Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

Accuracy enhancement techniques in low-voltage high-speed pipelined ADC design

Pipelined analog to digital converters (ADCs) are very important building blocks in many electronic systems such as high quality video systems, high performance digital communication systems and high speed data acquisition systems. The rapid development of these applications is driving the design of pipeline ADCs towards higher speed, higher dynamic range, lower power consumption and lower power supply voltage with the CMOS technology scaling. This trend poses great challenges to conventional pipelined ADC designs which rely on high-gain operational amplifiers (opamps) and well matched capacitors to achieve high accuracy. In this thesis, two novel accuracy improvement techniques to overcome the accuracy limit set by analog building blocks (opamps and capacitors) in the context of low-voltage and high-speed pipelined ADC design are presented. One is the time-shifted correlated double sampling (CDS) technique which addresses the finite opamp gain effect and the other is the radix-based background digital calibration technique which can take care of both finite opamp gain and capacitor mismatch. These methods are simple, easy to implement and power efficient. The effectiveness of the proposed techniques is demonstrated in simulation as well as in experiment. Two prototype ADCs have been designed and fabricated in 0.18μm CMOS technology as the experimental verification of the proposed techniques. The first ADC is a 1.8V 10-bit pipeline ADC which incorporated the time-shifted CDS technique to boost the effective gain of the amplifiers. Much better gain-bandwidth tradeoff in amplifier design is achieved with this gain boosting. Measurement results show total power consumption of 67mW at 1.8V when operating at 100MSPS. The SNR, SNDR and SFDR are 55dB, 54dB and 65dB respectively given a 1MHz input signal. The second one is a 0.9V 12-bit two-stage cyclic ADC which employed a novel correlation-based background calibration to enhance the linearity. The linearity limit set by the capacitor mismatches, finite opamp gain effects is exceeded. After calibration, the SFDR is improved by about 33dB and exceeds 80dB. The power consumption is 12mW from 0.9V supply when operating at 2MSPS

Low voltage techniques for pipelined analog-to-digital converters

To realize pipelined ADCs in deep-submicron processes, low voltage techniques must be developed to work around problems created by limited supply voltages such as the floating switch dead zone, reduced SNR, and reduced OpAmp performance. This thesis analyzes standard and low voltage design issues for pipelined ADCs and proposes a fully-differential implementation of the OpAmp Reset Switching Technique (ORST) as a suitable low voltage design solution. The technique uses a true fully differential MDAC structure with a switching common-mode feedback to achieve increased linearity and noise performance over the previously published ORST. A pipelined ADC test chip is designed to implement the fully differential ORST technique as a proof of concept. The design also includes a simple, low power input sampling network that also allows an increased input signal range and saves power by removing the dedicated, front-end S/H. Prototype performance demonstrates the fully differential ORST and shows sampling speeds of up to 60 MS/s, 51.4 dB SNR, 58.8 dB SFDR, and 49.7 dB SNDR for an 8-bit ENOB in a 0.18 μm CMOS process with a 1 V supply. Little change in distortion is observed up to 90 MHz input frequency, demonstrating operation without a S/H

Circuits and algorithms for pipelined ADCs in scaled CMOS technologies

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.MIT Barker Engineering Library copy: printed in pages.Also issued printed in pages.Includes bibliographical references (leaves 179-184).CMOS technology scaling is creating significant issues for analog circuit design. For example, reduced signal swing and device gain make it increasingly difficult to realize high-speed, high-gain feedback loops traditionally used in switched capacitor circuits. This research involves two complementary methods for addressing scaling issues. First is the development of two blind digital calibration techniques. Decision Boundary Gap Estimation (DBGE) removes static non-linearities and Chopper Offset Estimation (COE) nulls offsets in pipelined ADCs. Second is the development of circuits for a new architecture called zero-crossing based circuits (ZCBC) that is more amenable to scaling trends. To demonstrate these circuits and algorithms, two different ADCs were designed: an 8 bit, 200MS/s in TSMC 180nm technology, and a 12 bit, 50 MS/s in IBM 90nm technology. Together these techniques can be enabling technologies for both pipelined ADCs and general mixed signal design in deep sub-micron technologies.by Lane Gearle Brooks.Ph.D

