On the Resilience of RTL NN Accelerators: Fault Characterization and Mitigation

Machine Learning (ML) is making a strong resurgence in tune with the massive generation of unstructured data which in turn requires massive computational resources. Due to the inherently compute- and power-intensive structure of Neural Networks (NNs), hardware accelerators emerge as a promising solution. However, with technology node scaling below 10nm, hardware accelerators become more susceptible to faults, which in turn can impact the NN accuracy. In this paper, we study the resilience aspects of Register-Transfer Level (RTL) model of NN accelerators, in particular, fault characterization and mitigation. By following a High-Level Synthesis (HLS) approach, first, we characterize the vulnerability of various components of RTL NN. We observed that the severity of faults depends on both i) application-level specifications, i.e., NN data (inputs, weights, or intermediate), NN layers, and NN activation functions, and ii) architectural-level specifications, i.e., data representation model and the parallelism degree of the underlying accelerator. Second, motivated by characterization results, we present a low-overhead fault mitigation technique that can efficiently correct bit flips, by 47.3% better than state-of-the-art methods.Comment: 8 pages, 6 figure

Axp: A hw-sw co-design pipeline for energy-efficient approximated convnets via associative matching

The reduction in energy consumption is key for deep neural networks (DNNs) to ensure usability and reliability, whether they are deployed on low-power end-nodes with limited resources or high-performance platforms that serve large pools of users. Leveraging the over-parametrization shown by many DNN models, convolutional neural networks (ConvNets) in particular, energy efficiency can be improved substantially preserving the model accuracy. The solution proposed in this work exploits the intrinsic redundancy of ConvNets to maximize the reuse of partial arithmetic results during the inference stages. Specifically, the weight-set of a given ConvNet is discretized through a clustering procedure such that the largest possible number of inner multiplications fall into predefined bins; this allows an off-line computation of the most frequent results, which in turn can be stored locally and retrieved when needed during the forward pass. Such a reuse mechanism leads to remarkable energy savings with the aid of a custom processing element (PE) that integrates an associative memory with a standard floating-point unit (FPU). Moreover, the adoption of an approximate associative rule based on a partial bit-match increases the hit rate over the pre-computed results, maximizing the energy reduction even further. Results collected on a set of ConvNets trained for computer vision and speech processing tasks reveal that the proposed associative-based hw-sw co-design achieves up to 77% in energy savings with less than 1% in accuracy loss

TinyML for UWB-radar based presence detection

Tiny Machine Learning (TinyML) is a novel research area aiming at designing machine and deep learning models and algorithms able to be executed on tiny devices such as Internet-of-Things units, edge devices or embedded systems. In this paper we introduce, for the first time in the literature, a TinyML solution for presence-detection based on UltrawideBand (UWB) radar, which is a particularly promising radar technology for pervasive systems. To achieve this goal we introduce a novel family of tiny convolutional neural networks for the processing of UWB-radar data characterized by a reduced memory footprint and computational demand so as to satisfy the severe technological constraints of tiny devices. From this technological perspective, UWB-radars are particularly relevant in the presence-detection scenario since they do not acquire sensitive information of users (e.g., images, videos or audio), hence preserving their privacy.The proposed solution has been successfully tested on a public-available benchmark for the indoor presence detection and on a real-world application of in-car presence detection

Embracing Visual Experience and Data Knowledge: Efficient Embedded Memory Design for Big Videos and Deep Learning

Energy efficient memory designs are becoming increasingly important, especially for applications related to mobile video technology and machine learning. The growing popularity of smart phones, tablets and other mobile devices has created an exponential demand for video applications in today?s society. When mobile devices display video, the embedded video memory within the device consumes a large amount of the total system power. This issue has created the need to introduce power-quality tradeoff techniques for enabling good quality video output, while simultaneously enabling power consumption reduction. Similarly, power efficiency issues have arisen within the area of machine learning, especially with applications requiring large and fast computation, such as neural networks. Using the accumulated data knowledge from various machine learning applications, there is now the potential to create more intelligent memory with the capability for optimized trade-off between energy efficiency, area overhead, and classification accuracy on the learning systems. In this dissertation, a review of recently completed works involving video and machine learning memories will be covered. Based on the collected results from a variety of different methods, including: subjective trials, discovered data-mining patterns, software simulations, and hardware power and performance tests, the presented memories provide novel ways to significantly enhance power efficiency for future memory devices. An overview of related works, especially the relevant state-of-the-art research, will be referenced for comparison in order to produce memory design methodologies that exhibit optimal quality, low implementation overhead, and maximum power efficiency.National Science FoundationND EPSCoRCenter for Computationally Assisted Science and Technology (CCAST

Sound Event Detection with Binary Neural Networks on Tightly Power-Constrained IoT Devices

Sound event detection (SED) is a hot topic in consumer and smart city applications. Existing approaches based on Deep Neural Networks are very effective, but highly demanding in terms of memory, power, and throughput when targeting ultra-low power always-on devices. Latency, availability, cost, and privacy requirements are pushing recent IoT systems to process the data on the node, close to the sensor, with a very limited energy supply, and tight constraints on the memory size and processing capabilities precluding to run state-of-the-art DNNs. In this paper, we explore the combination of extreme quantization to a small-footprint binary neural network (BNN) with the highly energy-efficient, RISC-V-based (8+1)-core GAP8 microcontroller. Starting from an existing CNN for SED whose footprint (815 kB) exceeds the 512 kB of memory available on our platform, we retrain the network using binary filters and activations to match these memory constraints. (Fully) binary neural networks come with a natural drop in accuracy of 12-18% on the challenging ImageNet object recognition challenge compared to their equivalent full-precision baselines. This BNN reaches a 77.9% accuracy, just 7% lower than the full-precision version, with 58 kB (7.2 times less) for the weights and 262 kB (2.4 times less) memory in total. With our BNN implementation, we reach a peak throughput of 4.6 GMAC/s and 1.5 GMAC/s over the full network, including preprocessing with Mel bins, which corresponds to an efficiency of 67.1 GMAC/s/W and 31.3 GMAC/s/W, respectively. Compared to the performance of an ARM Cortex-M4 implementation, our system has a 10.3 times faster execution time and a 51.1 times higher energy-efficiency.Comment: 6 pages conferenc

