Clamping Force Distribution within Press Pack IGBTs

Press pack insulated gated bipolar transistors (PP IGBTs) have been gradually used in the high-voltage and high-power-density applications, such as the power system and electric locomotive, with its advantages of double-sided cooling, higher power density, and easy to connect in series compared with traditional wire-bonded power IGBT modules. However, the clamping force is quite important for PP IGBTs because too much clamping fore will cause mechanical damage to the silicon chips and too little clamping force will increase the junction temperature of the silicon chips due to the increased thermal contact resistance. And eventually it leads to thermal damage. Furthermore, the clamping force distribution within PP IGBTs is affected by many factors, and they can be divided into the internal and external factors. The finite element analysis model of the PP IGBTs is established based on the theory of elastic mechanics to obtain the influence of the affect factors, including the external clamping modes, spring design, thermal stress, the machining accuracy, and so on. The contribution of those affect factors to the clamping force distribution is ranked, and this can be a guideline not only for users but also for the manufacturers

Health Condition Assessment of Multi-Chip IGBT Module with Magnetic Flux Density

To achieve efficient conversion and flexible control of electronic energy, insulated gate bipolar transistor (IGBT) power modules as the dominant power semiconductor devices are increasingly applied in many areas such as electric drives, hybrid electric vehicles, railways, and renewable energy systems. It is known that IGBTs are the most vulnerable components in power converter systems. To achieve high power density and high current capability, several IGBT chips are connected in parallel as a multi-chip IGBT module, which makes the power modules less reliable due to a more complex structure. The lowered reliability of IGBT modules will not only cause safety problems but also increase operation costs due to the failure of IGBT modules. Therefore, the reliability of IGBTs is important for the overall system, especially in high power applications. To improve the reliability of IGBT modules, this thesis proposes a new health state assessment model with a more sensitive precursor parameter for multi-chip IGBT module that allows for condition-based maintenance and replacement prior to complete failure. Accurate health condition monitoring depends on the knowledge of failure mechanism and the selection of highly sensitive failure precursor. IGBT modules normally wear out and fail due to thermal cycling and operating environment. To enhance the understanding of the failure mechanism and the external characteristic performance of multi-chip IGBT modules, an electro-thermal finite element model (FEM) of a multi-chip IGBT module used in wind turbine converter systems was established with considerations for temperature dependence of material property, the thermal coupling effect between components, and the heat transfer process. The electro-thermal FEM accurately performed temperature distribution and the distribution electrical characteristic parameters during chip solder degradation. This study found an increased junction temperature, large change of temperature distribution, and more serious imbalanced current sharing during a single chip solder aging, thereby accelerating the aging of the whole IGBT module. According to the change of thermal and electrical parameters with chip solder fatigue, the sensitivity of fatigue sensitive parameters (FSPs) was analyzed. The collector current of the aging chip showed the highest sensitivity with the chip solder degradation compared with the junction temperature, case temperature, and collector-emitter voltage. However, the current distribution of internal components remains inaccessible through direct measurements or visual inspection due to the package. As the relationship between the current and magnetic field has been studied and gradually applied in sensor technologies, magnetic flux density was proposed instead of collector current as a new precursor for health condition monitoring. Magnetic flux density distribution was extracted by an electro-thermal-magnetic FEM of the multi-chip IGBT module based on electromagnetic theory. Simulation results showed that magnetic flux density had even higher sensitivity than collector current with chip solder degradation. In addition, the magnetic flux density was only related with the current and was not influenced by temperature, which suggested good selectivity. Therefore, the magnetic flux density was selected as the precursor due to its better sensitivity, selectivity, and generality. Finally, a health state assessment model based on backpropagation neural network (BPNN) was established according to the selected precursor. To localize and evaluate chip solder degradation, the health state of the IGBT module was determined by the magnetic flux density for each chip and the corresponding operating conduction current. BPNN featured good self-learning, self-adapting, robustness and generalization ability to deal with the nonlinear relationship between the four inputs and health state. Experimental results showed that the proposed model was accurate and effective. The health status of the IGBT modules was effectively recognized with an overall recognition rate of 99.8%. Therefore, the health state assessment model built in this thesis can accurately evaluate current health state of the IGBT module and support condition-based maintenance of the IGBT module

Thermal Design of Power Electronic Circuits

The heart of every switched mode converter consists of several switching semiconductor elements. Due to their non-ideal behaviour there are ON state and switching losses heating up the silicon chip. That heat must effectively be transferred to the environment in order to prevent overheating or even destruction of the element. For a cost-effective design, the semiconductors should be operated close to their thermal limits. Unfortunately the chip temperature cannot be measured directly. Therefore a detailed understanding of how losses arise, including their quantitative estimation, is required. Furthermore, the heat paths to the environment must be understood in detail. This paper describes the main issues of loss generation and its transfer to the environment and how it can be estimated by the help of datasheets and/or experiments.Comment: 17 pages, contribution to the 2014 CAS - CERN Accelerator School: Power Converters, Baden, Switzerland, 7-14 May 201

Packaging Design of IGBT Power Module Using Novel Switching Cells

Parasitic inductance in power modules generates voltage spikes and current ringing during switching which cause extra stress in power electronic devices, increase electromagnetic interference (EMI), and degrade the performance of the power converter system. As newer power devices have faster switching speeds and higher power ratings, the effect of the parasitic inductance of the power module is more pronounced. This dissertation proposes a novel packaging method for power electronics modules based on the concepts of novel switching cells: P-cell and N-cell. It can reduce the stray inductance in the current commutation path in a phase-leg module and hence improve the switching behavior. Taking an insulated gate bipolar transistor (IGBT) as an example, two phase-leg modules, specifically a conventional module and a P-cell and N-cell based module were designed. Using Ansoft Q3D Extractor, electromagnetic simulation was carried out to extract the stray inductance from the two modules. An ABB 1200 V / 75 A IGBT model and a diode model were built for simulation study. Circuit parasitics were extracted and modeled. Switching behavior with different package parasitics was studied based on the Saber simulation. Two prototype phase-leg modules were fabricated. The parasitics were measured using a precision impedance analyzer. The measurement results agree with the simulation very well. A double pulse tester was built in laboratory. Several approaches were used to reduce the circuit and measuring parasitics. From the switching characteristics of the two modules, it was verified that the larger stray inductance in the layout causes higher voltage overshoot during turn off, which in turn increases the turn off losses. Multichip (two in parallel) IGBT modules applying novel switching cells was also designed. The parasitics were extracted and compared to a conventional design. The overall loop inductance was reduced in the proposed module. However, the mismatch of the paralleled branches was larger