High-level variable selection for partial-scan implementation

In this paper, we propose a high-level variable se-lection for partial-scan approach to improve the testa-bility of digital systems. The testability of a design is evaluated at the high level based on previously proposed controllability and observability measures. A testabil-ity grading technique is utilized to measure the rela-tive testability improvement in a design as the result of making a subset of the variables fully controllable and observable. The variables that cause the greatest testa-bility improvement are selected, and the selection pro-cess is performed incrementally until no further testa-bility improvement can be achieved. Then the registers that correspond to the selected variables are placed in the scan-chain for partial-scan implementation. The experimental results shows that the variable selection approach produces partial-scan implementations that can achieve high fault coverage, while the logic over-heads are fairly low.

Doctor of Philosophy

dissertationThe design of integrated circuit (IC) requires an exhaustive verification and a thorough test mechanism to ensure the functionality and robustness of the circuit. This dissertation employs the theory of relative timing that has the advantage of enabling designers to create designs that have significant power and performance over traditional clocked designs. Research has been carried out to enable the relative timing approach to be supported by commercial electronic design automation (EDA) tools. This allows asynchronous and sequential designs to be designed using commercial cad tools. However, two very significant holes in the flow exist: the lack of support for timing verification and manufacturing test. Relative timing (RT) utilizes circuit delay to enforce and measure event sequencing on circuit design. Asynchronous circuits can optimize power-performance product by adjusting the circuit timing. A thorough analysis on the timing characteristic of each and every timing path is required to ensure the robustness and correctness of RT designs. All timing paths have to conform to the circuit timing constraints. This dissertation addresses back-end design robustness by validating full cyclical path timing verification with static timing analysis and implementing design for testability (DFT). Circuit reliability and correctness are necessary aspects for the technology to become commercially ready. In this study, scan-chain, a commercial DFT implementation, is applied to burst-mode RT designs. In addition, a novel testing approach is developed along with scan-chain to over achieve 90% fault coverage on two fault models: stuck-at fault model and delay fault model. This work evaluates the cost of DFT and its coverage trade-off then determines the best implementation. Designs such as a 64-point fast Fourier transform (FFT) design, an I2C design, and a mixed-signal design are built to demonstrate power, area, performance advantages of the relative timing methodology and are used as a platform for developing the backend robustness. Results are verified by performing post-silicon timing validation and test. This work strengthens overall relative timed circuit flow, reliability, and testability

An Integrated Test Plan for an Advanced Very Large Scale Integrated Circuit Design Group

VLSI testing poses a number of problems which includes the selection of test techniques, the determination of acceptable fault coverage levels, and test vector generation. Available device test techniques are examined and compared. Design rules should be employed to assure the design is testable. Logic simulation systems and available test utilities are compared. The various methods of test vector generation are also examined. The selection criteria for test techniques are identified. A table of proposed design rules is included. Testability measurement utilities can be used to statistically predict the test generation effort. Field reject rates and fault coverage are statistically related. Acceptable field reject rates can be achieved with less than full test vector fault coverage. The methods and techniques which are examined form the basis of the recommended integrated test plan. The methods of automatic test vector generation are relatively primitive but are improving

Watermarking FPGA Bitfile for Intellectual Property Protection

Intellectual property protection (IPP) of hardware designs is the most important requirement for many Field Programmable Gate Array (FPGA) intellectual property (IP) vendors. Digital watermarking has become an innovative technology for IPP in recent years. Existing watermarking techniques have successfully embedded watermark into IP cores. However, many of these techniques share two specific weaknesses: 1) They have extra overhead, and are likely to degrade performance of design; 2) vulnerability to removing attacks. We propose a novel watermarking technique to watermark FPGA bitfile for addressing these weaknesses. Experimental results and analysis show that the proposed technique incurs zero overhead and it is robust against removing attacks

Modelling methods for testability analysis of analog integrated circuits based on pole-zero analysis

Testability analysis for analog circuits provides valuable information for designers and test engineers. Such information includes a number of testable and nontestable elements of a circuit, ambiguity groups, and nodes to be tested. This information is useful for solving the fault diagnosis problem. In order to verify the functionality of analog circuits, a large number of specifications have to be checked. However, checking all circuit specifications can result in prohibitive testing times on expensive automated test equipment. Therefore, the test engineer has to select a finite subset of specifications to be measured. This subset of specifications must result in reducing the test time and guaranteeing that no faulty chips are shipped. This research develops a novel methodology for testability analysis of linear analog circuits based on pole-zero analysis and on pole-zero sensitivity analysis. Based on this methodology, a new interpretation of ambiguity groups is provided relying on the circuit theory. The testability analysis methodology can be employed as a guideline for constructing fault diagnosis equations and for selecting the test nodes. We have also proposed an algorithm for selecting specifications that need to be measured. The element testability concept will be introduced. This concept provides the degree of difficulty in testing circuit elements. The value of the element testability can easily be obtained using the pole sensitivities. Then, specifications which need to be measured can be selected based on this concept. Consequently, the selected measurements can be utilized for reducing the test time without sacrificing the fault coverage and maximizing the information for fault diagnosis

