Interconnect yield analysis and fault tolerance for field programmable gate arrays

Imperial Users onl

Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results

FPGA ARCHITECTURE AND VERIFICATION OF BUILT IN SELF-TEST (BIST) FOR 32-BIT ADDER/SUBTRACTER USING DE0-NANO FPGA AND ANALOG DISCOVERY 2 HARDWARE

The integrated circuit (IC) is an integral part of everyday modern technology, and its application is very attractive to hardware and software design engineers because of its versatility, integration, power consumption, cost, and board area reduction. IC is available in various types such as Field Programming Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), System on Chip (SoC) architecture, Digital Signal Processing (DSP), microcontrollers (μC), and many more. With technology demand focused on faster, low power consumption, efficient IC application, design engineers are facing tremendous challenges in developing and testing integrated circuits that guaranty functionality, high fault coverage, and reliability as the transistor technology is shrinking to the point where manufacturing defects of ICs are affecting yield which associates with the increased cost of the part. The competitive IC market is pressuring manufactures of ICs to develop and market IC in a relatively quick turnaround which in return requires design and verification engineers to develop an integrated self-test structure that would ensure fault-free and the quality product is delivered on the market. 70-80% of IC design is spent on verification and testing to ensure high quality and reliability for the enduser. To test complex and sophisticated IC designs, the verification engineers must produce laborious and costly test fixtures which affect the cost of the part on the competitive market. To avoid increasing the part cost due to yield and test time to the end-user and to keep up with the competitive market many IC design engineers are deviating from complex external test fixture approach and are focusing on integrating Built-in Self-Test (BIST) or Design for Test (DFT) techniques onto IC’s which would reduce time to market but still guarantee high coverage for the product. Understanding the BIST, the architecture, as well as the application of IC, must be understood before developing IC. The architecture of FPGA is elaborated in this paper followed by several BIST techniques and applications of those BIST relative to FPGA, SoC, analog to digital (ADC), or digital to analog converters (DAC) that are integrated on IC. Paper is concluded with verification of BIST for the 32-bit adder/subtracter designed in Quartus II software using the Analog Discovery 2 module as stimulus and DE0-NANO FPGA board for verification

Sustainable Fault-handling Of Reconfigurable Logic Using Throughput-driven Assessment

A sustainable Evolvable Hardware (EH) system is developed for SRAM-based reconfigurable Field Programmable Gate Arrays (FPGAs) using outlier detection and group testing-based assessment principles. The fault diagnosis methods presented herein leverage throughput-driven, relative fitness assessment to maintain resource viability autonomously. Group testing-based techniques are developed for adaptive input-driven fault isolation in FPGAs, without the need for exhaustive testing or coding-based evaluation. The techniques maintain the device operational, and when possible generate validated outputs throughout the repair process. Adaptive fault isolation methods based on discrepancy-enabled pair-wise comparisons are developed. By observing the discrepancy characteristics of multiple Concurrent Error Detection (CED) configurations, a method for robust detection of faults is developed based on pairwise parallel evaluation using Discrepancy Mirror logic. The results from the analytical FPGA model are demonstrated via a self-healing, self-organizing evolvable hardware system. Reconfigurability of the SRAM-based FPGA is leveraged to identify logic resource faults which are successively excluded by group testing using alternate device configurations. This simplifies the system architect\u27s role to definition of functionality using a high-level Hardware Description Language (HDL) and system-level performance versus availability operating point. System availability, throughput, and mean time to isolate faults are monitored and maintained using an Observer-Controller model. Results are demonstrated using a Data Encryption Standard (DES) core that occupies approximately 305 FPGA slices on a Xilinx Virtex-II Pro FPGA. With a single simulated stuck-at-fault, the system identifies a completely validated replacement configuration within three to five positive tests. The approach demonstrates a readily-implemented yet robust organic hardware application framework featuring a high degree of autonomous self-control

Low-overhead fault-tolerant logic for field-programmable gate arrays

While allowing for the fabrication of increasingly complex and efficient circuitry, transistor shrinkage and count-per-device expansion have major downsides: chiefly increased variation, degradation and fault susceptibility. For this reason, design-time consideration of faults will have to be given to increasing numbers of electronic systems in the future to ensure yields, reliabilities and lifetimes remain acceptably high. Many mathematical operators commonly accelerated in hardware are suited to modification resulting in datapath error detection and correction capabilities with far lower area, performance and/or power consumption overheads than those incurred through the utilisation of more established, general-purpose fault tolerance methods such as modular redundancy. Field-programmable gate arrays are uniquely placed to allow further area savings to be made thanks to their dynamic reconfigurability. The majority of the technical work presented within this thesis is based upon a benchmark hardware accelerator---a matrix multiplier---that underwent several evolutions in order to detect and correct faults manifesting along its datapath at runtime. In the first instance, fault detectability in excess of 99% was achieved in return for 7.87% additional area and 45.5% extra latency. In the second, the ability to correct errors caused by those faults was added at the cost of 4.20% more area, while 50.7% of this---and 46.2% of the previously incurred latency overhead---was removed through the introduction of partial reconfiguration in the third. The fourth demonstrates further reductions in both area and performance overheads---of 16.7% and 8.27%, respectively---through systematic data width reduction by allowing errors of less than ±0.5% of the maximum output value to propagate.Open Acces

