Phase Locked Loop Test Methodology

Phase locked loops are incorporated into almost every large-scale mixed signal and digital system on chip (SOC). Various types of PLL architectures exist including fully analogue, fully digital, semi-digital, and software based. Currently the most commonly used PLL architecture for SOC environments and chipset applications is the Charge-Pump (CP) semi-digital type. This architecture is commonly used for clock synthesis applications, such as the supply of a high frequency on-chip clock, which is derived from a low frequency board level clock. In addition, CP-PLL architectures are now frequently used for demanding RF (Radio Frequency) synthesis, and data synchronization applications. On chip system blocks that rely on correct PLL operation may include third party IP cores, ADCs, DACs and user defined logic (UDL). Basically, any on-chip function that requires a stable clock will be reliant on correct PLL operation. As a direct consequence it is essential that the PLL function is reliably verified during both the design and debug phase and through production testing. This chapter focuses on test approaches related to embedded CP-PLLs used for the purpose of clock generation for SOC. However, methods discussed will generally apply to CP-PLLs used for other applications

[[alternative]]Design and IP Implementation of Low-Voltage Low-Power GHz PLL with BIST

計畫編號：NSC91-2215-E032-001研究期間：200208~200307研究經費：889,000[[sponsorship]]行政院國家科學委員

Jitter measurement built-in self-test circuit for phase locked loops

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2005.Includes bibliographical references (p. 77-79).This paper discusses the development of a new type of BIST circuit, the (VDL)2, with the purpose of measuring jitter in IBM's phase locked loops. The (VDL)2, which stands for Variable Vernier Digital Delay Locked Line, implements both cycle-to-cycle and phase jitter measurements, by using a digital delay locked loop and a 60 stage Vernier delay line. This achieves a nominal jitter resolution of 10 ps with a capture range of +/- 150 ps and does so in real time. The proposed application for this circuit is during manufacturing test of the PLL. The circuit is implemented in IBM's 90 nm process and was completed in the PLL and Clocking Development ASIC group at IBM Microelectronics in Essex Junction, Vermont as part of the VI-A program.by Brandon Ray Kam.M.Eng

A built-in self-test technique for high speed analog-to-digital converters

Fundação para a Ciência e a Tecnologia (FCT) - PhD grant (SFRH/BD/62568/2009

Formal Verification and In-Situ Test of Analog and Mixed-Signal Circuits

As CMOS technologies continuously scale down, designing robust analog and mixed-signal (AMS) circuits becomes increasingly difficult. Consequently, there are pressing needs for AMS design checking techniques, more specifically design verification and design for testability (DfT). The purpose of verification is to ensure that the performance of an AMS design meets its specification under process, voltage and temperature (PVT) variations and different working conditions, while DfT techniques aim at embedding testability into the design, by adding auxiliary circuitries for testing purpose. This dissertation focuses on improving the robustness of AMS designs in highly scaled technologies, by developing novel formal verification and in-situ test techniques. Compared with conventional AMS verification that relies more on heuristically chosen simulations, formal verification provides a mathematically rigorous way of checking the target design property. A formal verification framework is proposed that incorporates nonlinear SMT solving techniques and simulation exploration to efficiently verify the dynamic properties of AMS designs. A powerful Bayesian inference based technique is applied to dynamically tradeoff between the costs of simulation and nonlinear SMT. The feasibility and efficacy of the proposed methodology are demonstrated on the verification of lock time specification of a charge-pump PLL. The powerful and low-cost digital processing capabilities of today?s CMOS technologies are enabling many new in-situ test schemes in a mixed-signal environment. First, a novel two-level structure of GRO-PVDL is proposed for on-chip jitter testing of high-speed high-resolution applications with a gated ring oscillator (GRO) at the first level to provide a coarse measurement and a Vernier-style structure at the second level to further measure the residue from the first level with a fine resolution. With the feature of quantization noise shaping, an effective resolution of 0.8ps can be achieved using a 90nm CMOS technology. Second, the reconfigurability of recent all-digital PLL designs is exploited to provide in-situ output jitter test and diagnosis abilities under multiple parametric variations of key analog building blocks. As an extension, an in-situ test scheme is proposed to provide online testing for all-digital PLL based polar transmitters

