2,385 research outputs found

    A Behavioral Model of a Built-in Current Sensor for IDDQ Testing

    Get PDF
    IDDQ testing is one of the most effective methods for detecting defects in integrated circuits. Higher leakage currents in more advanced semiconductor technologies have reduced the resolution of IDDQ test. One solution is to use built-in current sensors. Several sensor techniques for measuring the current based on the magnetic field or voltage drop across the supply line have been proposed. In this work, we develop a behavioral model for a built-in current sensor measuring voltage drop and use this model to better understand sensor operation, identify the effect of different parameters on sensor resolution, and suggest design modifications to improve future sensor performance

    A CMOS 0.18μm 64×64 single photon image sensor with in-pixel 11b time-to-digital converter

    Get PDF
    The design and characterization of a CMOS 64×64 single-photon avalanche-diode (SPAD) array with in-pixel 11b time-to-digital converter (TDC) is presented. It is targeted for time-resolved imaging, in particular 3D imaging. The achieved pixel pitch is 64μm with a fill factor of 3.5%. The chip was fabricated in a 0.18μm standard CMOS technology and implements a double functionality: Time-of-Flight estimation and photon counting. The imager features a programmable time resolution for the array of TDCs from 625ps down to 145ps. The measured accuracy of the minimum time bin is lower than ±1LSB DNL and 1.7LSB INL. The TDC jitter over the full dynamic range is less than 1LSB. Die-to-die process variation and temperature are discarded by auto-calibration. Fast quenching/restore circuit on each pixel lowers the power consumption by limiting the avalanche currents. Time gatedoperation is possible as well.Office of Naval Research (USA) N000141410355Ministerio de Economía y Competitividad TEC2012-38921- C02, IPT- 2011-1625-430000, IPC- 20111009 CDTIJunta de Andalucía TIC 2012- 233

    Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier

    Get PDF
    PhD ThesisAs further advances are made in semiconductor manufacturing technology the performance of circuits is continuously increasing. Unfortunately, as the technology node descends deeper into the nanometre region, achieving the potential performance gain is becoming more of a challenge; due not only to the effects of process variation but also to the reduced timing margins between signals within the circuit creating timing problems. Production Standard Automatic Test Equipment (ATE) is incapable of performing internal timing measurements due, first to the lack of accessibility and second to the overall timing accuracy of the tester which is grossly inadequate. To address these issue ‘on-chip’ time measurement circuits have been developed in a similar way that built in self-test (BIST) evolved for ‘on-chip’ logic testing. This thesis describes the design and analysis of three time amplifier circuits. The analysis undertaken considers the operational aspects related to gain and input dynamic range, together with the robustness of the circuits to the effects of process, voltage and temperature (PVT) variations. The design which had the best overall performance was subsequently compared to a benchmark design, which used the ‘buffer delay offset’ technique for time amplification, and showed a marked 6.5 times improvement on the dynamic range extending this from 40 ps to 300ps. The new design was also more robust to the effects of PVT variations. The new time amplifier design was further developed to include an adjustable gain capability which could be varied in steps of approximately 7.5 from 4 to 117. The time amplifier was then connected to a 32-stage tapped delay line to create a reconfigurable time measurement circuit with an adjustable resolution range from 15 down to 0.5 ps and a dynamic range from 480 down to 16 ps depending upon the gain setting. The overall footprint of the measurement circuit, together with its calibration module occupies an area of 0.026 mm2 The final circuit, overall, satisfied the main design criteria for ‘on-chip’ time measurement circuitry, namely, it has a wide dynamic range, high resolution, robust to the effects of PVT and has a small area overhead.Umm Al-Qura University

    Strategies towards high performance (high-resolution/linearity) time-to-digital converters on field-programmable gate arrays

    Get PDF
    Time-correlated single-photon counting (TCSPC) technology has become popular in scientific research and industrial applications, such as high-energy physics, bio-sensing, non-invasion health monitoring, and 3D imaging. Because of the increasing demand for high-precision time measurements, time-to-digital converters (TDCs) have attracted attention since the 1970s. As a fully digital solution, TDCs are portable and have great potential for multichannel applications compared to bulky and expensive time-to-amplitude converters (TACs). A TDC can be implemented in ASIC and FPGA devices. Due to the low cost, flexibility, and short development cycle, FPGA-TDCs have become promising. Starting with a literature review, three original FPGA-TDCs with outstanding performance are introduced. The first design is the first efficient wave union (WU) based TDC implemented in Xilinx UltraScale (20 nm) FPGAs with a bubble-free sub-TDL structure. Combining with other existing methods, the resolution is further enhanced to 1.23 ps. The second TDC has been designed for LiDAR applications, especially in driver-less vehicles. Using the proposed new calibration method, the resolution is adjustable (50, 80, and 100 ps), and the linearity is exceptionally high (INL pk-pk and INL pk-pk are lower than 0.05 LSB). Meanwhile, a software tool has been open-sourced with a graphic user interface (GUI) to predict TDCs’ performance. In the third TDC, an onboard automatic calibration (AC) function has been realized by exploiting Xilinx ZYNQ SoC architectures. The test results show the robustness of the proposed method. Without the manual calibration, the AC function enables FPGA-TDCs to be applied in commercial products where mass production is required.Time-correlated single-photon counting (TCSPC) technology has become popular in scientific research and industrial applications, such as high-energy physics, bio-sensing, non-invasion health monitoring, and 3D imaging. Because of the increasing demand for high-precision time measurements, time-to-digital converters (TDCs) have attracted attention since the 1970s. As a fully digital solution, TDCs are portable and have great potential for multichannel applications compared to bulky and expensive time-to-amplitude converters (TACs). A TDC can be implemented in ASIC and FPGA devices. Due to the low cost, flexibility, and short development cycle, FPGA-TDCs have become promising. Starting with a literature review, three original FPGA-TDCs with outstanding performance are introduced. The first design is the first efficient wave union (WU) based TDC implemented in Xilinx UltraScale (20 nm) FPGAs with a bubble-free sub-TDL structure. Combining with other existing methods, the resolution is further enhanced to 1.23 ps. The second TDC has been designed for LiDAR applications, especially in driver-less vehicles. Using the proposed new calibration method, the resolution is adjustable (50, 80, and 100 ps), and the linearity is exceptionally high (INL pk-pk and INL pk-pk are lower than 0.05 LSB). Meanwhile, a software tool has been open-sourced with a graphic user interface (GUI) to predict TDCs’ performance. In the third TDC, an onboard automatic calibration (AC) function has been realized by exploiting Xilinx ZYNQ SoC architectures. The test results show the robustness of the proposed method. Without the manual calibration, the AC function enables FPGA-TDCs to be applied in commercial products where mass production is required