The Design of Standard Cell VLSI Circuits

There are basically three methods of designing Very Large Scale Integrated (VLSI) circuits; Gate Array, Standard Cell, and Full Custom. The objective of this research is to design a VLSI circuit using the Standard Cell approach. A prime requisite for a successful design of these circuits is an integrated Computer Aided Design (CAD) system. The chip design requirements for an integrated CAD system are developed and their interrelationships are presented. As VLSI circuits grow in complexity, the problem of how to test them becomes more difficult. Two methods for testing are defined: 1. Insertion within the system of which the chip is a part, and use of standard system test techniques. 2. Self-test circuitry built into the chip. These testing techniques were used in the VLSI circuit in this report

A Very High Level Logic Synthesis

The evolution of Computer Aided Design (CAD) calls for the incorporation of design specifications into a microelectronics system development cycle. This expansion requires the establishment of a new generation of CAD procedures, defined as Very High Level Logic Synthesis (VHLLS). The fundamental characteristics of open-ended VHLLS are: (1) front-end graphical interface; (2) time encapsulation; and (3) automatic translation into a behavioral description. Consequently, the VHLLS paradigm represents an advanced category of CAD-based microelectronics system design, built on a deep usage of expert systems and intelligent methods. Artificial Intelligence (AI) formalisms such as Knowledge Representation System (KRS) are necessary to model properties related to the very high level of specification such as: dealing with ambiguities and inconsistencies, reasoning, computing high-level specification, etc. A prototype VHLLS design suite, called Specification Procedure for Electronic Circuits in Automation Language (SPECIAL), is defined, compared with today\u27s commercial tools and verified using numerous design examples. As a result, a new family of formal and accelerated development methodologies has become feasible with a better understanding of formalized knowledge driving these design processes

Power constrained test scheduling in system-on-chip design

With the development of VLSI technologies, especially with the coming of deep sub-micron semiconductor process technologies, power dissipation becomes a critical factor that cannot be ignored either in normal operation or in test mode of digital systems. Test scheduling has to take into consideration of both test concurrency and power dissipation constraints. For satisfying high fault coverage goals with minimum test application time under certain power dissipation constraints, the testing of all components on the system should be performed in parallel as much as possible. The main objective of this thesis is to address the test-scheduling problem faced by SOC designers at system level. Through the analysis of several existing scheduling approaches, we enlarge the basis that current approaches based on to minimize test application time and propose an efficient and integrated technique for the test scheduling of SOCs under power-constraint. The proposed merging approach is based on a tree growing technique and can be used to overlay the block-test sessions in order to reduce further test application time. A number of experiments, based on academic benchmarks and industrial designs, have been carried out to demonstrate the usefulness and efficiency of the proposed approaches

A Multi-Agent Architecture for An Intelligent Web-Based Educational System

An intelligent educational system must constitute an adaptive system built on multi-agent system architecture. The multi-agent architecture component provides self-organization, self-direction, and other control functionalities that are crucially important for an educational system. On the other hand, the adaptiveness of the system is necessary to provide customization, diversification, and interactional functionalities. Therefore, an educational system architecture that integrates multi-agent functionality [50] with adaptiveness can offer the learner the required independent learning experience. An educational system architecture is a complex structure with an intricate hierarchal organization where the functional components of the system undergo sophisticated and unpredictable internal interactions to perform its function. Hence, the system architecture must constitute adaptive and autonomous agents differentiated according to their functions, called multi-agent systems (MASs). The research paper proposes an adaptive hierarchal multi-agent educational system (AHMAES) [51] as an alternative to the traditional education delivery method. The document explains the various architectural characteristics of an adaptive multi-agent educational system and critically analyzes the system’s factors for software quality attributes

Learning digital test and diagnostics via Internet

An environment targeted to e-learning is presented for teaching design and test of electronic systems. The environment consists of a set of Java applets, and of web based access to the hardware equipments, which can be used in the classroom, for learning at home, in laboratory research and training, or for carrying out testing of students during exams. The tools support university courses on digital electronics, computer hardware, testing and design for testability to learn by hands-on exercises how to design digital systems, how to make them testable, how to build self-testing systems, how to generate test patterns, how to analyze the quality of tests, and how to localize faults in hardware. The tasks chosen for hands-on training represent simultaneously research problems, which allow to fostering in students critical thinking, problem solving skills and creativity