캘리브레이션이 필요없는 위상고정 루프의 설계

학위논문 (박사)-- 서울대학교 대학원 : 전기·컴퓨터공학부, 2017. 2. 김재하.A PVT-insensitive-bandwidth PLL and a chirp frequency synthesizer PLL are proposed using a constant-relative-gain digitally-controlled oscillator (DCO), a constant-gain time-to-digital converter (TDC), and a simple digital loop filter (DLF) without an explicit calibration or additional circuit components. A digital LC-PLL that realizes a PVT-insensitive loop bandwidth (BW) by using the constant-relative-gain LC-DCO and constant-gain TDC is proposed. In other words, based on ratiometric circuit designs, the LC-DCO can make a fixed percent change to its frequency for a unit change in its digital input and the TDC can maintain a fixed range and resolution measured in reference unit intervals (UIs) across PVT variations. With such LC-DCO and TDC, the proposed PLL can realize a bandwidth which is a constant fraction of the reference frequency even with a simple proportional-integral digital loop filter without any explicit calibration loops. The prototype digital LC-PLL fabricated in a 28-nm CMOS demonstrates a frequency range of 8.38~9.34 GHz and 652-fs,rms integrated jitter from 10-kHz to 1-GHz at 8.84-GHz while dissipating 15.2-mW and occupying 0.24-mm^2. Also, the PLL across three different die samples and supply voltage ranging from 1.0 to 1.2V demonstrates a nearly constant BW at 822-kHz with the variation of ±4.25-% only. A chirp frequency synthesizer PLL (FS-PLL) that is capable of precise triangular frequency modulation using type-III digital LC-PLL architecture for X-band FMCW imaging radar is proposed. By employing a phase-modulating two-point modulation (TPM), constant-gain TDC, and a simple second-order DLF with polarity-alternating frequency ramp estimator, the PLL achieves a gain self-tracking TPM realizing a frequency chirp with fast chirp slope (=chirp BW/chirp period) without increasing frequency errors around the turn-around points, degrading the effective resolution achievable. A prototype chirp FS-PLL fabricated in a 65nm CMOS demonstrates that the PLL can generate a precise triangular chirp profile centered at 8.9-GHz with 940-MHz bandwidth and 28.8-us period with only 1.9-MHz,rms frequency error including the turn-around points and 14.8-mW power dissipation. The achieved 32.63-MHz/us chirp slope is higher than that of FMCW FS-PLLs previously reported by 2.6x.CHAPTER 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.2 THESIS ORGANIZATION 5 CHAPTER 2 CONVENTIONAL PHASE-LOCKED LOOP 7 2.1 CHARGE-PUMP PLL 7 2.1.1 OPERATING PRINCIPLE 7 2.1.2 LOOP DYNAMICS 9 2.2 DIGITAL PLL 10 2.2.1 OPERATING PRINCIPLE 11 2.2.2 LOOP DYNAMICS 12 CHAPTER 3 VARIATIONS ON PHASE-LOCKED LOOP 14 3.1 OSCILLATOR GAIN VARIATION 14 3.1.1 RING VOLTAGE-CONTROLLED OSCILLATOR 15 3.1.2 LC VOLTAGE-CONTROLLED OSCILLATOR 17 3.1.3 LC DIGITALLY-CONTROLLED OSCILLATOR 19 3.2 PHASE DETECTOR GAIN VARIATION 20 3.2.1 LINEAR PHASE DETECTOR 20 3.2.2 LINEAR TIME-TO-DIGITAL CONVERTER 21 CHAPTER 4 PROPOSED DCO AND TDC FOR CALIBRATION-FREE PLL 23 4.1 DIGTALLY-CONTROLLED OSCILLATOR (DCO) 25 4.1.1 OVERVIEW 24 4.1.2 CONSTANT-RELATIVE-GAIN DCO 26 4.2 TIME-TO-DIGITAL CONVERTER (TDC) 28 4.2.1 OVERVIEW 28 4.2.2 CONSTANT-GAIN TDC 30 CHAPTER 5 PVT-INSENSITIVE-BANDWIDTH PLL 35 5.1 OVERVIEW 36 5.2 PRIOR WORKS 37 5.3 PROPOSED PVT-INSENSITIVE-BANDWIDTH PLL 39 5.4 CIRCUIT IMPLEMENTATION 41 5.4.1 CAPACITOR-TUNED LC-DCO 41 5.4.2 TRANSFORMER-TUNED LC-DCO 45 5.4.3 OVERSAMPLING-BASED CONSTANT-GAIN TDC 49 5.4.4 PHASE DIGITAL-TO-ANALOG CONVERTER 52 5.4.5 DIGITAL LOOP FILTER 54 5.4.6 FREQUENCY DIVIDER 55 5.4.7 BANG-BANG PHASE-FREQUENCY DETECTOR 56 5.5 CELL-BASED DESIGN FLOW 57 5.6 MEASUREMENT RESULTS 58 CHAPTER 6 CHIRP FREQUENCY SYNTHESIZER PLL 66 6.1 OVERVIEW 67 6.2 PRIOR WORKS 71 6.3 PROPOSED CHIRP FREQUENCY SYNTHESIZER PLL 75 6.4 CIRCUIT IMPLEMENTATION 83 6.4.1 SECOND-ORDER DIGITAL LOOP FILTER 83 6.4.2 PHASE MODULATOR 84 6.4.3 CONSTANT-GAIN TDC 85 6.4.4 VRACTOR-BASED LC-DCO 87 6.4.5 OVERALL CLOCK CHAIN 90 6.5 MEASUREMENT RESULTS 91 6.6 SIGNAL-TO-NOISE RATIO OF RADAR 98 CHAPTER 7 CONCLUSION 100 BIBLIOGRAPHY 102 초록 109Docto

