1,772 research outputs found

    Advanced information processing system: The Army fault tolerant architecture conceptual study. Volume 2: Army fault tolerant architecture design and analysis

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    Described here is the Army Fault Tolerant Architecture (AFTA) hardware architecture and components and the operating system. The architectural and operational theory of the AFTA Fault Tolerant Data Bus is discussed. The test and maintenance strategy developed for use in fielded AFTA installations is presented. An approach to be used in reducing the probability of AFTA failure due to common mode faults is described. Analytical models for AFTA performance, reliability, availability, life cycle cost, weight, power, and volume are developed. An approach is presented for using VHSIC Hardware Description Language (VHDL) to describe and design AFTA's developmental hardware. A plan is described for verifying and validating key AFTA concepts during the Dem/Val phase. Analytical models and partial mission requirements are used to generate AFTA configurations for the TF/TA/NOE and Ground Vehicle missions

    Fault-tolerant communication channel structures

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    Systems and techniques for implementing fault-tolerant communication channels and features in communication systems. Selected commercial-off-the-shelf devices can be integrated in such systems to reduce the cost

    SpiNNaker: Fault tolerance in a power- and area- constrained large-scale neuromimetic architecture

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    AbstractSpiNNaker is a biologically-inspired massively-parallel computer designed to model up to a billion spiking neurons in real-time. A full-fledged implementation of a SpiNNaker system will comprise more than 105 integrated circuits (half of which are SDRAMs and half multi-core systems-on-chip). Given this scale, it is unavoidable that some components fail and, in consequence, fault-tolerance is a foundation of the system design. Although the target application can tolerate a certain, low level of failures, important efforts have been devoted to incorporate different techniques for fault tolerance. This paper is devoted to discussing how hardware and software mechanisms collaborate to make SpiNNaker operate properly even in the very likely scenario of component failures and how it can tolerate system-degradation levels well above those expected

    Exception handling in control systems

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    Fault-tolerant Algorithms for Tick-Generation in Asynchronous Logic: Robust Pulse Generation

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    Today's hardware technology presents a new challenge in designing robust systems. Deep submicron VLSI technology introduced transient and permanent faults that were never considered in low-level system designs in the past. Still, robustness of that part of the system is crucial and needs to be guaranteed for any successful product. Distributed systems, on the other hand, have been dealing with similar issues for decades. However, neither the basic abstractions nor the complexity of contemporary fault-tolerant distributed algorithms match the peculiarities of hardware implementations. This paper is intended to be part of an attempt striving to overcome this gap between theory and practice for the clock synchronization problem. Solving this task sufficiently well will allow to build a very robust high-precision clocking system for hardware designs like systems-on-chips in critical applications. As our first building block, we describe and prove correct a novel Byzantine fault-tolerant self-stabilizing pulse synchronization protocol, which can be implemented using standard asynchronous digital logic. Despite the strict limitations introduced by hardware designs, it offers optimal resilience and smaller complexity than all existing protocols.Comment: 52 pages, 7 figures, extended abstract published at SSS 201

    Design of variation-tolerant synchronizers for multiple clock and voltage domains

