Developing a distributed electronic health-record store for India

The DIGHT project is addressing the problem of building a scalable and highly available information store for the Electronic Health Records (EHRs) of the over one billion citizens of India

Does OO sync with the way we think?

Given that corrective-maintenance costs already dominate the software life cycle and look set to increase significantly, reliability in the form of reducing such costs should be the most important software improvement goal. Yet the results are not promising when we review recent corrective-maintenance data for big systems in general and for OO in particular-possibly because of mismatches between the OO paradigm and how we think

Assessing the Quality of Mobile Graphical User Interfaces Using Multi-Objective Optimization

Aesthetic defects are a violation of quality attributes that are symptoms of bad interface design programming decisions. They lead to deteriorating the perceived usability of mobile user interfaces and negatively impact the Users eXperience (UX) with the mobile app. Most existing studies relied on a subjective evaluation of aesthetic defects depending on end-users feedback, which makes the manual evaluation of mobile user interfaces human-centric, time-consuming, and error-prone. Therefore, recent studies have dedicated their effort to focus on the definition of mathematical formulas that each targets a specific structural quality of the interface. As the UX is tightly dependent on the user profile, the combi-nation and calibration of quality attributes, formulas, and users characteristics, when defining a defect, is not straightforward. In this context, we propose a fully automated framework which combines literature quality attributes with the users profile to identify aesthetic defects of MUI. More precisely, we consider the mobile user interface evaluation as a multi-objective optimization problem where the goal is to maximize the number of detected violations while minimizing the detection complexity of detection rules and enhancing the interfaces overall quality in means

Exploring the Mysteries of System-Level Test

System-level test, or SLT, is an increasingly important process step in today's integrated circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in operational modes. In this paper, we consolidate available knowledge about what SLT is precisely and why it is used despite its considerable costs and complexities. We discuss the types or failures covered by SLT, and outline approaches to quality assessment, test generation and root-cause diagnosis in the context of SLT. Observing that the theoretical understanding for all these questions has not yet reached the level of maturity of the more conventional structural and functional test methods, we outline new and promising directions for methodical developments leveraging on recent findings from software engineering.Comment: 7 pages, 2 figure

Recent Trends and Perspectives on Defect-Oriented Testing

Electronics employed in modern safety-critical systems require severe qualification during the manufacturing process and in the field, to prevent fault effects from manifesting themselves as critical failures during mission operations. Traditional fault models are not sufficient anymore to guarantee the required quality levels for chips utilized in mission-critical applications. The research community and industry have been investigating new test approaches such as device-aware test, cell-aware test, path-delay test, and even test methodologies based on the analysis of manufacturing data to move the scope from OPPM to OPPB. This special session presents four contributions, from academic researchers and industry professionals, to enable better chip quality. We present results on various activities towards this objective, including device-aware test, software-based self-test, and memory test