MoRS: An approximate fault modelling framework for reduced-voltage SRAMs

On-chip memory (usually based on Static RAMs-SRAMs) are crucial components for various computing devices including heterogeneous devices, e.g, GPUs, FPGAs, ASICs to achieve high performance. Modern workloads such as Deep Neural Networks (DNNs) running on these heterogeneous fabrics are highly dependent on the on-chip memory architecture for efficient acceleration. Hence, improving the energy-efficiency of such memories directly leads to an efficient system. One of the common methods to save energy is undervolting i.e., supply voltage underscaling below the nominal level. Such systems can be safely undervolted without incurring faults down to a certain voltage limit. This safe range is also called voltage guardband. However, reducing voltage below the guardband level without decreasing frequency causes timing-based faults. In this paper, we propose MoRS, a framework that generates the first approximate undervolting fault model using real faults extracted from experimental undervolting studies on SRAMs to build the model. We inject the faults generated by MoRS into the on-chip memory of the DNN accelerator to evaluate the resilience of the system under the test. MoRS has the advantage of simplicity without any need for high-time overhead experiments while being accurate enough in comparison to a fully randomly-generated fault injection approach. We evaluate our experiment in popular DNN workloads by mapping weights to SRAMs and measure the accuracy difference between the output of the MoRS and the real data. Our results show that the maximum difference between real fault data and the output fault model of MoRS is 6.21%, whereas the maximum difference between real data and random fault injection model is 23.2%. In terms of average proximity to the real data, the output of MoRS outperforms the random fault injection approach by 3.21x.This work is partially funded by Open Transprecision Computing (OPRECOM) project, Summer of Code 2020.Peer ReviewedPostprint (author's final draft

MoRS: An approximate fault modelling framework for reduced-voltage SRAMs

On-chip memory (usually based on Static RAMs-SRAMs) are crucial components for various computing devices including heterogeneous devices, e.g, GPUs, FPGAs, ASICs to achieve high performance. Modern workloads such as Deep Neural Networks (DNNs) running on these heterogeneous fabrics are highly dependent on the on-chip memory architecture for efficient acceleration. Hence, improving the energy-efficiency of such memories directly leads to an efficient system. One of the common methods to save energy is undervolting i.e., supply voltage underscaling below the nominal level. Such systems can be safely undervolted without incurring faults down to a certain voltage limit. This safe range is also called voltage guardband. However, reducing voltage below the guardband level without decreasing frequency causes timing-based faults. In this paper, we propose MoRS, a framework that generates the first approximate undervolting fault model using real faults extracted from experimental undervolting studies on SRAMs to build the model. We inject the faults generated by MoRS into the on-chip memory of the DNN accelerator to evaluate the resilience of the system under the test. MoRS has the advantage of simplicity without any need for high-time overhead experiments while being accurate enough in comparison to a fully randomly-generated fault injection approach. We evaluate our experiment in popular DNN workloads by mapping weights to SRAMs and measure the accuracy difference between the output of the MoRS and the real data. Our results show that the maximum difference between real fault data and the output fault model of MoRS is 6.21%, whereas the maximum difference between real data and random fault injection model is 23.2%. In terms of average proximity to the real data, the output of MoRS outperforms the random fault injection approach by 3.21x.This work is partially funded by Open Transprecision Computing (OPRECOM) project, Summer of Code 2020.Peer ReviewedPostprint (author's final draft

On the Resilience of RTL NN Accelerators: Fault Characterization and Mitigation

Machine Learning (ML) is making a strong resurgence in tune with the massive generation of unstructured data which in turn requires massive computational resources. Due to the inherently compute and power-intensive structure of Neural Networks (NNs), hardware accelerators emerge as a promising solution. However, with technology node scaling below 10nm, hardware accelerators become more susceptible to faults, which in turn can impact the NN accuracy. In this paper, we study the resilience aspects of Register-Transfer Level (RTL) model of NN accelerators, in particular, fault characterization and mitigation. By following a High-Level Synthesis (HLS) approach, first, we characterize the vulnerability of various components of RTL NN. We observed that the severity of faults depends on both i) application-level specifications, i.e., NN data (inputs, weights, or intermediate) and NN layers and ii) architectural-level specifications, i.e., data representation model and the parallelism degree of the underlying accelerator. Second, motivated by characterization results, we present a low-overhead fault mitigation technique that can efficiently correct bit flips, by 47.3% better than state-of-the-art methods.We thank Pradip Bose, Alper Buyuktosunoglu, and Augusto Vega from IBM Watson for their contribution to this work. The research leading to these results has received funding from the European Union’s Horizon 2020 Programme under the LEGaTO Project (www.legato-project.eu), grant agreement nº 780681.Peer ReviewedPostprint (author's final draft

Vertical Optimizations of Convolutional Neural Networks for Embedded Systems

L'abstract è presente nell'allegato / the abstract is in the attachmen