DFT and BIST of a multichip module for high-energy physics experiments

Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie

A PCI Express board designed to interface with the electronic phase-2 upgrades of the ATLAS detectors at CERN

Nei prossimi 10 anni è in previsione un aggiornamento radicale dell'acceleratore LHC al CERN finalizzato al raggiungimento di più alti valori di luminosità istantanea (oltre \begin{math}5 \times 10^{34}cm^{-2}s^{-1}\end{math}) ed integrata (oltre un fattore 10 rispetto a quella attuale). Conseguentemente, anche i rilevatori degli esperimenti che lavorano al CERN, così come i loro sistemi di acquisizione dati, dovranno essere aggiornati per poter gestire un flusso notevolmente maggiore rispetto a quello utilizzato finora. Questa tesi tratta in particolare di una nuova scheda elettronica di lettura, progettata e testata nel laboratorio di elettronica del Dipartimento di Fisica ed Astronomia dell'Università di Bologna e nel laboratorio di elettronica della Sezione INFN (Istituto Nazionale di Fisica Nucleare) di Bologna. Le motivazioni che hanno indotto lo sviluppo della scheda prototipale sono molteplici. Un primo obiettivo da perseguire è stato quello di aggiornare la versione attuale delle schede elettroniche di acquisizione dati usate oggi nel Pixel Detector dell'esperimento ATLAS, visto che sono anch'esse sotto la responsabilità della sezione INFN di Bologna. Secondariamente, la scheda (nominata Pixel-ROD) è orientata a gestire le esigenze elettroniche che seguiranno l'upgrade di LHC durante la fase 2. La complessità del progetto e l'inerzia intrinseca di una vasta collaborazione come quella di ATLAS, hanno poi indotto lo sviluppo di questo progetto elettronico in largo anticipo rispetto al vero upgrade di fase 2 di LHC, previsto per il 2024. In questo modo saranno anche più facilmente eseguibili eventuali aggiornamenti tecnologici in corso d'opera, senza dover riprogettare da zero un sistema di acquisizione dati completo

A Hardware Security Solution against Scan-Based Attacks

Scan based Design for Test (DfT) schemes have been widely used to achieve high fault coverage for integrated circuits. The scan technique provides full access to the internal nodes of the device-under-test to control them or observe their response to input test vectors. While such comprehensive access is highly desirable for testing, it is not acceptable for secure chips as it is subject to exploitation by various attacks. In this work, new methods are presented to protect the security of critical information against scan-based attacks. In the proposed methods, access to the circuit containing secret information via the scan chain has been severely limited in order to reduce the risk of a security breach. To ensure the testability of the circuit, a built-in self-test which utilizes an LFSR as the test pattern generator (TPG) is proposed. The proposed schemes can be used as a countermeasure against side channel attacks with a low area overhead as compared to the existing solutions in literature

Design-for-delay-testability techniques for high-speed digital circuits

The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important

FPGA ARCHITECTURE AND VERIFICATION OF BUILT IN SELF-TEST (BIST) FOR 32-BIT ADDER/SUBTRACTER USING DE0-NANO FPGA AND ANALOG DISCOVERY 2 HARDWARE

The integrated circuit (IC) is an integral part of everyday modern technology, and its application is very attractive to hardware and software design engineers because of its versatility, integration, power consumption, cost, and board area reduction. IC is available in various types such as Field Programming Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), System on Chip (SoC) architecture, Digital Signal Processing (DSP), microcontrollers (μC), and many more. With technology demand focused on faster, low power consumption, efficient IC application, design engineers are facing tremendous challenges in developing and testing integrated circuits that guaranty functionality, high fault coverage, and reliability as the transistor technology is shrinking to the point where manufacturing defects of ICs are affecting yield which associates with the increased cost of the part. The competitive IC market is pressuring manufactures of ICs to develop and market IC in a relatively quick turnaround which in return requires design and verification engineers to develop an integrated self-test structure that would ensure fault-free and the quality product is delivered on the market. 70-80% of IC design is spent on verification and testing to ensure high quality and reliability for the enduser. To test complex and sophisticated IC designs, the verification engineers must produce laborious and costly test fixtures which affect the cost of the part on the competitive market. To avoid increasing the part cost due to yield and test time to the end-user and to keep up with the competitive market many IC design engineers are deviating from complex external test fixture approach and are focusing on integrating Built-in Self-Test (BIST) or Design for Test (DFT) techniques onto IC’s which would reduce time to market but still guarantee high coverage for the product. Understanding the BIST, the architecture, as well as the application of IC, must be understood before developing IC. The architecture of FPGA is elaborated in this paper followed by several BIST techniques and applications of those BIST relative to FPGA, SoC, analog to digital (ADC), or digital to analog converters (DAC) that are integrated on IC. Paper is concluded with verification of BIST for the 32-bit adder/subtracter designed in Quartus II software using the Analog Discovery 2 module as stimulus and DE0-NANO FPGA board for verification

