2,347 research outputs found

    From FPGA to ASIC: A RISC-V processor experience

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    This work document a correct design flow using these tools in the Lagarto RISC- V Processor and the RTL design considerations that must be taken into account, to move from a design for FPGA to design for ASIC

    Towards a Scalable Hardware/Software Co-Design Platform for Real-time Pedestrian Tracking Based on a ZYNQ-7000 Device

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    Currently, most designers face a daunting task to research different design flows and learn the intricacies of specific software from various manufacturers in hardware/software co-design. An urgent need of creating a scalable hardware/software co-design platform has become a key strategic element for developing hardware/software integrated systems. In this paper, we propose a new design flow for building a scalable co-design platform on FPGA-based system-on-chip. We employ an integrated approach to implement a histogram oriented gradients (HOG) and a support vector machine (SVM) classification on a programmable device for pedestrian tracking. Not only was hardware resource analysis reported, but the precision and success rates of pedestrian tracking on nine open access image data sets are also analysed. Finally, our proposed design flow can be used for any real-time image processingrelated products on programmable ZYNQ-based embedded systems, which benefits from a reduced design time and provide a scalable solution for embedded image processing products

    Using Relocatable Bitstreams for Fault Tolerance

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    This research develops a method for relocating reconfigurable modules on the Virtex-II (Pro) family of Field Programmable Gate Arrays (FPGAs). A bitstream translation program is developed which correctly changes the location of a partial bitstream that implements a module on the FPGA. To take advantage of relocatable modules, three fault-tolerance circuit designs are developed and tested. This circuit can operate through a fault by efficiently removing the faulty module and replacing it with a relocated module without faults. The FPGA can recover from faults at a known location, without the need for external intervention using an embedded fault recovery system. The recovery system uses an internal PowerPC to relocate the modules and reprogram the FPGA. Due to the limited architecture of the target FPGA and Xilinx tool errors, an FPGA with automatic fault recovery could not be demonstrated. However, the various components needed to do this type of recovery have been implemented and demonstrated individually

    Optimizing Scrubbing by Netlist Analysis for FPGA Configuration Bit Classification and Floorplanning

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    Existing scrubbing techniques for SEU mitigation on FPGAs do not guarantee an error-free operation after SEU recovering if the affected configuration bits do belong to feedback loops of the implemented circuits. In this paper, we a) provide a netlist-based circuit analysis technique to distinguish so-called critical configuration bits from essential bits in order to identify configuration bits which will need also state-restoring actions after a recovered SEU and which not. Furthermore, b) an alternative classification approach using fault injection is developed in order to compare both classification techniques. Moreover, c) we will propose a floorplanning approach for reducing the effective number of scrubbed frames and d), experimental results will give evidence that our optimization methodology not only allows to detect errors earlier but also to minimize the Mean-Time-To-Repair (MTTR) of a circuit considerably. In particular, we show that by using our approach, the MTTR for datapath-intensive circuits can be reduced by up to 48.5% in comparison to standard approaches

    A Defect-tolerant Cluster in a Mesh SRAM-based FPGA

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    International audienceIn this paper, we propose the implementation of multiple defect-tolerant techniques on an SRAM-based FPGA. These techniques include redundancy at both the logic block and intra-cluster interconnect. In the logic block, redundancy is implemented at the multiplexer level. Its efficiency is analyzed by injecting a single defect at the output of a multiplexer, considering all possible locations and input combinations. While at the interconnect level, fine grain redundancy is introduced which not only bypasses defects but also increases routability. Taking advantage of the sparse intra-cluster interconnect structures, routability is further improved by efficient distribution of feedback paths allowing more flexibility in the connections among logic blocks. Emulation results show a significant improvement of about 15% and 34% in the robustness of logic block and intra-cluster interconnect respectively. Furthermore, the impact of these hardening schemes on the testability of the FPGA cluster for manufacturing defects is also investigated in terms of maximum achievable fault coverage and the respective cost

    Functional Testing of Processor Cores in FPGA-Based Applications

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    Embedded processor cores, which are widely used in SRAM-based FPGA applications, are candidates for SEU (Single Event Upset)-induced faults and need to be tested occasionally during system exploitation. Verifying a processor core is a difficult task, due to its complexity and the lack of user knowledge about the core-implementation details. In user applications, processor cores are normally tested by executing some kind of functional test in which the individual processor's instructions are tested with a set of deterministic test patterns, and the results are then compared with the stored reference values. For practical reasons the number of test patterns and corresponding results is usually small, which inherently leads to low fault coverage. In this paper we develop a concept that combines the whole instruction-set test into a compact test sequence, which can then be repeated with different input test patterns. This improves the fault coverage considerably with no additional memory requirements

    FPGA ARCHITECTURE AND VERIFICATION OF BUILT IN SELF-TEST (BIST) FOR 32-BIT ADDER/SUBTRACTER USING DE0-NANO FPGA AND ANALOG DISCOVERY 2 HARDWARE

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    The integrated circuit (IC) is an integral part of everyday modern technology, and its application is very attractive to hardware and software design engineers because of its versatility, integration, power consumption, cost, and board area reduction. IC is available in various types such as Field Programming Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), System on Chip (SoC) architecture, Digital Signal Processing (DSP), microcontrollers (μC), and many more. With technology demand focused on faster, low power consumption, efficient IC application, design engineers are facing tremendous challenges in developing and testing integrated circuits that guaranty functionality, high fault coverage, and reliability as the transistor technology is shrinking to the point where manufacturing defects of ICs are affecting yield which associates with the increased cost of the part. The competitive IC market is pressuring manufactures of ICs to develop and market IC in a relatively quick turnaround which in return requires design and verification engineers to develop an integrated self-test structure that would ensure fault-free and the quality product is delivered on the market. 70-80% of IC design is spent on verification and testing to ensure high quality and reliability for the enduser. To test complex and sophisticated IC designs, the verification engineers must produce laborious and costly test fixtures which affect the cost of the part on the competitive market. To avoid increasing the part cost due to yield and test time to the end-user and to keep up with the competitive market many IC design engineers are deviating from complex external test fixture approach and are focusing on integrating Built-in Self-Test (BIST) or Design for Test (DFT) techniques onto IC’s which would reduce time to market but still guarantee high coverage for the product. Understanding the BIST, the architecture, as well as the application of IC, must be understood before developing IC. The architecture of FPGA is elaborated in this paper followed by several BIST techniques and applications of those BIST relative to FPGA, SoC, analog to digital (ADC), or digital to analog converters (DAC) that are integrated on IC. Paper is concluded with verification of BIST for the 32-bit adder/subtracter designed in Quartus II software using the Analog Discovery 2 module as stimulus and DE0-NANO FPGA board for verification

    Recent progress in field programmable logic

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