Design techniques for xilinx virtex FPGA configuration memory scrubbers

SRAM-based FPGAs are in-field reconfigurable an unlimited number of times. This characteristic, together with their high performance and high logic density, proves to be very convenient for a number of ground and space level applications. One drawback of this technology is that it is susceptible to ionizing radiation, and this sensitivity increases with technology scaling. This is a first order concern for applications in harsh radiation environments, and starts to be a concern for high reliability ground applications. Several techniques exist for coping with radiation effects at user application. In order to be effective they need to be complemented with configuration memory scrubbing, which allows error mitigation and prevents failures due to error accumulation. Depending on the radiation environment and on the system dependability requirements, the configuration scrubber design can become more or less complex. This paper classifies and presents current and novel design methodologies and architectures for SRAM-based FPGAs, and in particular for Xilinx Virtex-4QV/5QV, configuration memory scrubbers

Reliability and Makespan Optimization of Hardware Task Graphs in Partially Reconfigurable Platforms

This paper addresses the problem of reliability and makespan optimization of hardware task graphs in reconfigurable platforms by applying fault tolerance (FT) techniques to the running tasks based on the exploration of the Pareto set of solutions. In the presented solution, in contrast to the existing approaches in the literature, task graph scheduling, tasks parallelism, reconfiguration delay, and FT requirements are taken into account altogether. This paper first presents a model for hardware task graphs, task prefetch and scheduling, reconfigurable computer, and a fault model for reliability. Then, a mathematical model of an integer nonlinear multi-objective optimization problem is presented for improving the FT of hardware task graphs, scheduled in partially reconfigurable platforms. Experimental results show the positive impacts of choosing the FT techniques selected by the proposed solution, which is named Pareto-based. Thus, in comparison to nonfault-tolerant designs or other state-of-the-art FT approaches, without increasing makespan, about 850% mean time to failure (MTTF) improvement is achieved and, without degrading reliability, makespan is improved by 25%. In addition, experiments in fault-varying environments have demonstrated that the presented approach outperforms the existing state-of-the-art adaptive FT techniques in terms of both MTTF and makespan

INVESTIGATING THE EFFECTS OF SINGLE-EVENT UPSETS IN STATIC AND DYNAMIC REGISTERS

Radiation-induced single-event upsets (SEUs) pose a serious threat to the reliability of registers. The existing SEU analyses for static CMOS registers focus on the circuit-level impact and may underestimate the pertinent SEU information provided through node analysis. This thesis proposes SEU node analysis to evaluate the sensitivity of static registers and apply the obtained node information to improve the robustness of the register through selective node hardening (SNH) technique. Unlike previous hardening techniques such as the Triple Modular Redundancy (TMR) and the Dual Interlocked Cell (DICE) latch, the SNH method does not introduce larger area overhead. Moreover, this thesis also explores the impact of SEUs in dynamic flip-flops, which are appealing for the design of high-performance microprocessors. Previous work either uses the approaches for static flip-flops to evaluate SEU effects in dynamic flip-flops or overlook the SEU injected during the precharge phase. In this thesis, possible SEU sensitive nodes in dynamic flip-flops are re-examined and their window of vulnerability (WOV) is extended. Simulation results for SEU analysis in non-hardened dynamic flip-flops reveal that the last 55.3 % of the precharge time and a 100% evaluation time are affected by SEUs