Adaptation of High Performance and High Capacity Reconfigurable Systems to OpenCL Programming Environments

[EN] In this work, we adapt a reconfigurable computer system based on FPGA technologies to OpenCL programming environments. The reconfigurable system is part of a compute prototype of the MANGO European project that includes 96 FPGAs. To optimize the use and to obtain its maximum performance, it is essential to adapt it to heterogeneous systems programming environments such as OpenCL, which simplifies its programming. In this work, all the necessary activities for correct implementation of the software and hardware layer required for its use in OpenCL will be carried out, as well as an evaluation of the performance obtained and the flexibility offered by the solution provided. This work has been performed during an internship of 5 months. The internship is linked to an agreement between UPV and UniNa (Università degli Studi di Napoli Federico II).[ES] En este trabajo se va a realizar la adaptación de un sistema reconfigurable de cómputo basado en tecnologías de FPGAs hacia entornos de programación en OpenCL. El sistema reconfigurable forma parte de un prototipo de cálculo del proyecto Europeo MANGO que incluye 96 FPGAs. Con el fin de optimizar el uso y de obtener sus máximas prestaciones, se hace imprescindible una adaptación a entornos de programación de sistemas heterogéneos como OpenCL, lo cual simplifica su programación y uso. En este trabajo se realizarán todas las actividades necesarias para una correcta implementación de la capa software y hardware necesaria para su uso en OpenCL así como una evaluación de las prestaciones obtenidas y de la flexibilidad ofrecida por la solución aportada. Este trabajo se ha llevado a término durante una estancia de cinco meses en la Universitat Politécnica de Valéncia. Esta estancia está vinculada a un acuerdo entre la Universitat Politécnica de Valéncia y la Università degli Studi di Napoli Federico IIRusso, D. (2020). Adaptation of High Performance and High Capacity Reconfigurable Systems to OpenCL Programming Environments. http://hdl.handle.net/10251/150393TFG

Development of an acoustic modem using synthesizable microcontroller

In this thesis, an acoustic modem is developed on a digital programmable device for underwater communications. The system consists of a synthesize microcontroller as well the different elements necessaries for the modulation and demodulation of the signals. That should be developed for the design. The objective is to develop the system using a high-level hardware description language and to show the system’s functioning on a flexible platform (a programable logical device) with the perspective that, in the future, it can be implemented in a personalized integrated circuit and thus obtain a compact and energy efficient system

Studies on Core-Based Testing of System-on-Chips Using Functional Bus and Network-on-Chip Interconnects

The tests of a complex system such as a microprocessor-based system-onchip (SoC) or a network-on-chip (NoC) are difficult and expensive. In this thesis, we propose three core-based test methods that reuse the existing functional interconnects-a flat bus, hierarchical buses of multiprocessor SoC's (MPSoC), and a N oC-in order to avoid the silicon area cost of a dedicated test access mechanism (TAM). However, the use of functional interconnects as functional TAM's introduces several new problems. During tests, the interconnects-including the bus arbitrator, the bus bridges, and the NoC routers-operate in the functional mode to transport the test stimuli and responses, while the core under tests (CUT) operate in the test mode. Second, the test data is transported to the CUT through the functional bus, and not directly to the test port. Therefore, special core test wrappers that can provide the necessary control signals required by the different functional interconnect are proposed. We developed two types of wrappers, one buffer-based wrapper for the bus-based systems and another pair of complementary wrappers for the NoCbased systems. Using the core test wrappers, we propose test scheduling schemes for the three functionally different types of interconnects. The test scheduling scheme for a flat bus is developed based on an efficient packet scheduling scheme that minimizes both the buffer sizes and the test time under a power constraint. The schedulingscheme is then extended to take advantage of the hierarchical bus architecture of the MPSoC systems. The third test scheduling scheme based on the bandwidth sharing is developed specifically for the NoC-based systems. The test scheduling is performed under the objective of co-optimizing the wrapper area cost and the resulting test application time using the two complementary NoC wrappers. For each of the proposed methodology for the three types of SoC architec .. ture, we conducted a thorough experimental evaluation in order to verify their effectiveness compared to other methods