A Review of Bayesian Methods in Electronic Design Automation

The utilization of Bayesian methods has been widely acknowledged as a viable solution for tackling various challenges in electronic integrated circuit (IC) design under stochastic process variation, including circuit performance modeling, yield/failure rate estimation, and circuit optimization. As the post-Moore era brings about new technologies (such as silicon photonics and quantum circuits), many of the associated issues there are similar to those encountered in electronic IC design and can be addressed using Bayesian methods. Motivated by this observation, we present a comprehensive review of Bayesian methods in electronic design automation (EDA). By doing so, we hope to equip researchers and designers with the ability to apply Bayesian methods in solving stochastic problems in electronic circuits and beyond.Comment: 24 pages, a draft version. We welcome comments and feedback, which can be sent to [email protected]

Distributionally Robust Circuit Design Optimization under Variation Shifts

Due to the significant process variations, designers have to optimize the statistical performance distribution of nano-scale IC design in most cases. This problem has been investigated for decades under the formulation of stochastic optimization, which minimizes the expected value of a performance metric while assuming that the distribution of process variation is exactly given. This paper rethinks the variation-aware circuit design optimization from a new perspective. First, we discuss the variation shift problem, which means that the actual density function of process variations almost always differs from the given model and is often unknown. Consequently, we propose to formulate the variation-aware circuit design optimization as a distributionally robust optimization problem, which does not require the exact distribution of process variations. By selecting an appropriate uncertainty set for the probability density function of process variations, we solve the shift-aware circuit optimization problem using distributionally robust Bayesian optimization. This method is validated with both a photonic IC and an electronics IC. Our optimized circuits show excellent robustness against variation shifts: the optimized circuit has excellent performance under many possible distributions of process variations that differ from the given statistical model. This work has the potential to enable a new research direction and inspire subsequent research at different levels of the EDA flow under the setting of variation shift.Comment: accepted by ICCAD 2023, 8 page

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

Stochastic Yield Analysis of Rare Failure Events in High-Dimensional Variation Space

As semiconductor industry kept shrinking the feature size to nanometer scale, circuit reliability has become an area of growing concern due to the uncertainty introduced by process variations. For highly-replicated standard cells, the failure event for each individual component must be extremely rare in order to maintain sufficiently high yield rate. Existing yield analysis approaches works fine at low dimension, but less effective either when there are a large amount of circuit parameters, or when the failure samples are distributed in multiple regions. In this thesis, four novel high sigma analysis approaches have been proposed. First, we propose an adaptive importance sampling (AIS) algorithm. AIS has several iterations of sampling region adjustments, while existing methods pre-decide a static sampling distribution. At each iteration, AIS generates samples from current proposed distribution. Next, AIS carefully assigns weight to each sample based on its tilted occurrence probability between failure region and current failure region distribution. Then we design two adaptive frameworks based on Resampling and population Metropolis-Hastings (MH) to iteratively search for failure regions. Second, we develop an Adaptive Clustering and Sampling (ACS) method to estimate the failure rate of high-dimensional and multi-failure-region circuit cases. The basic idea of the algorithm is to cluster failure samples and build global sampling distribution at each iteration. Specifically, in clustering step, we propose a multi-cone clustering method, which partitions the parametric space and clusters failure samples. Then global sampling distribution is constructed from a set of weighted Gaussian distributions. Next, we calculate importance weight for each sample based on the discrepancy between sampling distribution and target distribution. Failure probability is updated at the end of each iteration. This clustering and sampling procedure proceeds iteratively until all the failure regions are covered.Moreover, two meta-model based approaches are proposed for high sigma analysis. The Low-Rank Tensor Approximation (LRTA) formulate the meta-model in tensor space by representing a multi-way tensor into a finite sum of rank-one tensor. The polynomial degree of our LRTA model grows linearly with circuit dimension, which makes it especially promising for high-dimensional circuit problems. Then we solve our LRTA model efficiently with a robust greedy algorithm, and calibrate iteratively with an adaptive sampling method. The meta-model based importance sampling (MIS) method utilizes Gaussian Process meta-model to construct quasi-optimal importance sampling distribution, and performs Markov Chain Monte Carlo (MCMC) simulation to generate new samples from the proposed distribution. By updating our global Importance Sampling estimator in an iterated framework, MIS leads to better efficiency and higher accuracy than traditional importance sampling methods. Experiment results validate that the proposed approaches are 3 orders faster than Monte Carlo, and more accurate than both academia solutions such as importance sampling and classification based methods, and industrial solutions such as mixture IS used by Intel

Algorithm and Hardware Co-Design for Local/Edge Computing

Advances in VLSI manufacturing and design technology over the decades have created many computing paradigms for disparate computing needs. With concerns for transmission cost, security, latency of centralized computing, edge/local computing are increasingly prevalent in the faster growing sectors like Internet-of-Things (IoT) and other sectors that require energy/connectivity autonomous systems such as biomedical and industrial applications. Energy and power efficient are the main design constraints in local and edge computing. While there exists a wide range of low power design techniques, they are often underutilized in custom circuit designs as the algorithms are developed independent of the hardware. Such compartmentalized design approach fails to take advantage of the many compatible algorithmic and hardware techniques that can improve the efficiency of the entire system. Algorithm hardware co-design is to explore the design space with whole stack awareness. The main goal of the algorithm hardware co-design methodology is the enablement and improvement of small form factor edge and local VLSI systems operating under strict constraints of area and energy efficiency. This thesis presents selected works of application specific digital and mixed-signal integrated circuit designs. The application space ranges from implantable biomedical devices to edge machine learning acceleration