ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES

Enclosed in this thesis work it can be found the results of a three years long research activity performed during the XXIV-th cycle of the Ph.D. school in Engineering Science of the Università degli Studi di Ferrara. The topic of this work is concerned about the electrical characterization, physics, modeling and reliability of innovative non-volatile memories, addressing most of the proposed alternative to the floating-gate based memories which currently are facing a technology dead end. Throughout the chapters of this thesis it will be provided a detailed characterization of the envisioned replacements for the common NOR and NAND Flash technologies into the near future embedded and MPSoCs (Multi Processing System on Chip) systems. In Chapter 1 it will be introduced the non-volatile memory technology with direct reference on nowadays Flash mainstream, providing indications and comments on why the system designers should be forced to change the approach to new memory concepts. In Chapter 2 it will be presented one of the most studied post-floating gate memory technology for MPSoCs: the Phase Change Memory. The results of an extensive electrical characterization performed on these devices led to important discoveries such as the kinematics of the erase operation and potential reliability threats in memory operations. A modeling framework has been developed to support the experimental results and to validate them on projected scaled technology. In Chapter 3 an embedded memory for automotive environment will be shown: the SimpleEE p-channel memory. The characterization of this memory proven the technology robustness providing at the same time new insights on the erratic bits phenomenon largely studied on NOR and NAND counterparts. Chapter 4 will show the research studies performed on a memory device based on the Nano-MEMS concept. This particular memory generation proves to be integrated in very harsh environment such as military applications, geothermal and space avionics. A detailed study on the physical principles underlying this memory will be presented. In Chapter 5 a successor of the standard NAND Flash will be analyzed: the Charge Trapping NAND. This kind of memory shares the same principles of the traditional floating gate technology except for the storage medium which now has been substituted by a discrete nature storage (i.e. silicon nitride traps). The conclusions and the results summary for each memory technology will be provided in Chapter 6. Finally, on Appendix A it will be shown the results of a recently started research activity on the high level reliability memory management exploiting the results of the studies for Phase Change Memories

Development of a COTS-Based Propulsion System Controller for NASA’s Lunar Flashlight CubeSat Mission

The Lunar Flashlight mission is designed to send a 6U CubeSat into lunar orbit with the aim of finding water-ice deposits on the lunar south pole. The Glenn Lightsey Research Group (GLRG) within Georgia Tech’s Space Systems Design Laboratory (SSDL) is developing a low-cost propulsion system controller for this satellite using commercial-off-the-shelf (COTS) parts, with an emphasis on overcoming the harsh environment of lunar orbit through careful architecture and testing. This paper provides in-depth coverage of the Lunar Flashlight Propulsion System (LFPS) controller development and testing processes, showing how an embedded system based on COTS parts can be designed for the intense environment of space. From the high-level requirements architecture to the selection of specific hardware components and software design choices, followed by rigorous environmental testing of the design, radiation and other environmental hardening can be achieved with high confidence

Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs

SRAM-based FPGAs are increasingly relevant in a growing number of safety-critical application fields, ranging from automotive to aerospace. These application fields are characterized by a harsh radiation environment that can cause the occurrence of Single Event Upsets (SEUs) in digital devices. These faults have particularly adverse effects on SRAM-based FPGA systems because not only can they temporarily affect the behaviour of the system by changing the contents of flip-flops or memories, but they can also permanently change the functionality implemented by the system itself, by changing the content of the configuration memory. Designing safety-critical applications requires accurate methodologies to evaluate the system’s sensitivity to SEUs as early as possible during the design process. Moreover it is necessary to detect the occurrence of SEUs during the system life-time. To this purpose test patterns should be generated during the design process, and then applied to the inputs of the system during its operation. In this thesis we propose a set of software tools that could be used by designers of SRAM-based FPGA safety-critical applications to assess the sensitivity to SEUs of the system and to generate test patterns for in-service testing. The main feature of these tools is that they implement a model of SEUs affecting the configuration bits controlling the logic and routing resources of an FPGA device that has been demonstrated to be much more accurate than the classical stuck-at and open/short models, that are commonly used in the analysis of faults in digital devices. By keeping this accurate fault model into account, the proposed tools are more accurate than similar academic and commercial tools today available for the analysis of faults in digital circuits, that do not take into account the features of the FPGA technology.. In particular three tools have been designed and developed: (i) ASSESS: Accurate Simulator of SEuS affecting the configuration memory of SRAM-based FPGAs, a simulator of SEUs affecting the configuration memory of an SRAM-based FPGA system for the early assessment of the sensitivity to SEUs; (ii) UA2TPG: Untestability Analyzer and Automatic Test Pattern Generator for SEUs Affecting the Configuration Memory of SRAM-based FPGAs, a static analysis tool for the identification of the untestable SEUs and for the automatic generation of test patterns for in-service testing of the 100% of the testable SEUs; and (iii) GABES: Genetic Algorithm Based Environment for SEU Testing in SRAM-FPGAs, a Genetic Algorithm-based Environment for the generation of an optimized set of test patterns for in-service testing of SEUs. The proposed tools have been applied to some circuits from the ITC’99 benchmark. The results obtained from these experiments have been compared with results obtained by similar experiments in which we considered the stuck-at fault model, instead of the more accurate model for SEUs. From the comparison of these experiments we have been able to verify that the proposed software tools are actually more accurate than similar tools today available. In particular the comparison between results obtained using ASSESS with those obtained by fault injection has shown that the proposed fault simulator has an average error of 0:1% and a maximum error of 0:5%, while using a stuck-at fault simulator the average error with respect of the fault injection experiment has been 15:1% with a maximum error of 56:2%. Similarly the comparison between the results obtained using UA2TPG for the accurate SEU model, with the results obtained for stuck-at faults has shown an average difference of untestability of 7:9% with a maximum of 37:4%. Finally the comparison between fault coverages obtained by test patterns generated for the accurate model of SEUs and the fault coverages obtained by test pattern designed for stuck-at faults, shows that the former detect the 100% of the testable faults, while the latter reach an average fault coverage of 78:9%, with a minimum of 54% and a maximum of 93:16%

Integrated Circuits and Systems for Smart Sensory Applications

Connected intelligent sensing reshapes our society by empowering people with increasing new ways of mutual interactions. As integration technologies keep their scaling roadmap, the horizon of sensory applications is rapidly widening, thanks to myriad light-weight low-power or, in same cases even self-powered, smart devices with high-connectivity capabilities. CMOS integrated circuits technology is the best candidate to supply the required smartness and to pioneer these emerging sensory systems. As a result, new challenges are arising around the design of these integrated circuits and systems for sensory applications in terms of low-power edge computing, power management strategies, low-range wireless communications, integration with sensing devices. In this Special Issue recent advances in application-specific integrated circuits (ASIC) and systems for smart sensory applications in the following five emerging topics: (I) dedicated short-range communications transceivers; (II) digital smart sensors, (III) implantable neural interfaces, (IV) Power Management Strategies in wireless sensor nodes and (V) neuromorphic hardware

ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES

Enclosed in this thesis work it can be found the results of a three years long research activity performed during the XXIV-th cycle of the Ph.D. school in Engineering Science of the Università degli Studi di Ferrara. The topic of this work is concerned about the electrical characterization, physics, modeling and reliability of innovative non-volatile memories, addressing most of the proposed alternative to the floating-gate based memories which currently are facing a technology dead end. Throughout the chapters of this thesis it will be provided a detailed characterization of the envisioned replacements for the common NOR and NAND Flash technologies into the near future embedded and MPSoCs (Multi Processing System on Chip) systems. In Chapter 1 it will be introduced the non-volatile memory technology with direct reference on nowadays Flash mainstream, providing indications and comments on why the system designers should be forced to change the approach to new memory concepts. In Chapter 2 it will be presented one of the most studied post-floating gate memory technology for MPSoCs: the Phase Change Memory. The results of an extensive electrical characterization performed on these devices led to important discoveries such as the kinematics of the erase operation and potential reliability threats in memory operations. A modeling framework has been developed to support the experimental results and to validate them on projected scaled technology. In Chapter 3 an embedded memory for automotive environment will be shown: the SimpleEE p-channel memory. The characterization of this memory proven the technology robustness providing at the same time new insights on the erratic bits phenomenon largely studied on NOR and NAND counterparts. Chapter 4 will show the research studies performed on a memory device based on the Nano-MEMS concept. This particular memory generation proves to be integrated in very harsh environment such as military applications, geothermal and space avionics. A detailed study on the physical principles underlying this memory will be presented. In Chapter 5 a successor of the standard NAND Flash will be analyzed: the Charge Trapping NAND. This kind of memory shares the same principles of the traditional floating gate technology except for the storage medium which now has been substituted by a discrete nature storage (i.e. silicon nitride traps). The conclusions and the results summary for each memory technology will be provided in Chapter 6. Finally, on Appendix A it will be shown the results of a recently started research activity on the high level reliability memory management exploiting the results of the studies for Phase Change Memories