    A Low-Power Silicon-Photomultiplier Readout ASIC for the CALICE Analog Hadronic Calorimeter

    Get PDF
    The future e + e − collider experiments, such as the international linear collider, provide precise measurements of the heavy bosons and serve as excellent tests of the underlying fundamental physics. To reconstruct these bosons with an unprecedented resolution from their multi-jet final states, a detector system employing the particle flow approach has been proposed, requesting calorimeters with imaging capabilities. The analog hadron calorimeter based on the SiPM-on-tile technology is one of the highly granular candidates of the imaging calorimeters. To achieve the compactness, the silicon-photomultiplier (SiPM) readout electronics require a low-power monolithic solution. This thesis presents the design of such an application-specific integrated circuit (ASIC) for the charge and timing readout of the SiPMs. The ASIC provides precise charge measurement over a large dynamic range with auto-triggering and local zero-suppression functionalities. The charge and timing information are digitized using channel-wise analog-to-digital and time-to-digital converters, providing a fully integrated solution for the SiPM readout. Dedicated to the analog hadron calorimeter, the power-pulsing technique is applied to the full chip to meet the stringent power consumption requirement. This work also initializes the commissioning of the calorimeter layer with the use of the designed ASIC. An automatic calibration procedure has been developed to optimized the configuration settings for the chip. The new calorimeter base unit with the designed ASIC has been produced and its functionality has been tested

    The Borexino detector at the Laboratori Nazionali del Gran Sasso

    Full text link
    Borexino, a large volume detector for low energy neutrino spectroscopy, is currently running underground at the Laboratori Nazionali del Gran Sasso, Italy. The main goal of the experiment is the real-time measurement of sub MeV solar neutrinos, and particularly of the mono energetic (862 keV) Be7 electron capture neutrinos, via neutrino-electron scattering in an ultra-pure liquid scintillator. This paper is mostly devoted to the description of the detector structure, the photomultipliers, the electronics, and the trigger and calibration systems. The real performance of the detector, which always meets, and sometimes exceeds, design expectations, is also shown. Some important aspects of the Borexino project, i.e. the fluid handling plants, the purification techniques and the filling procedures, are not covered in this paper and are, or will be, published elsewhere (see Introduction and Bibliography).Comment: 37 pages, 43 figures, to be submitted to NI

    An On-chip PVT Resilient Short Time Measurement Technique

    Get PDF
    As the CMOS technology nodes continue to shrink, the challenges of developing manufacturing tests for integrated circuits become more difficult to address. To detect parametric faults of new generation of integrated circuits such as 3D ICs, on-chip short-time intervals have to be accurately measured. The accuracy of an on-chip time measurement module is heavily affected by Process, supply Voltage, and Temperature (PVT) variations. This work presents a new on-chip time measurement scheme where the undesired effects of PVT variations are attenuated significantly. To overcome the effects of PVT variations on short-time measurement, phase locking methodology is utilized to implement a robust Vernier delay line. A prototype Time-to-Digital Converter (TDC) has been fabricated using TSMC 0.180 µm CMOS technology and experimental measurements have been carried out to verify the performance parameters of the TDC. The measurement results indicate that the proposed solution reduces the effects of PVT variations by more than tenfold compared to a conventional on-chip TDC. A coarse-fine time interval measurement scheme which is resilient to the PVT variations is also proposed. In this approach, two Delay Locked Loops (DLLs) are utilized to minimize the effects of PVT on the measured time intervals. The proposed scheme has been implemented using CMOS 65nm technology. Simulation results using Advanced Design System (ADS) indicate that the measurement resolution varies by less than 0.1ps with ±15% variations of the supply voltage. The proposed method also presents a robust performance against process and temperature variations. The measurement accuracy changes by a maximum of 0.05ps from slow to fast corners. The implemented TDC presents a robust performance against temperature variations too and its measurement accuracy varies a few femto-seconds from -40 ºC to +100 ºC. The principle of robust short-time measurement was used in practice to design and implement a state-of-the-art Coordinate Measuring Machine (CMM) for an industry partner to measure geometrical features of transmission parts with micrometer resolution. The solution developed for the industry partner has resulted in a patent and a product in the market. The on-chip short-time measurement technology has also been utilized to develop a solution to detect Hardware Trojans
    corecore