Improving reconfigurable systems reliability by combining periodical test and redundancy techniques: a case study

This paper revises and introduces to the field of reconfigurable computer systems, some traditional techniques used in the fields of fault-tolerance and testing of digital circuits. The target area is that of on-board spacecraft electronics, as this class of application is a good candidate for the use of reconfigurable computing technology. Fault tolerant strategies are used in order for the system to adapt itself to the severe conditions found in space. In addition, the paper describes some problems and possible solutions for the use of reconfigurable components, based on programmable logic, in space applications

Delay Measurements and Self Characterisation on FPGAs

This thesis examines new timing measurement methods for self delay characterisation of Field-Programmable Gate Arrays (FPGAs) components and delay measurement of complex circuits on FPGAs. Two novel measurement techniques based on analysis of a circuit's output failure rate and transition probability is proposed for accurate, precise and efficient measurement of propagation delays. The transition probability based method is especially attractive, since it requires no modifications in the circuit-under-test and requires little hardware resources, making it an ideal method for physical delay analysis of FPGA circuits. The relentless advancements in process technology has led to smaller and denser transistors in integrated circuits. While FPGA users benefit from this in terms of increased hardware resources for more complex designs, the actual productivity with FPGA in terms of timing performance (operating frequency, latency and throughput) has lagged behind the potential improvements from the improved technology due to delay variability in FPGA components and the inaccuracy of timing models used in FPGA timing analysis. The ability to measure delay of any arbitrary circuit on FPGA offers many opportunities for on-chip characterisation and physical timing analysis, allowing delay variability to be accurately tracked and variation-aware optimisations to be developed, reducing the productivity gap observed in today's FPGA designs. The measurement techniques are developed into complete self measurement and characterisation platforms in this thesis, demonstrating their practical uses in actual FPGA hardware for cross-chip delay characterisation and accurate delay measurement of both complex combinatorial and sequential circuits, further reinforcing their positions in solving the delay variability problem in FPGAs

Reliable and Fault-Resilient Schemes for Efficient Radix-4 Complex Division

Complex division is commonly used in various applications in signal processing and control theory including astronomy and nonlinear RF measurements. Nevertheless, unless reliability and assurance are embedded into the architectures of such structures, the suboptimal (and thus erroneous) results could undermine the objectives of such applications. As such, in this thesis, we present schemes to provide complex number division architectures based on (Sweeney, Robertson, and Tocher) SRT-division with fault diagnosis mechanisms. Different fault resilient architectures are proposed in this thesis which can be tailored based on the eventual objectives of the designs in terms of area and time requirements, among which we pinpoint carefully the schemes based on recomputing with shifted operands (RESO) to be able to detect both natural and malicious faults and with proper modification achieve high throughputs. The design also implements a minimized look up table approach which favors in error detection based designs and provides high fault coverage with relatively-low overhead. Additionally, to benchmark the effectiveness of the proposed schemes, extensive fault diagnosis assessments are performed for the proposed designs through fault simulations and FPGA implementations; the design is implemented on Xilinx Spartan-VI and Xilinx Virtex-VI FPGA families

Développement des techniques de test et de diagnostic pour les FPGA hiérarchique de type mesh

The evolution trend of shrinking feature size and increasing complexity in modern electronics is being slowed down due to physical limits that generate numerous imperfections and defects during fabrication steps or projected life time of the chip. Field Programmable Gate Arrays (FPGAs) are used in complex digital systems mainly due to their reconfigurability and shorter time-to-market. To maintain a high reliability of such systems, FPGAs should be tested thoroughly for defects. FPGA architecture optimization for area saving and better signal routability is an ongoing process which directly impacts the overall FPGA testability, hence the reliability. This thesis presents a complete strategy for test and diagnosis of manufacturing defects in mesh-based FPGAs containing a novel multilevel interconnects topology which promises to provide better area and routability. Efficiency of the proposed test schemes is analyzed in terms of test cost, respective fault coverage and diagnostic resolution.L’évolution tendant à réduire la taille et augmenter la complexité des circuits électroniques modernes, est en train de ralentir du fait des limitations technologiques, qui génèrent beaucoup de d’imperfections et de defaults durant la fabrication ou la durée de vie de la puce. Les FPGAs sont utilisés dans les systèmes numériques complexes, essentiellement parce qu’ils sont reconfigurables et rapide à commercialiser. Pour garder une grande fiabilité de tels systèmes, les FPGAs doivent être testés minutieusement pour les defaults. L’optimisation de l’architecture des FPGAs pour l’économie de surface et une meilleure routabilité est un processus continue qui impacte directement la testabilité globale et de ce fait, la fiabilité. Cette thèse présente une stratégie complète pour le test et le diagnostique des defaults de fabrication des “mesh-based FPGA” contenant une nouvelle topologie d’interconnections à plusieurs niveaux, ce qui promet d’apporter une meilleure routabilité. Efficacité des schémas proposes est analysée en termes de temps de test, couverture de faute et résolution de diagnostique