Embedded electronic systems driven by run-time reconfigurable hardware

Abstract This doctoral thesis addresses the design of embedded electronic systems based on run-time reconfigurable hardware technology –available through SRAM-based FPGA/SoC devices– aimed at contributing to enhance the life quality of the human beings. This work does research on the conception of the system architecture and the reconfiguration engine that provides to the FPGA the capability of dynamic partial reconfiguration in order to synthesize, by means of hardware/software co-design, a given application partitioned in processing tasks which are multiplexed in time and space, optimizing thus its physical implementation –silicon area, processing time, complexity, flexibility, functional density, cost and power consumption– in comparison with other alternatives based on static hardware (MCU, DSP, GPU, ASSP, ASIC, etc.). The design flow of such technology is evaluated through the prototyping of several engineering applications (control systems, mathematical coprocessors, complex image processors, etc.), showing a high enough level of maturity for its exploitation in the industry.Resumen Esta tesis doctoral abarca el diseño de sistemas electrónicos embebidos basados en tecnología hardware dinámicamente reconfigurable –disponible a través de dispositivos lógicos programables SRAM FPGA/SoC– que contribuyan a la mejora de la calidad de vida de la sociedad. Se investiga la arquitectura del sistema y del motor de reconfiguración que proporcione a la FPGA la capacidad de reconfiguración dinámica parcial de sus recursos programables, con objeto de sintetizar, mediante codiseño hardware/software, una determinada aplicación particionada en tareas multiplexadas en tiempo y en espacio, optimizando así su implementación física –área de silicio, tiempo de procesado, complejidad, flexibilidad, densidad funcional, coste y potencia disipada– comparada con otras alternativas basadas en hardware estático (MCU, DSP, GPU, ASSP, ASIC, etc.). Se evalúa el flujo de diseño de dicha tecnología a través del prototipado de varias aplicaciones de ingeniería (sistemas de control, coprocesadores aritméticos, procesadores de imagen, etc.), evidenciando un nivel de madurez viable ya para su explotación en la industria.Resum Aquesta tesi doctoral està orientada al disseny de sistemes electrònics empotrats basats en tecnologia hardware dinàmicament reconfigurable –disponible mitjançant dispositius lògics programables SRAM FPGA/SoC– que contribueixin a la millora de la qualitat de vida de la societat. S’investiga l’arquitectura del sistema i del motor de reconfiguració que proporcioni a la FPGA la capacitat de reconfiguració dinàmica parcial dels seus recursos programables, amb l’objectiu de sintetitzar, mitjançant codisseny hardware/software, una determinada aplicació particionada en tasques multiplexades en temps i en espai, optimizant així la seva implementació física –àrea de silici, temps de processat, complexitat, flexibilitat, densitat funcional, cost i potència dissipada– comparada amb altres alternatives basades en hardware estàtic (MCU, DSP, GPU, ASSP, ASIC, etc.). S’evalúa el fluxe de disseny d’aquesta tecnologia a través del prototipat de varies aplicacions d’enginyeria (sistemes de control, coprocessadors aritmètics, processadors d’imatge, etc.), demostrant un nivell de maduresa viable ja per a la seva explotació a la indústria

