EWB) is proposed, which achieves a zero DOR-TVF at a negligible performance overhead. Recent research, as well as the proposed optimization schemes in this cache vulnerability study, have focused on the design of cost-effective reliable data caches in terms of performance, energy, and area overheads based on the assumption of fixed error rates. However, for systems in operating environments that vary with time or location, those schemes will be either insufficient or over-designed for the changing error rates. This work explores the design of a self-adaptive reliable data cache that dynamically adapts its employed reliability schemes to the changing operating environments in order to maintain a target reliability. The experimental evaluation shows that the self-adaptive data cache achieves similar reliability to a cache protected by the most reliable scheme, while simultaneously minimizing the performance and power overheads. Besides the data/instruction caches, protecting the register file and its data buses is crucial to reliable computing in high-performance microprocessors. Since the register file is in the critical path of the processor pipeline, any reliable design that increases either the pressure on the register file or the register file access latency is not desirable. This work proposes to exploit narrow-width register values, which represent the majority of generated values, for making the duplicates within the same register data item. A detailed architectural vulnerability factor (AVF) analysis shows that this in-register duplication (IRD) scheme significantly reduces the AVF in the register file compared to the conventional design. The experimental evaluation also shows that IRD provides superior read-with-duplicate (RWD) and error detection/recovery rates under heavy error injection as compared to previous reliability schemes, while only incurring a small power overhead. By integrating the proposed reliable designs in data/instruction caches and register files, the vulnerability of the entire microprocessor is dramatically reduced. The new lifetime model, the self-adaptive design and the narrow-width value duplication scheme proposed in this work can also provide guidance to architects toward highly efficient reliable system design

Exploiting Inter- and Intra-Memory Asymmetries for Data Mapping in Hybrid Tiered-Memories

Modern computing systems are embracing hybrid memory comprising of DRAM and non-volatile memory (NVM) to combine the best properties of both memory technologies, achieving low latency, high reliability, and high density. A prominent characteristic of DRAM-NVM hybrid memory is that it has NVM access latency much higher than DRAM access latency. We call this inter-memory asymmetry. We observe that parasitic components on a long bitline are a major source of high latency in both DRAM and NVM, and a significant factor contributing to high-voltage operations in NVM, which impact their reliability. We propose an architectural change, where each long bitline in DRAM and NVM is split into two segments by an isolation transistor. One segment can be accessed with lower latency and operating voltage than the other. By introducing tiers, we enable non-uniform accesses within each memory type (which we call intra-memory asymmetry), leading to performance and reliability trade-offs in DRAM-NVM hybrid memory. We extend existing NVM-DRAM OS in three ways. First, we exploit both inter- and intra-memory asymmetries to allocate and migrate memory pages between the tiers in DRAM and NVM. Second, we improve the OS's page allocation decisions by predicting the access intensity of a newly-referenced memory page in a program and placing it to a matching tier during its initial allocation. This minimizes page migrations during program execution, lowering the performance overhead. Third, we propose a solution to migrate pages between the tiers of the same memory without transferring data over the memory channel, minimizing channel occupancy and improving performance. Our overall approach, which we call MNEME, to enable and exploit asymmetries in DRAM-NVM hybrid tiered memory improves both performance and reliability for both single-core and multi-programmed workloads.Comment: 15 pages, 29 figures, accepted at ACM SIGPLAN International Symposium on Memory Managemen

Techniques for Aging, Soft Errors and Temperature to Increase the Reliability of Embedded On-Chip Systems

This thesis investigates the challenge of providing an abstracted, yet sufficiently accurate reliability estimation for embedded on-chip systems. In addition, it also proposes new techniques to increase the reliability of register files within processors against aging effects and soft errors. It also introduces a novel thermal measurement setup that perspicuously captures the infrared images of modern multi-core processors

Improving the Performance and Endurance of Persistent Memory with Loose-Ordering Consistency

Persistent memory provides high-performance data persistence at main memory. Memory writes need to be performed in strict order to satisfy storage consistency requirements and enable correct recovery from system crashes. Unfortunately, adhering to such a strict order significantly degrades system performance and persistent memory endurance. This paper introduces a new mechanism, Loose-Ordering Consistency (LOC), that satisfies the ordering requirements at significantly lower performance and endurance loss. LOC consists of two key techniques. First, Eager Commit eliminates the need to perform a persistent commit record write within a transaction. We do so by ensuring that we can determine the status of all committed transactions during recovery by storing necessary metadata information statically with blocks of data written to memory. Second, Speculative Persistence relaxes the write ordering between transactions by allowing writes to be speculatively written to persistent memory. A speculative write is made visible to software only after its associated transaction commits. To enable this, our mechanism supports the tracking of committed transaction ID and multi-versioning in the CPU cache. Our evaluations show that LOC reduces the average performance overhead of memory persistence from 66.9% to 34.9% and the memory write traffic overhead from 17.1% to 3.4% on a variety of workloads.Comment: This paper has been accepted by IEEE Transactions on Parallel and Distributed System

Improving Phase Change Memory Performance with Data Content Aware Access

A prominent characteristic of write operation in Phase-Change Memory (PCM) is that its latency and energy are sensitive to the data to be written as well as the content that is overwritten. We observe that overwriting unknown memory content can incur significantly higher latency and energy compared to overwriting known all-zeros or all-ones content. This is because all-zeros or all-ones content is overwritten by programming the PCM cells only in one direction, i.e., using either SET or RESET operations, not both. In this paper, we propose data content aware PCM writes (DATACON), a new mechanism that reduces the latency and energy of PCM writes by redirecting these requests to overwrite memory locations containing all-zeros or all-ones. DATACON operates in three steps. First, it estimates how much a PCM write access would benefit from overwriting known content (e.g., all-zeros, or all-ones) by comprehensively considering the number of set bits in the data to be written, and the energy-latency trade-offs for SET and RESET operations in PCM. Second, it translates the write address to a physical address within memory that contains the best type of content to overwrite, and records this translation in a table for future accesses. We exploit data access locality in workloads to minimize the address translation overhead. Third, it re-initializes unused memory locations with known all-zeros or all-ones content in a manner that does not interfere with regular read and write accesses. DATACON overwrites unknown content only when it is absolutely necessary to do so. We evaluate DATACON with workloads from state-of-the-art machine learning applications, SPEC CPU2017, and NAS Parallel Benchmarks. Results demonstrate that DATACON significantly improves system performance and memory system energy consumption compared to the best of performance-oriented state-of-the-art techniques.Comment: 18 pages, 21 figures, accepted at ACM SIGPLAN International Symposium on Memory Management (ISMM