A built-in self-test technique for high speed analog-to-digital converters

Fundação para a Ciência e a Tecnologia (FCT) - PhD grant (SFRH/BD/62568/2009

High-performance delta-sigma analog-to-digital converters

Multi-stage delta-sigma (ΔΣ) architectures, commonly known as MASH, are the preferred choice for analog-to-digital converters (ADCs) used in broadband communication applications, where high-resolution (above 14 bits) and high-bandwidth (several MHz) performances are required. Current state-of-the-art designs are capable of as much as 5-MS/s output data rates with 90-dB SNR. However, inherent limitations in this type of converters have been addressed by the use of high-quality analog circuit components, making designs more complex, less robust, and higher performances difficult to achieve. This thesis describes the problems of extending bandwidth without losing accuracy in ΔΣ A/D converters, and presents three techniques which can overcome these problems: a low-distortion analog signal processing technique, the digital adaptive correction of analog circuit imperfections, and the fully digital estimation and correction of DAC errors. Combined, these techniques have the potential to achieve high-speed, high-resolution wideband ΔΣ conversion, even with low-performance analog components. The presented techniques were combined in a prototype chip, designed and fabricated in a 0.18 μm CMOS process. Simulation and preliminary measurement results show that they are highly effective

Correlated level shifting as a power-saving method to reduce the effects of finite DC gain and signal swing in opamps

This thesis presents methods to reduce the effects of finite opamp DC gain, output voltage swing limitations in opamps, and component mismatches. The primary contribution of this thesis is a new switched-capacitor method named correlated level shifting (CLS). CLS enables true rail-to-rail operation by storing an estimate of the desired signal on a capacitor during an "estimate" phase, and subtracting the signal from the active circuitry (typically an opamp) during a "level shift" phase. This is done within the confines of a feedback loop. The effective loop-gain is the product of the loop-gains during the estimate and level shift phases. This enables, for example, a two-stage opamp to have the accuracy of a four-stage opamp. It also enables full utilization of the power supply since the gain block's output voltage can exceed the power supply. The thesis shows that the full utilization of the power supply and the increased DC effective loop gain leads to a significant power savings compared to existing techniques. The methods are presented in the context of pipelined analog-to-digital converters, although the methods can be used with other circuits that use opamps or are sensitive to component mismatch. An overview of the detrimental effects of reduced signal swing and low DC gain is given with an emphasis on the cost in power to correct these deficiencies when limited to existing circuit techniques. CLS is then shown to correct these deficiencies without increasing power. A detailed explanation of CLS operation is given, as are measured results from a 12-bit pipelined analog-to-digital converter that was fabricated using a 0.18μ CMOS process. The results include greater than 10-bit performance with true rail-to-rail operation. An overview of calibration is also given and the limitations are discussed. An argument is made that using CLS in addition to calibration will reduce power by increasing signal-to-noise ratio and reducing and linearizing the errors due to finite opamp gain. In addition, a method to reduce the effects of mismatch by measuring the relative size of elements is presented. Finally, several avenues for future research into CLS are given

High efficiency delta-sigma modulation data converters

Enabled by continued device scaling in CMOS technology, more and more functions that were previously realized in separate chips are getting integrated on a single chip nowadays. Integration on silicon has opened the door to new portable wireless applications, and initiated a widespread use of these devices in our common everyday life. Wide signal bandwidth, high linearity and dynamic range, and low power dissipation are required of embedded data converters that are the performance-limiting key building blocks of those systems. Thus, power-efficient and highly-linear data conversion over wide range of signal bands is essential to get the full benefits from device scaling. This continued trend keeps innovation in the design of data converter continuing. Traditionally, delta-sigma modulation data converters proved to be very effective in applications where high resolution was necessary in a relatively narrow signal band. There have been active research efforts across academia and industry on the extension of achievable signal bandwidth without compromising the performance of these data converters. In this dissertation, architectural innovations, combined with effective design techniques for delta-sigma modulation data converters, are presented to overcome the associated limitations. The effectiveness of the proposed approaches is demonstrated by test results for the following state-of-the-art prototype designs: (1) a 0.8 V, 2.6 mW, 88 dB dual-channel audio delta-sigma modulation D/A converter with headphone driver; (2) an 88 dB ring-coupled delta-sigma ADC with 1.9 MHz bandwidth and -102.4 dB THD; (3) a multi-cell noise-coupled delta-sigma ADC with 1.9 MHz bandwidth, 88 dB DR, and -98 dB THD; (4) an 8.1 mW, 82 dB self-coupled delta-sigma ADC with 1.9 MHz bandwidth and -97 dB THD; (5) a noise-coupled time-interleaved delta-sigma ADC with 4.2 MHz bandwidth, -98 dB THD, and 79 dB SNDR; (6) a noise-coupled time-interleaved delta-sigma ADC with 2.5 MHz bandwidth, -104 dB THD, and 81 dB SNDR. As an extension of this research, two novel architectures for efficient double-sampling delta-sigma ADCs and improved low-distortion delta-sigma ADC are proposed, and validated by extensive simulations.Keywords: improved low-distortion modulator, time interleaving, data converter, multi-cell ADC, efficient double sampling, noise coupling, delta-sigma modulatio