A time-based approach for multi-GHz embedded mixed-signal characterization and measurement /

The increasingly more sophisticated systems that are nowadays implemented on a single chip are placing stringent requirements on the test industry. New test strategies, equipment, and methodologies need to be developed to sustain the constant increase in demand for consumer and communication electronics. Techniques for built-in-self-test (BIST) and design-for-test (DFT) strategies have been proven to offer more feasible and economical testing solutions.Previous works have been conducted to perform on-chip testing, characterization, and measurement of signals and components. The current thesis advances those techniques on many levels. In terms of performance, an increase of more than an order of magnitude in speed is achieved. 70-GHz (effective sampling) on-chip oscilloscope is reported, compared to 4-GHz and 10-GHz ones in previous state-of-the-art implementations. Power dissipation is another area where the proposed work offer a superior solution compared to previous alternatives. All the proposed circuits do not exceed a few milliWatts of power dissipation, while performing multi-GHz high-speed signal capture at a medium resolution. Finally, and possibly most importantly, all the proposed circuits for test rely on a different form of signal processing; the time-based approach. It is believed that this approach paves the path to a lot of new techniques and circuit design skills that can be investigated more deeply. As an integral part of the time-based processing approach for GHz signal capture, this thesis verifies the advantages of using time amplification. The use of such amplification in the time domain is materialized with experimental results from three specific integrated circuits achieving different tasks in GHz high-speed in-situ signal measurement and characterization. Advantages of using such time-based approach techniques, when combined with the use of a front-end time amplifier, include noise immunity, the use of synthesizable digital cells, and circuit building blocks that track the technology scaling in terms of area and speed

Delay Measurements and Self Characterisation on FPGAs

This thesis examines new timing measurement methods for self delay characterisation of Field-Programmable Gate Arrays (FPGAs) components and delay measurement of complex circuits on FPGAs. Two novel measurement techniques based on analysis of a circuit's output failure rate and transition probability is proposed for accurate, precise and efficient measurement of propagation delays. The transition probability based method is especially attractive, since it requires no modifications in the circuit-under-test and requires little hardware resources, making it an ideal method for physical delay analysis of FPGA circuits. The relentless advancements in process technology has led to smaller and denser transistors in integrated circuits. While FPGA users benefit from this in terms of increased hardware resources for more complex designs, the actual productivity with FPGA in terms of timing performance (operating frequency, latency and throughput) has lagged behind the potential improvements from the improved technology due to delay variability in FPGA components and the inaccuracy of timing models used in FPGA timing analysis. The ability to measure delay of any arbitrary circuit on FPGA offers many opportunities for on-chip characterisation and physical timing analysis, allowing delay variability to be accurately tracked and variation-aware optimisations to be developed, reducing the productivity gap observed in today's FPGA designs. The measurement techniques are developed into complete self measurement and characterisation platforms in this thesis, demonstrating their practical uses in actual FPGA hardware for cross-chip delay characterisation and accurate delay measurement of both complex combinatorial and sequential circuits, further reinforcing their positions in solving the delay variability problem in FPGAs