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    PhD ThesisParametric variability increasingly affects the performance of electronic circuits as the fabrication technology has reached the level of 32nm and beyond. These parameters may include transistor Process parameters (such as threshold voltage), supply Voltage and Temperature (PVT), all of which could have a significant impact on the speed and power consumption of the circuit, particularly if the variations exceed the design margins. As systems are designed with more asynchronous protocols, there is a need for highly robust synchronizers and arbiters. These components are often used as interfaces between communication links of different timing domains as well as sampling devices for asynchronous inputs coming from external components. These applications have created a need for new robust designs of synchronizers and arbiters that can tolerate process, voltage and temperature variations. The aim of this study was to investigate how synchronizers and arbiters should be designed to tolerate parametric variations. All investigations focused mainly on circuit-level and transistor level designs and were modeled and simulated in the UMC90nm CMOS technology process. Analog simulations were used to measure timing parameters and power consumption along with a “Monte Carlo” statistical analysis to account for process variations. Two main components of synchronizers and arbiters were primarily investigated: flip-flop and mutual-exclusion element (MUTEX). Both components can violate the input timing conditions, setup and hold window times, which could cause metastability inside their bistable elements and possibly end in failures. The mean-time between failures is an important reliability feature of any synchronizer delay through the synchronizer. The MUTEX study focused on the classical circuit, in addition to a number of tolerance, based on increasing internal gain by adding current sources, reducing the capacitive loading, boosting the transconductance of the latch, compensating the existing Miller capacitance, and adding asymmetry to maneuver the metastable point. The results showed that some circuits had little or almost no improvements, while five techniques showed significant improvements by reducing τ and maintaining high tolerance. Three design approaches are proposed to provide variation-tolerant synchronizers. wagging synchronizer proposed to First, the is significantly increase reliability over that of the conventional two flip-flop synchronizer. The robustness of the wagging technique can be enhanced by using robust τ latches or adding one more cycle of synchronization. The second approach is the Metastability Auto-Detection and Correction (MADAC) latch which relies on swiftly detecting a metastable event and correcting it by enforcing the previously stored logic value. This technique significantly reduces the resolution time down from uncertain synchronization technique is proposed to transfer signals between Multiple- Voltage Multiple-Clock Domains (MVD/MCD) that do not require conventional level-shifters between the domains or multiple power supplies within each domain. This interface circuit uses a synchronous set and feedback reset protocol which provides level-shifting and synchronization of all signals between the domains, from a wide range of voltage-supplies and clock frequencies. Overall, synchronizer circuits can tolerate variations to a greater extent by employing the wagging technique or using a MADAC latch, while MUTEX tolerance can suffice with small circuit modifications. Communication between MVD/MCD can be achieved by an asynchronous handshake without a need for adding level-shifters.The Saudi Arabian Embassy in London, Umm Al-Qura University, Saudi Arabi

    Advances in Nanowire-Based Computing Architectures

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    A Cross-level Verification Methodology for Digital IPs Augmented with Embedded Timing Monitors

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    Smart systems are characterized by the integration in a single device of multi-domain subsystems of different technological domains, namely, analog, digital, discrete and power devices, MEMS, and power sources. Such challenges, emerging from the heterogeneous nature of the whole system, combined with the traditional challenges of digital design, directly impact on performance and on propagation delay of digital components. This article proposes a design approach to enhance the RTL model of a given digital component for the integration in smart systems with the automatic insertion of delay sensors, which can detect and correct timing failures. The article then proposes a methodology to verify such added features at system level. The augmented model is abstracted to SystemC TLM, which is automatically injected with mutants (i.e., code mutations) to emulate delays and timing failures. The resulting TLM model is finally simulated to identify timing failures and to verify the correctness of the inserted delay monitors. Experimental results demonstrate the applicability of the proposed design and verification methodology, thanks to an efficient sensor-aware abstraction methodology, by applying the flow to three complex case studies

    Fault isolation detection expert (FIDEX). Part 1: Expert system diagnostics for a 30/20 Gigahertz satellite transponder

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    LeRC has recently completed the design of a Ka-band satellite transponder system, as part of the Advanced Communication Technology Satellite (ACTS) System. To enhance the reliability of this satellite, NASA funded the University of Akron to explore the application of an expert system to provide the transponder with an autonomous diagnosis capability. The results of this research was the development of a prototype diagnosis expert system called FIDEX (fault-isolation and diagnosis expert). FIDEX is a frame-based expert system that was developed in the NEXPERT Object development environment by Neuron Data, Inc. It is a MicroSoft Windows version 3.0 application, and was designed to operate on an Intel i80386 based personal computer system
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