Nonphotolithographic nanoscale memory density prospects

Technologies are now emerging to construct molecular-scale electronic wires and switches using bottom-up self-assembly. This opens the possibility of constructing nanoscale circuits and memories where active devices are just a few nanometers square and wire pitches may be on the order of ten nanometers. The features can be defined at this scale without using photolithography. The available assembly techniques have relatively high defect rates compared to conventional lithographic integrated circuits and can only produce very regular structures. Nonetheless, with proper memory organization, it is reasonable to expect these technologies to provide memory densities in excess of 10/sup 11/ b/cm/sup 2/ with modest active power requirements under 0.6 W/Tb/s for random read operations

Flash@Hebburn Urban Art in the New Century

The publication of Flash@Hebburn, explores the creation of the public art installation Flash@Hebburn featuring light and electricity, by Charles Quick, on the banks of the River Tyne at Hebburn Riverside Park in South Tyneside, which spanned a period of seven and a half years and was inaugurated on March 9th 2009. It extensively documents the testing, making and installing of a public art installation that resembles a technical functional placement, which serves to evoke a largely post-industrial site without resorting to nostalgia, while strongly relating to the community where it is placed. Jonthan Vickery’s essay, Infrastructures: Creating Flash@Hebburn, places the work not only in its context of site and its relation to the audience but also in the development of an art world discourse on new urban arts. This is supported by an interview with the artist by Dr John Wood, Henry Moore Institute which discusses the project as a piece of art work in relationship to other contemporary works the artist and others have carried out

Architectural Techniques to Enable Reliable and Scalable Memory Systems

High capacity and scalable memory systems play a vital role in enabling our desktops, smartphones, and pervasive technologies like Internet of Things (IoT). Unfortunately, memory systems are becoming increasingly prone to faults. This is because we rely on technology scaling to improve memory density, and at small feature sizes, memory cells tend to break easily. Today, memory reliability is seen as the key impediment towards using high-density devices, adopting new technologies, and even building the next Exascale supercomputer. To ensure even a bare-minimum level of reliability, present-day solutions tend to have high performance, power and area overheads. Ideally, we would like memory systems to remain robust, scalable, and implementable while keeping the overheads to a minimum. This dissertation describes how simple cross-layer architectural techniques can provide orders of magnitude higher reliability and enable seamless scalability for memory systems while incurring negligible overheads.Comment: PhD thesis, Georgia Institute of Technology (May 2017

Balancing reliability, cost, and performance tradeoffs with FreeFault

Abstract—Memory errors have been a major source of system failures and fault rates may rise even further as memory continues to scale. This increasing fault rate, especially when combined with advent of integrated on-package memories, may exceed the capabilities of traditional fault tolerance mecha-nisms or significantly increase their overhead. In this paper, we present FreeFault as a hardware-only, transparent, and nearly-free resilience mechanism that is implemented entirely within a processor and can tolerate the majority of DRAM faults. FreeFault repurposes portions of the last-level cache for storing retired memory regions and augments a hardware memory scrubber to monitor memory health and aid retirement decisions. Because it relies on existing structures (cache associativity) for retirement/remapping type repair, FreeFault has essentially no hardware overhead. Because it requires a very modest portion of the cache (as small as 8KB) to cover a large fraction of DRAM faults, FreeFault has almost no impact on performance. We explain how FreeFault adds an attractive layer in an overall resilience scheme of highly-reliable and highly-available systems by delaying, and even entirely avoiding, calling upon software to make tradeoff decisions between memory capacity, performance, and reliability. I

NASA space station automation: AI-based technology review

Research and Development projects in automation for the Space Station are discussed. Artificial Intelligence (AI) based automation technologies are planned to enhance crew safety through reduced need for EVA, increase crew productivity through the reduction of routine operations, increase space station autonomy, and augment space station capability through the use of teleoperation and robotics. AI technology will also be developed for the servicing of satellites at the Space Station, system monitoring and diagnosis, space manufacturing, and the assembly of large space structures