Smart polymeric temperature sensors – for biological systems

The damaged brain is vulnerable to increase in brain temperature after a severe head injury. Continuous monitoring of intracranial temperature depicts functionality essential to the treatment of brain injury Many innovations have been made in the biomedical industry relying on electronic implants in treating condition such as traumatic brain injury (TBI) or other cerebral diseases. Hence, a methodical and reliable way to measure the temperature is crucial to assess the patient’s situation. In this investigation, an analysis of various approaches to detect the change in the temperature due to resistance, current-voltage characteristics with respect to time has been evaluated. Also, studies describing various materials used in sensors, their working principles and the results anticipated in these discrete procedures are presented. These smart temperature sensors have provided the accuracy and the stability compared to earlier methods used to detect the change in brain temperature since temperature is one of the most important variables in brain monitoring

Estudio y diseño de dos placas de intercambio de datos de inclinación y posición entre dos cubesats

El grupo de investigación DISEN con sede en el Campus de Terrassa de la UPC está intentando impulsar el proyecto de la implementación de una infraestructura de comunicaciones basada en el enlace óptico de CubeSats. Mediante este tipo de comunicación, se podría obtener un mayor data-rate y un menor consumo de potencia que en los actuales sistemas de radiofrecuencia. Para poder realizar este enlace óptico, es necesario que el rayo láser proveniente de uno de los satélites se centre de forma muy precisa en el foto-detector del otro satélite. Para realizar dicho centrado, ambos satélites deberán conocer a priori la posición e inclinación de ambos, información que deberán intercambiarse mediante radiofrecuencia. El presente TFG versa sobre el diseño del subsistema de intercambio de datos de posición e inclinación entre dos CubeSats. Concretamente, el diseño de dos placas PCB formadas por un módulo GPS, para obtener la posición de los CubeSats; un módulo IMU, para obtener sus actitudes; un módulo de radio UHF, para enviar datos entre los dos CubeSats por radiofrecuencia; y un módulo Bluetooth para poder enlazar el sistema con el ordenador de base. Además, las placas cuentan con un microcontrolador para procesar y almacenar la información de dichos módulos

FLEXIBLE LOW-COST HW/SW ARCHITECTURES FOR TEST, CALIBRATION AND CONDITIONING OF MEMS SENSOR SYSTEMS

During the last years smart sensors based on Micro-Electro-Mechanical systems (MEMS) are widely spreading over various fields as automotive, biomedical, optical and consumer, and nowadays they represent the outstanding state of the art. The reasons of their diffusion is related to the capability to measure physical and chemical information using miniaturized components. The developing of this kind of architectures, due to the heterogeneities of their components, requires a very complex design flow, due to the utilization of both mechanical parts typical of the MEMS sensor and electronic components for the interfacing and the conditioning. In these kind of systems testing activities gain a considerable importance, and they concern various phases of the life-cycle of a MEMS based system. Indeed, since the design phase of the sensor, the validation of the design by the extraction of characteristic parameters is important, because they are necessary to design the sensor interface circuit. Moreover, this kind of architecture requires techniques for the calibration and the evaluation of the whole system in addition to the traditional methods for the testing of the control circuitry. The first part of this research work addresses the testing optimization by the developing of different hardware/software architecture for the different testing stages of the developing flow of a MEMS based system. A flexible and low-cost platform for the characterization and the prototyping of MEMS sensors has been developed in order to provide an environment that allows also to support the design of the sensor interface. To reduce the reengineering time requested during the verification testing a universal client-server architecture has been designed to provide a unique framework to test different kind of devices, using different development environment and programming languages. Because the use of ATE during the engineering phase of the calibration algorithm is expensive in terms of ATE’s occupation time, since it requires the interruption of the production process, a flexible and easily adaptable low-cost hardware/software architecture for the calibration and the evaluation of the performance has been developed in order to allow the developing of the calibration algorithm in a user-friendly environment that permits also to realize a small and medium volume production. The second part of the research work deals with a topic that is becoming ever more important in the field of applications for MEMS sensors, and concerns the capability to combine information extracted from different typologies of sensors (typically accelerometers, gyroscopes and magnetometers) to obtain more complex information. In this context two different algorithm for the sensor fusion has been analyzed and developed: the first one is a fully software algorithm that has been used as a means to estimate how much the errors in MEMS sensor data affect the estimation of the parameter computed using a sensor fusion algorithm; the second one, instead, is a sensor fusion algorithm based on a simplified Kalman filter. Starting from this algorithm, a bit-true model in Mathworks Simulink(TM) has been created as a system study for the implementation of the algorithm on chip