A simulation and diagnosis system incorporating various time delay models and functional elements

The application of digital simulation to all phases of digital network design is considered here as oppossed [sic] to development of simulation for one or two restricted parts of the digital process. For this reason a simulator is presented which can be consistent by varying the level of expression from the simulation of architectural structures to such detailed simulation requirements as race analysis of asynchronous sequential circuits. In order to make system simulation more than just an idea, it must be capable of handling large circuits in reasonable times. It is demonstrated that functional simulation has the potential to increase simulation speed while reducing the required storage. This potential is realized with the following features of this simulator structure: 1) a modular structure for specification and execution, 2) the capability of being easily interfaced with gate level simulation, 3) the capability of utilizing the highest level of expression for simulation, 4) a variable level of expression, 5) a relatively unrestricted type of logic that can be simulated, 6) the capabilities of using standard functional modules, 7) a fairly universal means of expressing functional modules and, 8) the use of data and control signals to further force selective trace capabilities on a module level. Greater gate level simulation capabilities are obtained by extending the basic simulator to perform the simulation of undefined signal values and the simulation of ambiguities in signal propagation speeds. The simulator presented here is part of a Test Generation and Simulation System. This system includes preprocessing, combinational test generation, automatic fault insertion as well as simulation --Abstract, page ii

A design for testability study on a high performance automatic gain control circuit.

A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente

MISSED: an environment for mixed-signal microsystem testing and diagnosis

A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debuggin

Generalized disjunction decomposition for evolvable hardware

Evolvable hardware (EHW) refers to self-reconfiguration hardware design, where the configuration is under the control of an evolutionary algorithm (EA). One of the main difficulties in using EHW to solve real-world problems is scalability, which limits the size of the circuit that may be evolved. This paper outlines a new type of decomposition strategy for EHW, the “generalized disjunction decomposition” (GDD), which allows the evolution of large circuits. The proposed method has been extensively tested, not only with multipliers and parity bit problems traditionally used in the EHW community, but also with logic circuits taken from the Microelectronics Center of North Carolina (MCNC) benchmark library and randomly generated circuits. In order to achieve statistically relevant results, each analyzed logic circuit has been evolved 100 times, and the average of these results is presented and compared with other EHW techniques. This approach is necessary because of the probabilistic nature of EA; the same logic circuit may not be solved in the same way if tested several times. The proposed method has been examined in an extrinsic EHW system using the$(1 + lambda)$evolution strategy. The results obtained demonstrate that GDD significantly improves the evolution of logic circuits in terms of the number of generations, reduces computational time as it is able to reduce the required time for a single iteration of the EA, and enables the evolution of larger circuits never before evolved. In addition to the proposed method, a short overview of EHW systems together with the most recent applications in electrical circuit design is provided

Open-ended evolution to discover analogue circuits for beyond conventional applications

This is the author's accepted manuscript. The final publication is available at Springer via http://dx.doi.org/10.1007/s10710-012-9163-8. Copyright @ Springer 2012.Analogue circuits synthesised by means of open-ended evolutionary algorithms often have unconventional designs. However, these circuits are typically highly compact, and the general nature of the evolutionary search methodology allows such designs to be used in many applications. Previous work on the evolutionary design of analogue circuits has focused on circuits that lie well within analogue application domain. In contrast, our paper considers the evolution of analogue circuits that are usually synthesised in digital logic. We have developed four computational circuits, two voltage distributor circuits and a time interval metre circuit. The approach, despite its simplicity, succeeds over the design tasks owing to the employment of substructure reuse and incremental evolution. Our findings expand the range of applications that are considered suitable for evolutionary electronics

Mixed-Signal Testability Analysis for Data-Converter IPs

In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC

MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation

This paper describes a tool which assists the designer in the rapid generation of functional tests for mixed-signal circuits down to the actual test-signals for the tester. The tool is based on manipulating design data, making use of macro-based test libraries and tester resources provided by the test engineer, and computer-based interaction with the designe